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Design of Temperature-Compensated Power-Up Detector  

Ko, Tai-Young (Department of Electronics and Electrical Engineering, Sungkyunkwan University)
Jun, Young-Hyun (Semiconductor Division, Samsung Electronics)
Kong, Bai-Sun (Department of Electronics and Electrical Engineering, Sungkyunkwan University)
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Abstract
In this paper, a temperature variation-insensitive power-up detector for use in analog and digital integrated systems has been proposed. To provide temperature-insensitive characteristic, nMOS and pMOS voltage dividers in the proposed power-up detector are made to have zero temperature coefficient by exploiting the fact that the effective gate-source voltage of a MOS transistor can result in mutual compensation of mobility and threshold voltage for temperature independency. Comparison results using a 68-nm CMOS process indicate that the proposed power-up detector achieves as small as 4 mV voltage variation at 1.0 V power-up voltage over a temperature range of $-30^{\circ}C$ to $90^{\circ}C$, resulting in 92.6% reduction on power-up voltage variations over conventional power-up detectors.
Keywords
power-up; temperature Compensation; voltage divider; detector; temperature coefficient;
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