• 제목/요약/키워드: Scanning

검색결과 14,133건 처리시간 0.035초

Lynx Mobile Mapper를 이용한 레이저스캐너 기반 차량 MMS의 캘리브레이션 (Calibration of Laser scanning Mobile Mapping System using Lynx Mobile Mapper)

  • 정태준;윤홍식;황진상;김용현;이하준
    • 한국측량학회:학술대회논문집
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    • 한국측량학회 2010년 춘계학술발표회 논문집
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    • pp.207-208
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    • 2010
  • In this paper, we carried out calibration of laser scanning MMS(Mobile Mapping System) using Lynx Mobile Mapper, a new MMS developed at Optech Incorporated. Laser scanning MMS could be defined as an integration of several subsystems. Subsystems are composed of laser scanner, gps receiver and antenna, INS(Inertial Navigation System), DMI(Distance Measurement Instrument). These are obtained 3D spatial information by direct-georeferencing technology. To obtain 3D spatial information, calibration of laser scanning MMS is required prior to operation system, it is similar to airborme lidar system. 145 checkpoints were used to accuracy estimation. The accuracy results are about 5cm(RMSE) for calibration in all directions(east, north, ellipsoidal height).

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주사전자현미경을 활용한 세라믹의 분석 (Analysis of Ceramics Using Scanning Electron Microscopy)

  • 이수정
    • 세라미스트
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    • 제22권4호
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    • pp.368-380
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    • 2019
  • A ceramic is used as a key material in various fields. Accordingly, the use of scanning electron microscopy is increased for the purpose of evaluating the reliability and defects of advanced ceramic materials. The scanning electron microscope is developed to overcome the limitations of optical microscopy and uses accelerated electrons for imaging. Various signals such as SE, BSE and characteristic X-rays provide useful information about the surface microstructure of specimens and, the content and distribution of chemical components. The development of electron guns, such as FEG, and the improved lens system combined with the advanced in-lens detectors and STEM-in-SEM system have expanded the applications of SEM. Automated SEM-EDS analysis also greatly increases the amount of data, enabling more statistically reliable results. In addition, X-ray CT, XRF, and WDS, which are installed in scanning electron microscope, have transformed SEM a more versatile analytical equipment. The performance and specifications of the scanning electron microscope to evaluate ceramics were reviewed and the selection criteria for SEM analysis were described.

Laser Scanning 기술을 이용한 비정형 건축외피의 As-Planned와 As-Built 비교에 관한 기초적 연구 (A Fundamental Study on the Comparison of As-Planned with As-Built of Free-form Building Skins Using Laser Scanning Technology)

  • 권순호;심현우;장현승;옥종호
    • 한국CDE학회논문집
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    • 제16권2호
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    • pp.126-136
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    • 2011
  • The existing approaches to freeform building construction cause many problems. However, recent BIM technique development based on parametric modeling method and improvement of freeform materials manufacturing technology using IT technology encouraged many advanced countries to try experimental projects. Thus, laser scanning technique is in the limelight as a new alternative in the field of freeform building construction and inspection. This study selected a domestic small freeform building and practiced laser scanning and as-planned modeling by using Reverse Engineering. Then each deviation was comparatively analyzed through figures which extracted data by numerically analyzing the newly modeled as-built and Excel spread sheet. Through the process, limits and follow-up research subjects are discussed as well.

화상처리기법을 이용한 변형율해석에 관한 연구 (A Study on the Strain Analysis by Image Processing Technique)

  • 백인환;신문교
    • Journal of Advanced Marine Engineering and Technology
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    • 제12권4호
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    • pp.32-45
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    • 1988
  • The scanning moire method, in which the master grating is replaced by the scanning line of television camera and in which the moire pattern is obtained by thining out some scanning line, is discussed by the sampling theory. It is determined also by the sampling theory that relationship between the fringe pattern. The programs that analyze the strain by the scanning moire method have been developed. For the simulation model in which we are able to calculate analytically the distribution of strains, the scanning moire method is discussed. It is shown that the small strains and the large strains are analyzed from the same picture by the thinning out technique and that the accuracy of analysis is improved by change of the phase in the thinning out technique.

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3D SCANNING을 활용한 비정형 외장재의 시공 공법 검토 (Construction Methods Review of Freeform Envelope Using 3D Scanning)

  • 김성진;박성진;최영재;류한국
    • 한국건축시공학회:학술대회논문집
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    • 한국건축시공학회 2014년도 추계 학술논문 발표대회
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    • pp.100-101
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    • 2014
  • The generation of 3D models for freeform buildings is an important task while continuous monitoring of the related spatial information at different time phases. Realistic models of freeform building have to provide high geometric accuracy and detail at an effective data size.(Al-kheder, S. 2008) The efficiency of this image-based technique has been increased considerably by the development of digital technologies. Furthermore, 3D data collection based on laser scanning has become an high quality 3D models for construction site. Therefore, in this research, we have an effort to review construction methods to make freeform envelope of building using 3D scanning technology.

