• 제목/요약/키워드: Reactive Ion etching

검색결과 381건 처리시간 0.028초

Removal of Metallic Cobalt Layers by Reactive Cold Plasma

  • Kim, Yong-Soo;Jeon, Sang-Hwan;Yim, Byung-Joo;Lee, Hyo-Cheol;Jung, Jong-Heon;Kim, Kye-Nam
    • 한국방사성폐기물학회:학술대회논문집
    • /
    • 한국방사성폐기물학회 2004년도 학술논문집
    • /
    • pp.32-42
    • /
    • 2004
  • Recently, plasma surface-cleaning or surface-etching techniques have been focused in respect of the decontamination of spent or used nuclear parts and equipment. In this study the removal rate of metallic cobalt surface is experimentally investigated via its surface etching rate with a $CF_4-o_2$mixed gas plasma. Experimental results reveal that a mixed etchant gas with about 80% $CF_4$-20% $O_2$ (molar) gives the highest reaction rate and the rate reaches 0.06 ${\mu}m$/min at $380^{\circ}C$ and ion-assisted etching dramatically enhances the surface reaction rate. With a negative 300 V DC bias voltage applied to the substrate, the surface reaction initiation temperature lowers and the rate increases about 20 times at $350^{\circ}C$ and up to 0.43 ${\mu}m$/min at $380^{\circ}C$, respectively. Surface morphology analysis confirms the etching rate measurements. Auger spectrum analysis clearly shows the adsorption of fluorine atoms on the reacted surface. From the current experimental findings and the results discussed in previous studies, mechanistic understanding of the surface reaction, fluorination and/or fluoro-carbonylation reaction, is provided.

  • PDF

자장강화된 유도결합 플라즈마를 이용한 (Ba, Sr) $TiO_3$박막의 식각 특성 연구 (The Etching Characteristics of (Ba, Sr) $TiO_3$Thin Films Using Magnetically Enhanced Inductively Coupled Plasma)

  • 민병준;김창일
    • 한국전기전자재료학회논문지
    • /
    • 제13권12호
    • /
    • pp.996-1002
    • /
    • 2000
  • Ferroelectric (Ba, Sr) TiO$_3$(BST) thin films have attracted much attention for use in new capacitor materials of dynamic random access memories (DRAMs). In order to apply BST to the DRAMs, the etching process for BST thin film with high etch rate and vertical profile must be developed. However, the former studies have the problem of low etch rate. In this study, in order to increase the etch rate, BST thin films were etched with a magnetically enhanced inductively coupled plasma(MEICP) that have much higher plasma density than RIE (reactive ion etching) and ICP (inductively coupled plasma). Experiment was done by varying the etching parameters such as CF$_4$/(CF$_4$+Ar) gas mixing ratio, rf power, dc bias voltage and chamber pressure. The maximum etch rate of the BST films was 170nm/min under CF$_4$/CF$_4$+Ar) of 0.1, 600 W/-350 V and 5 mTorr. The selectivities of BST to Pt and PR were 0.6 and 0.7, respectively. Chemical reaction and residue of the etched surface were investigated with X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS).

  • PDF

Low-Angle Forward Reflected Neutral Beam Etching을 이용한 Aspect-Ratio-Dependent Etching 현상의 제거 (Removal of Aspect-Ratio-Dependent Etching by Low-Angle Forward Reflected Neutral-Beam Etching)

