1 |
Li, W. C. and Tsai, D. M., "Automatic Saw-mark Detection in Multi-crystalline Solar Wafer Images," Solar Energy Materials & Solar cells, DOI:10.1016/j.solmat.2011.03.025, 2011
|
2 |
Byelyayev, A., "Stress Diagnostics and Crack Detection in Full-Size Silicon Wafers using Resonance Ultrasonic Vibrations," Department of Electrical Engineering, Ph. D. University of South Florida, 2005.
|
3 |
Kim, G. B., Shin, Y. S. and Moon S. H., "A Laser- Applied Hybrid Focus Method for the Measurement of Surface Morphology with Depth Discontinuity," KSPE, Vol. 23, No. 9, pp. 111-118, 2006.
|
4 |
Sunil Kumar Kopparapu, "Lighting Design for Machine Vision Application," Image & Vision Computing, Vol. 24, pp. 720-726, 2006.
DOI
ScienceOn
|
5 |
An, B. I. and Kim, G. B., "A Study on Selection of Parameters in Structured Illumination Mechanism for silicon Wafer in Solar Cell," Proceedings of the KSME 2011 Spring Annual Meeting, pp. 336-337, 2011.
|
6 |
An, B. I., Kim, G. B. and Jung, J. L.,"A Study on Optimum Illumination Condition of Hybrid Illumination Mechanism for Solar Cell Wafer," Spring Conference of KSDT, pp. 187-189, 2011.
|
7 |
Choi, M. Y., Kang, K. S., Park, J. H., Kim, W. Ta. And Kim, K. S., "Measurement of Defects and Stress by Infrared Thermography," KSPE, Vol. 23, No. 10, pp. 30-35, 2006.
|
8 |
An, B. I. and Kim, G. B., "Development of Inspection System for Solar Cell Wafer based on Optical Scanning Mechanism," Proceedings of the KSPE 2011.
|
9 |
K. J., "2010 New & Renewable Energy", KEMCO, 2010.
|
10 |
Yeon, J. S. and Kim, G. B., "Investigation of Laser Scattering Pattern and Defect Detection Based on Rayleigh Criterion for Crystalline Silicon Wafer Used in Solar Cell", KSPE, Vol. 28, pp. 606-613, 2011.
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