• 제목/요약/키워드: Reflection Film

검색결과 368건 처리시간 0.028초

Application of Inverse Pole Figure to Rietveld Refinement: III. Rietveld Refinement of $SnO_2$ Thin Film using X-ray Diffraction Data

  • Kim, Yong-Il;Jung, Maeng-Joon;Kim, Kwang-Ho
    • The Korean Journal of Ceramics
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    • 제6권4호
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    • pp.354-358
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    • 2000
  • The SnO$_2$film was deposited on a corning glass 1737 substrate by plasma enhanced chemical vapor deposition using a gas mixture of SnCl$_4$, $O_2$, and Ar. The film thickness was measured using $\alpha$-step and was about 9400$\AA$. The conventional X-ray diffractometry and pole figure attachment were used to refine the crystal structure of SnO$_2$ thin film. Six pole figures, (200), (211), (310), (301), (321), and (411), were measured with CoK$_\alpha$ radiation in reflection geometry. The X-ray diffraction data were measured at room temperature using CuK$_\alpha$ radiation with graphite monochromator. The agreement between calculated and observed patterns for the normal direction of SnO$_2$ thin film was not satisfactory due to the severely preferred orientation effect. The Rietveld refinement of heavily textured SnO$_2$ thin film was successfully achieved by adopting the pole density distribution of each reflection obtained from the inverse pole figure as a correction factor for the preferred orientation effect. The R-weighted pattern, R$_wp$, was 15.30%.

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Sol-gel 하이브리드 용액을 이용한 반사방지막 제조 (Fabrication of anti-reflection thin film by using sol-gel hybrid solution)

  • 박종국;이지선;이미재;이영진;전대우;김진호
    • 한국결정성장학회지
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    • 제26권6호
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    • pp.220-224
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    • 2016
  • 초음파 스프레이를 이용하여 유리기판 위에 반사방지 박막이 제조되었다. GPTMS와 TEOS는 솔-젤 하이브리드 코팅 용액을 제조하기 위하여 사용되었다. 반사방지막의 코팅 두께를 제어하기 위하여 스프레이 노즐의 이동속도는 15~25 mm/s로 변경되었다. 스프레이 노즐의 이동속도가 증가 됨에 따라 반사방지막의 두께는 138 nm에서 86 nm로 감소되었다. 20 mm/s의 노즐 이동속도에 의해 제조된 반사방지막의 굴절률은 약 1.31, 막의 두께는 104 nm이며, 380 nm에서 780 nm의 가시광 영역에서의 평균 반사율은 0.75 %, 투과율은 94 %로 측정되었다.

RF 마그네트론 스퍼터링을 이용한 태양전지용 질화 실리콘 반사방지막 (Anti-reflection Coating of Silicon Nitride Film for Solar Cell by RF Magnetron Sputtering)

  • 최균;최의석;황진하;이수홍
    • 한국세라믹학회지
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    • 제44권10호
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    • pp.585-588
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    • 2007
  • Silicon nitride films for an anti-reflection coating were deposited on silicon via RF magnetron sputtering using a $Si_3N4$ target. The best result was obtained at the sputtering condition of 340 W RF power, 5 mtorr Ar atmosphere, $100^{\circ}C$ substrate temperature. The films showed 7.9% reflectance minimum with 2.35 refractive index. 0.21 absorption coefficient at 66.6 nm thickness. The surface morphology showed a smooth and dense film with good adhesion to silicon surface.

Anti-Reflection Properties of In-Situ Doped Spin-On Film

  • U. Gangopadhyay;Kim, Kyung-Hae;Park, J.H.;S.K. Dhungel;D. Mangalaraj;J. Yi;H. Saha;Kim, D.W.
    • Transactions on Electrical and Electronic Materials
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    • 제4권6호
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    • pp.1-4
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    • 2003
  • Anti-reflection properties of post diffusion doped spin-on source (in-situ AR coating) have been investigated in some detail. A simple experiment for reflectivity study using oblique incidence of light and necessary modification of the theory of minimum reflectivity at oblique incidence has been established. The comparative study of the in-situ AR coating with available spin-on AR film on silicon Solar Cell Surface have been investigated.

