• Title/Summary/Keyword: Reflectivity

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Reflectivity Mosaic of Two Radars Using a Height-weighted Method (고도 가중 방법을 이용한 레이더 반사도의 합성)

  • Lee, Jung-Hoon;Jung, Sung-Hwa;Heo, Bok-Haeng;Kim, Kyung-Eak
    • Korean Journal of Remote Sensing
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    • v.26 no.4
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    • pp.373-385
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    • 2010
  • A new method to mosaic reflectivity over the overlapped coverage of two radars was developed. The method mosaics the radar reflectivity with weights after adjustment of reflectivity differences on overlapped coverage of neighboring two radars. Their weights are inverse proportion to the difference between the height of an interpolated reflectivity and the level of CAPPI (Constant Altitude PPI). The performance of this method was compared to different mosaic methods (Mosaics by maximum value, averaged value, nearest value and distance weighted value) using the reflectivity fields of a typhoon event observed by two radar. New method was better than any other methods either as a continuity and as a bias analysis of reflectivity at the boundaries in overlapped coverage by two radars.

Case Study of the Precipitation System Occurred Around Cheongju Using Convective/Stratiform Radar Echo Classification Algorithm (레이더 반사도 유형분류 알고리즘을 이용한 청주 부근에서 관측된 강우시스템의 사례 분석)

  • Nam, Kyung-Yeub;Lee, Jeong-Seog;Nam, Jae-Cheol
    • Atmosphere
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    • v.15 no.3
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    • pp.155-165
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    • 2005
  • The characteristics of six precipitation systems occurred around Cheongju in 2002 are analyzed after the convective/stratiform radar echo classification using radar reflectivity from the Meteorological Research Institute"s X-band Doppler weather radar. The Biggerstaff and Listemaa (2000) algorithm is applied for the classification and reveals a physical characteristics of the convective and stratiform rain diagnosed from the three-dimensional structure of the radar reflectivity. The area satisfying the vertical profile of radar reflectivity is well classified, while the area near the radar site and the topography-shielded area show a mis-classification. The seasonal characteristics of the precipitation system are also analyzed using the contoured frequency by altitude diagrams (CFADs). The heights of maximum reflectivity are 4 km and 5.5 km in spring and summer, respectively, and the vertical gradient of radar reflectivity from 1.5 km to the melting layer in spring is larger than in summer.

Effective measurement of high facet reflectivity using the variation longitudinal modes spacing of semiconductor external cavity ring lasers (반도체 외부 공진기 링 레이저의 종 모드 간격 변화를 이용한 고반사율을 갖는 Etalon Coating Reflectivity의 정밀 측정)

  • 엄진섭;안상호
    • Korean Journal of Optics and Photonics
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    • v.10 no.6
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    • pp.524-526
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    • 1999
  • It is observed that the mode spacing of an cxternal cavity semiconducror laser can be altered dramatically by the insertion of an intracavity etalon. 111e mode spacing is decreased as a function of etalon's reflectivity and this effect is quantitatively explained by an analysis of resonant modes. We abo show that this effect provides a precise and convenient alternative for determining the coating reflectivity of a high reflectivity etalon. talon.

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Pore Structure and Reflectivity of Light of Paper

  • Won, Jong-Myoung
    • Journal of Korea Technical Association of The Pulp and Paper Industry
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    • v.38 no.3 s.116
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    • pp.7-12
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    • 2006
  • The pore structure of paper was modified by the application of the blending of pulp, refining, and filler particle size and ash content. It was conformed that the reflectivity of paper can be modified by the combination of the above parameters. It was also found that the change of reflectivity of paper was greatly dependent on the pore structure, such as average pore size, pore size distribution and porosity. The average pore size was decreased with addition of HwBKP, but the smallest average pore size was obtained from the addition of 80% HwBKP Refining of pulp decreased both average pore size and the reflectivity of paper. The pore size distribution of filled paper can be varied by the combination of filler particle size and ash content

Pedestrian Safety Road Marking Detection Using LRF Range and Reflectivity (LRF (Laser Range Finder) 거리와 반사도를 이용한 보행자 보호용 노면표시 검출기법 연구)

  • Im, Sung-Hyuck;Im, Jun-Hyuck;Yoo, Seung-Hwan;Jee, Gyu-In
    • Journal of Institute of Control, Robotics and Systems
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    • v.18 no.1
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    • pp.62-68
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    • 2012
  • In this paper, a detection method of a pedestrian safety road marking was proposed. The proposed algorithm uses laser range and reflectivity of a range finder (LRF). For a detection of crosswalk marking and stop line, the DFT (Discrete Fourier Transform) of reflectivity and cross-correlation method between the reference replica and the measured reflectivity are used. A speed bump is detected through measuring an altitude difference of two LRFs which have the different tilted angle. Furthermore, we proposed a velocity constrained a detection method of a speed bump. Finally, the proposed methods are tested in on-line, on the pavement of a road. The considered road markings are wholly detected. The localization errors of both road markings are smaller than 0.4 meter.