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전자현미경 개발 (The development of scanning electron microscopy)

  • 오현주;장동영;양희남;김동환;박만진;심치형;김충수
    • 한국공작기계학회:학술대회논문집
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    • 한국공작기계학회 2005년도 춘계학술대회 논문집
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    • pp.15-18
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    • 2005
  • We have designed and fabricated a thermal scanning electron microscopy. It includes an electron source, two condenser lenses, one objective lens, a scanning coil and a stigmator coil for focusing in column and also have a secondary electron detector for constructing the image in chamber with a high vacuum condition and control part for operating the SEM. Especially, in order for us to find out the optical characteristics, our attention and studies have been concentrated on the effects of two condenser lenses and one objective lens for high resolution with SEM. Finally, we developed a high resolution thermal scanning electron microscopy.

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단일 광경로 스캐닝 PIV기법 개발 (Development of the Scanning PIV Method with Single Optical Axis)

  • 김형범
    • 대한기계학회논문집B
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    • 제31권2호
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    • pp.181-187
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    • 2007
  • Conventional PIV method uses two optical axis configuration during the image grabbing process. That is, the illumination plane and the recording plane must be parallel. This configuration is very natural to grab the whole field without the image distortion. In the real problem, it is often to meet the situation when this configuration is hard to be fulfilled. In the present study, the new PIV method which uses only single optical axis to grab the particle images is developed. This new PIV method becomes possible by utilizing the scanning method similar to the echo PIV technique. One particle image of the scanning PIV consists of scanned several line images and by repeating this scanning process, two particle images were grabbed and processed to produce the velocity vectors. An optimization study was performed to find parameters which minimize the measurement errors. The effects of particle diameter, beam overlap ratio and particle number density were investigated.

전자현미경의 이미지 향상을 위한 주사시스템의 안정성 (Scanning System Stability for Improving SEM Image)

  • 김승재;김동환
    • 한국생산제조학회지
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    • 제18권5호
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    • pp.455-461
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    • 2009
  • In a scanning electron microscopy, image distortion is a critical issue and it is needed to be eliminated by some kinds of schemes. In this work, scanning frequency and scanning wave form are adjusted to have an improved image. The relationship between scan coil and its driver is investigated and appropriate frequency and wave form are suggested. It is proved that the selected frequency and wave form showed an enhanced image with less distortion, which were done by experiments. In addition, a noise elimination is addressed, providing improved image with a GROUND signal integration with the amplifier and the scan driver.

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광학스캐닝 메커니즘 및 근적외선 카메라 광학계를 이용한 태양전지 웨이퍼 검사장치 개발 (Development of Inspection System With Optical Scanning Mechanism and Near-Infrared Camera Optics for Solar Cell Wafer)

  • 김경범
    • 반도체디스플레이기술학회지
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    • 제11권3호
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    • pp.1-6
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    • 2012
  • In this paper, inspection system based on optical scanning mechanism is designed and developed for solar cell wafer. It consists of optical scanning mechanism, NIR camera optics, machinery and control system, algorithm of defect detection and software. Optical scanning mechanism is composed of geometrical camera optics and structured hybrid illumination system. It is used to inspection of surface defects. NIR camera optics is used for inspection of defects inside solar cell wafer. It is shown that surface and internal micro defects can be detected in developed inspection system for solar cell wafer.

Injection-Locking Coupled Oscillators를 이용한 빔 주사 용 능동 위상배열안테나의 설계 및 제작 (A design and fabrication of active phased array antenna for beam scanning using injection-locking coupled oscillators)

  • 이두한;김교헌;홍의석
    • 한국통신학회논문지
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    • 제22권8호
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    • pp.1622-1631
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    • 1997
  • A 3-stages Active Microstrip Phased Array Antenn(AMPAA) is implemented using Injection-Locking Coupled Oscillators(ILCO). The AMPAA is a beam scanning active antenna with capability of electrical scanning by frequency varation of ILCO. The synchronization of resonance frequencies in array elements is occured by ILCO, and the ILCO amplifies the injection signal and functions as a phase shifter. The microstrip ptch is operated as a radiation element. The unilateral amplifier is a mutual coupling element of AMPAA, eliminates the reverse locking signal and controls the locking bandwidth of ILCO. The possibility of Monolithic Microwave Integrated Circuits(MMIC) of T/R module is proposed by simplified and integrated fabrication process of AMPAA. The 0.75.$lambda_{0}$ is fixed for a mutual coupling space to wide the scanning angle and minimize the multi-mode. The AMPAA has beam scanning angle of 31.4.deg., HPBW(Half Power Beam Widths) of 26.deg., directive gain of 13.64dB and side lobe of -16.5dB were measured, respectively.

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