근접장 마이크로파 현미경을 이용한 Copper(II)-phthalocyanine 박막의 특성 연구 (Characterization of thin film properties of Copper(II)-Phthalocyanine using a near-field scanning microwave microscope)

  • 박미화;이기진
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 추계학술대회 논문집 Vol.16
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    • pp.460-463
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    • 2003
  • We report the microwave reflection coefficient $S_{11}$ of copper(II)-phthalocyanine(CuPc) using a near-field microwave microscope(NSMM) in order to understand the intrinsic electromagnetic properties of organic materials. For a NSMM system, a high-quility microstip resonator coupled with a dielectric resonator was used. The reflection coefficient $S_{11}$ was changed by the preparation conditions of CuPc thin films. We compared the reflection coefficient with crystal phase, surface morphology, UV absorption spectra and x-ray diffraction results.

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영화 <아바타>에 나타난 육체성 연구 (A study on the corporality in the film Avatar)

  • 김호영
    • 비교문화연구
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    • 제29권
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    • pp.233-256
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    • 2012
  • This paper aims to look into various symbolic meanings of the body shown in the film, Avatar (2009, James Cameron), and to ponder over a variety of media strategies carried by the pursuit of the corporality shown in this film. In a nutshell, the body in Avatar is a symbol of primitiveness rather than civilization, and the body language is a fundamental and effective means of communication much better than verbal language. A variety of physical contacts that appeared in many scenes of the movie emphasizes the role of the body as a means of real communication. Also, in the composition of the film dominated by the confrontation of civilization, numerous creatures in the planet Pandora with a variety of colors as well as a number of agencies and large body sizes express primitive richness. The narrative of the film telling the story of a 'moving' body ultimately emphasizes the superiority of the body with respect to consciousness, unlike the narrative of conventional movies dealing with the problems of the body. In addition, the corporality pursued by this film implies several important media strategies. It may reveal a self-reflection of the material civilization and the imperialism, or, on the contrary, an attempt to conceal or dilute them. It may also represent a self-reflection of the overdeveloped media technology, or simply the dilution of it. Finally, it may be an attempt to recover the feeling of "presence", not fully supported by the 3D technology, by the identification of the spectator's body and the character's body.

액정표시장치 백라이트용 집광필름의 광학특성 분석을 위한 시뮬레이션 기법 연구 (Optical Simulation Study on the Performances of Collimating Films for LCD Backlight Applications)

  • 박지희;이정호;정진하;남기봉;고재현;김중현
    • 한국광학회지
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    • 제18권6호
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    • pp.432-440
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    • 2007
  • LCD 백라이트에 사용되는 집광필름의 광학적 성능을 예측하는 효율적인 방법으로 광선추적기법이 적용된 광학 시뮬레이션이 많이 사용되고 있다. 집광필름의 광특성을 정확히 예측하기 위해서는 시뮬레이션에 영향을 미치는 조건들을 세심하게 설정하여야 한다. 본 연구에서는 가장 대표적인 집광필름인 프리즘필름의 시야각 특성 및 휘도상승률에 중요한 영향을 미치는 시뮬레이션 조건을 분석하기 위해 반사필름, 가상의 평면광원, 프리즘필름으로 구성된 간단한 BLU 모델을 구성한 후 다양한 조건 하에서 체계적인 시뮬레이션을 수행하였다. 그 결과 (1) 집광필름의 구조 및 재질 변화에 따른 광학적 성능, 특히 휘도상승률의 상대적 변화는 위에서 기술한 간단한 모델로도 충분히 예측할 수 있음을 확인하였고, (2) 집광필름의 시야각 특성을 정확히 예측하기 위해서는 반사필름의 반사성격 및 집광필름에 입사되는 빛의 분포를 시뮬레이션에 정확히 반영해야만 함을 확인할 수 있었다. 확산판, 확산필름 및 프리즘필름이 적층된 직하형 BLU에서 얻어진 실험결과와 시뮬레이션 결과를 비교 분석한 결과, 상기의 시뮬레이션 모델에 반사필름이 보이는 양방향반사분포함수를 적용하고 확산필름 위의 출광분포를 광원으로 이용할 경우 실험에서 얻어진 프리즘필름 위의 출광분포를 정확히 재현할 수 있음을 확인하였다.