Wetting Property and Reflectivity of Sn-3.5Ag Solder by Plating for LED Lead Frame (LED용 리드프레임 상의 Sn-3.5Ag 솔더 도금의 젖음성 및 반사율)

  • Kee, Se Ho;Xu, Zengfeng;Kim, Won Joong;Jung, Jae Pil
    • Korean Journal of Metals and Materials
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    • v.50 no.8
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    • pp.563-568
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    • 2012
  • The wetting property and reflectivity of Sn-3.5Ag solder which was dip coated on a LED lead frame were investigated. The wettability of molten solder on Cu substrate was evaluated by the wetting balance tester, and surface tension was calculated from maximum withdrawal force and withdrawal time. Temperature of the molten solder in a bath was varied in the range of $250-290^{\circ}C$. With increasing temperature, the surface tension decreased a little. The reflectivity of Sn-3.5Ag coated on a substrate became a little lower than the highest current LED lead frame reflectivity.

optical Simulation on EUV Reflectivity of Mo/Si Multilayer Structure (Mo/Si 다층박막의 극자외선 반사도에 대한 전산모사)

  • 이영태;강인용;정용재;이승윤;허성민
    • Journal of the Microelectronics and Packaging Society
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    • v.8 no.2
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    • pp.19-24
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    • 2001
  • The effect of thickness variation and inter-diffusion layer on the reflectivity of Mo/Si multilayer has been investigated. The reflectivity of the imperfect Mo/Si multilayer with thickness variation of 28% was found to be lowered by 10.8% compared to that of ideal Mo/Si multilayers with 40-periods. When the inter-diffusion layer is taken into account, the reflectivity is decreased by 4.7% additionally. We also fecund that the reflectivity continued to increase until the 25th-layer but it showed irregular tendencies about increment and decrement from the 26th-layer of Mo/Si multilayer structures.

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Microwave Dielectric Properties and Infrared ReflectivitySpectra of (Zr$_{0.8}$Sn$_{0.2}$)TiO$_4$ Ceramics ((Zr$_{0.8}$Sn$_{0.2}$)TiO$_4$ 세라믹스의 마이크로파 유전특성 및 Infrared Reflectivity Spectra of (Zr0.8Sn0.2)TiO4)

  • 윤기현;안일석;김우섭;김응수
    • Journal of the Korean Ceramic Society
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    • v.36 no.9
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    • pp.915-922
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    • 1999
  • Microwave dielectric properties and far infrared reflectivity spectra of the (Zr0.8Sn0.2)TiO4 ceramics were inves-tigated with the various cooling rate. Dielectric constant was nearly same value while the unloaded Q value was largely affected by cooling rate. The Q.f of 42,140 at 7 GHz was obtained for the specimens with cooling rate of 1$^{\circ}C$/min. The effect of the cooling rate on the change of the ionic the electronic polarization and the intrinsic microwave loss of the specimens were investigated by the infrared reflectivity spectra from 50 to 4000cm-1 which were calculated by Kramers-Kroning analysis and the classical oscillator model. The relative tendency of microwave dielectric properties of the specimens calculated from the relfectivity data were in good agreement with the results by the post resonant method.

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Reflectivity Control at Substrate / Photoresist Interface by Inorganic Bottom Anti-Reflection Coating for Nanometer-scaled Devices

  • Kim, Sang-Yong;Kim, Yong-Sik
    • Transactions on Electrical and Electronic Materials
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    • v.15 no.3
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    • pp.159-163
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    • 2014
  • More accurate CD (Critical Dimension) control is required for the nanometer-scaled devices. However, since the reflectivity between substrate and PR (Photoresist) becomes higher, the CD (Critical Dimension) swing curve was intensified. The higher reflectivity also causes PR notching due to the pattern of sub-layer. For this device requirement, it was optimized for the thickness, refractive index(n) and absorption coefficient(k) in the bottom anti-reflective coating(BARC; SiON) and photoresist with the minimum reflectivity. The computational simulated conditions, which were determined with the thickness of 33 nm, n of 1.89 and k of 0.369 as the optimum condition, were successfully applied to the experiments with no standing wave for the 0.13um-device. At this condition, the lowest reflectivity was 0.44%. This optimum condition for BARC SiON film was applied to the process for 0.13um-device. The optimum SiON film as BARC to PR and sub-layer could be formed with the accurate CD control and no standing waver for the nanometer-scaled semiconductor manufacturing process.

Spectral Reflectivity Recovery from Tristimulus Values Using 3D Extrapolation with 3D Interpolation

  • Kim, Bog G.;Werner, John S.;Siminovitch, Michael;Papamichael, Kostantinos;Han, Jeongwon;Park, Soobeen
    • Journal of the Optical Society of Korea
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    • v.18 no.5
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    • pp.507-516
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    • 2014
  • We present a hybrid method for spectral reflectivity recovery, using 3D extrapolation as a supplemental method for 3D interpolation. The proposed 3D extrapolation is an extended version of 3D interpolation based on the barycentric algorithm. It is faster and more accurate than the conventional spectral-recovery techniques of principal-component analysis and nonnegative matrix transformation. Four different extrapolation techniques (based on nearest neighbors, circumcenters, in-centers, and centroids) are formulated and applied to recover spectral reflectivity. Under the standard conditions of a D65 illuminant and 1964 $10^{\circ}$ observer, all reflectivity data from 1269 Munsell color chips are successfully reconstructed. The superiority of the proposed method is demonstrated using statistical data to compare coefficients of correlation and determination. The proposed hybrid method can be applied for fast and accurate spectral reflectivity recovery in image processing.