  • 민경석;박병재;염근영;김성진;이재구
    • 한국진공학회지
    • /
    • 제15권4호
    • /
    • pp.387-394
    • /
    • 2006
  • 본 연구에서는 반응성 이온빔을 low-angle forward reflection으로 생성시킨 중성빔을 이용하여 Aspect Ratio Dependent Etching (ARDE) 현상이 제거되는 효과에 대하여 연구하였다. SF6 가스를 사용하여 Inductively Coupled Plasma system과 이온빔으로 각각 poly-Si 을 식각한 결과 ARDE 현상을 관찰할 수 있었으며, Si 기판위에 증착된 Poly-Si을 식각하는 것보다 $SiO_2$ 기판 위에 증착된 Poly-Si을 식각하는 것이 ARDE 현상이 더 많이 나타난다는 것을 관찰할 수 있었다. 반면에 같은 공정 조건에서 중성빔으로 poly-Si을 식각한 결과 이러한 ARDE 현상이 효과적으로 제거되었음을 관찰할 수 있었다. 중성빔을 이용하여 ARDE 현상이 제거되는 원리는 2 차원의 XOOPIC code 와 TRIM code를 사용하여 여러가지 나노스케일의 형상을 컴퓨터 시뮬레이션하여 증명하였다.

P-형 실리콘에서 마이크로 와이어 형성에 미치는 마스크 패턴의 영향 (The Effect of Mask Patterns on Microwire Formation in p-type Silicon)

  • 김재현;김강필;류홍근;우성호;서홍석;이정호
    • 한국전기전자재료학회:학술대회논문집
    • /
    • 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
    • /
    • pp.418-418
    • /
    • 2008
  • The electrochemical etching of silicon in HF-based solutions is known to form various types of porous structures. Porous structures are generally classified into three categories according to pore sizes: micropore (below 2 nm in size), mesopore (2 ~ 50 nm), and macropore (above 50 nm). Recently, the formation of macropores has attracted increasing interest because of their promising characteristics for an wide scope of applications such as microelectromechanical systems (MEMS), chemical sensors, biotechnology, photonic crystals, and photovoltaic application. One of the promising applications of macropores is in the field of MEMS. Anisotropic etching is essential step for fabrication of MEMS. Conventional wet etching has advantages such as low processing cost and high throughput, but it is unsuitable to fabricate high-aspect-ratio structures with vertical sidewalls due to its inherent etching characteristics along certain crystal orientations. Reactive ion dry etching is another technique of anisotropic etching. This has excellent ability to fabricate high-aspect-ratio structures with vertical sidewalls and high accuracy. However, its high processing cost is one of the bottlenecks for widely successful commercialization of MEMS. In contrast, by using electrochemical etching method together with pre-patterning by lithographic step, regular macropore arrays with very high-aspect-ratio up to 250 can be obtained. The formed macropores have very smooth surface and side, unlike deep reactive ion etching where surfaces are damaged and wavy. Especially, to make vertical microwire or nanowire arrays (aspect ratio = over 1:100) on silicon wafer with top-down photolithography, it is very difficult to fabricate them with conventional dry etching. The electrochemical etching is the most proper candidate to do it. The pillar structures are demonstrated for n-type silicon and the formation mechanism is well explained, while such a experimental results are few for p-type silicon. In this report, In order to understand the roles played by the kinds of etching solution and mask patterns in the formation of microwire arrays, we have undertaken a systematic study of the solvent effects in mixtures of HF, dimethyl sulfoxide (DMSO), iso-propanol, and mixtures of HF with water on the structure formation on monocrystalline p-type silicon with a resistivity with 10 ~ 20 $\Omega{\cdot}cm$. The different morphological results are presented according to mask patterns and etching solutions.

  • PDF

ICP-RIE를 이용한 저압용 실리콘 압력센서 제작 (Fabrication of a silicon pressure sensor for measuring low pressure using ICP-RIE)

  • 이영태
    • 센서학회지
    • /
    • 제16권2호
    • /
    • pp.126-131
    • /
    • 2007
  • In this paper, we fabricated piezoresistive pressure sensor with dry etching technology which used ICP-RIE (inductively coupled plasma reactive ion etching) and etching delay technology which used SOI (silicon-on-insulator). Structure of the fabricated pressure sensor shows a square diaphragm connected to a frame which was vertically fabricated by dry etching process and a single-element four-terminal gauge arranged at diaphragm edge. Sensitivity of the fabricated sensor was about 3.5 mV/V kPa at 1 kPa full-scale. Measurable resolution of the sensor was not exceeding 20 Pa. The nonlinearity of the fabricated pressure sensor was less than 0.5 %F.S.O. at 1 kPa full-scale.