다층 박막을 이용한 패럴 단면의 무반사 코팅 설계 및 특성 (Design and Characteristics of Anti-reflection Coating using Multi-layer Thin Film on the Ferrule Facet)

  • 기현철;양명학;김선훈;김태언;김회종;구할본
    • 한국전기전자재료학회논문지
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    • 제20권11호
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    • pp.991-994
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    • 2007
  • In this paper, we have designed the anti-reflection(AR) coating for $1400{\sim}1600$ nm wavelength range on the ferrule facet of optical connector. The low-temperature ion-assisted deposition was applied to AR coating on the ferrule facet in order to avoid damage of optical connector. We have measured the refractive index of coating film($Ta_2O_5\;and\;SiO_2$) using the ellipsometer and optimized the film thickness using the SEM and thickness measurement equipment. UV-VIS-NIR spectrophotometer is used to measure transmissivity of the AR coated ferrule facet. The refractive index of $Ta_2O_5\;and\;SiO_2$ is $2.123{\sim}2.125$ and $1.44{\sim}1.442$, respectively, for $1400{\sim}1600$ nm wavelength range. The transmissivity of the AR coated ferule facet is more than 99.8 % for $1425{\sim}1575$ nm wavelength range and more than 99.5 % for $1400{\sim}1600$ nm wavelength range. The return loss of the AR coated ferrule facet is 30.1 dB.

홀로그래픽 반사형 필터의 중심파장과 대역폭의 조절방법 (Control of Center Wavelength and Bandwidth of Holographic Reflection Filter)

  • 정만호
    • 한국광학회지
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    • 제4권3호
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    • pp.276-280
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    • 1993
  • 홀로그래픽 감광재료인 dichromated gelatin 필름을 사용하여 반사형 간섭필터를 제작하였다. 반사형 홀로그래픽 광학소자의 경우 중요한 파라미터인 회절효율, 중심파장, 그리고 대역폭의 특성을 실험을 통하여 설명하고 이들의 값을 조절하기 위한 방법을 제시하였다.

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이온빔 처리된 폴리머 표면의 자가나노구조화를 이용한 반사방지 필름 제조용 소프트 몰드 임프린팅 연구 (Soft Mold Imprinting Fabrication of Anti-reflection Film using Self-Organized Nanostructure Polymer Surfaces Irradiated by Ion Beams)

  • 이승훈;변은연;최주연;정성훈;유병길;김도근
    • 한국표면공학회지
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    • 제50권6호
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    • pp.480-485
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    • 2017
  • Soft mold imprinting method that uses nanostructured polymer mold was investigated for anti-reflection film fabrication. The nanostructured soft mold was polyethylene terephthalate(PET) irradiated by oxygen ion beams. The collisional energy transfer between oxygen ion and the polymer surface induced cross-linking and scission reactions, resulting in self-organized nanostructures with regular patterns of the wavenumber of $5{\mu}m^{-1}$. Post processes including ultra-violet curable resin coating and delamination fabricated anti-reflection films. The imprinted resin surface also showed the consistent wavenumber, $5{\mu}m^{-1}$. Pristine PET, oxygen ion beam treated PET, and imprinted replica sample showed total transmittance of 91.04, 93.25, and 93.57-93.88%, respectively.