Run-to-Run Control of Inductively Coupled C2F6 Plasmas Etching of SiO2;Construction of a Process Simulator with a CFD code

  • Seo, Seung-T.;Lee, Yong-H.;Lee, Kwang-S.;Yang, Dae-R.;Choi, Bum-Kyoo
    • 제어로봇시스템학회:학술대회논문집
    • /
    • 제어로봇시스템학회 2005년도 ICCAS
    • /
    • pp.519-524
    • /
    • 2005
  • A numerical process to simulate SiO2 dry etching with inductively coupled C2F6 plasmas has been constructed using a commercial CFD code as a first step to design a run-to-run control system. The simulator was tuned to reasonably predict the reactive ion etching behavior and used to investigate the effects of plasma operating variables on the etch rate and uniformity. The relationship between the operating variables and the etching characteristics was mathematically modeled through linear regression for future run-to-run control system design.

  • PDF

플라즈마중합 스티렌 박막의 e-beam 레지스트 특성에 관한 연구 (A study on the E-beam resist characteristics of plasma polymerized styrene)

  • 이덕출;박종관
    • E2M - 전기 전자와 첨단 소재
    • /
    • 제7권5호
    • /
    • pp.425-429
    • /
    • 1994
  • In this paper, we study on the plasma polymerized styrene as a negative electron-beam resist. Plasma polymerized thin film was prepared using an interelectrode inductively coupled gas-flow type reactor. We show that polymerization parameters of thin film affect sensitivity and etching resistance of the resist. Molecular weight distribution of plasma polymerized styrene is 1.41-3.93, and deposition rates of that are 32-383[.angs./min] with discharge power. Swelling and etching resistance becomes . more improved with increasing discharge power during plasma polymerization. Etch rate by RIE is higher than that by plasma etching.

  • PDF

공정가스와 RF 주파수에 따른 웨이퍼 표면 텍스쳐 처리 공정에서 저반사율에 관한 연구 (Study of Low Reflectance and RF Frequency by Rie Surface Texture Process in Multi Crystall Silicon Solar Cells)

  • 윤명수;현덕환;진법종;최종용;김정식;강형동;이준신;권기청
    • 한국진공학회지
    • /
    • 제19권2호
    • /
    • pp.114-120
    • /
    • 2010
  • 일반적으로 결정질 실리콘 태양전지에서 표면에 텍스쳐링(texturing)하는 것은 알칼리 또는 산성 같은 화학용액을 사용하고 있다. 그러나 실리콘 부족으로 실리콘의 양의 감소로 인하여 웨이퍼 두께가 감소하고 있는 추세에 일반적으로 사용하고 있는 습식 텍스쳐링 방법에서 화학용액에 의한 많은 양의 실리콘이 소모되고 있어 웨이퍼의 파손이 심각한 문제에 직면하고 있다. 그리하여 습식 텍스쳐링 방법보다는 플라즈마로 텍스쳐링할 수 있는 건식 텍스쳐링 방법인 RIE (reactive ion etching) 기법이 대두되고 있다. 그리고 습식 텍스쳐링으로는 결정질 실리콘 태양전지의 반사율을 10% 이하로는 낮출 수가 없다. 다결정 실리콘 웨이퍼 표면에 텍스쳐링을 하기 위하여 125 mm 웨이퍼 144개를 수용할 수 있는 대규모 플라즈마 RIE 장비를 개발하였다. 반사율을 4% 이하로 낮추기 위하여 공정가스는 $Cl_2$, $SF_6$, $O_2$를 기반으로 RIE 텍스쳐링을 하였고 텍스쳐링의 모양은 공정가스, 공정시간, RF 주파수 등에 의해 조절이 가능하였다. 본 연구에서 RIE 공정을 통하여 16.1%의 변환효율을 얻었으며, RF 주파수가 텍스쳐링의 모양에 미치는 영향을 살펴보았다.