• Title/Summary/Keyword: Range Gate

Search Result 432, Processing Time 0.022 seconds

Dynamic range extension of the n-well/gate-tied PMOSFET-type photodetector with a built-in transfer gate (내장된 전송 게이트를 가지는 n-well/gate가 연결된 구조의 PMOSFET형 광검출기의 동작 범위 확장)

  • Lee, Soo-Yeun;Seo, Sang-Ho;Kong, Jae-Sung;Jo, Sung-Hyun;Choi, Kyung-Hwa;Choi, Pyung;Shin, Jang-Kyoo
    • Journal of Sensor Science and Technology
    • /
    • v.19 no.4
    • /
    • pp.328-335
    • /
    • 2010
  • We have designed and fabricated an active pixel sensor(APS) using an optimized n-well/gate-tied p-channel metal oxide semiconductor field effect transistor(PMOSFET)-type photodetector with a built-in transfer gate. This photodetector has a floating gate connected to n-well and a built-in transfer gate. The photodetector has been optimized by changing the length of the transfer gate. The APS has been fabricated using a 0.35 ${\mu}m$ standard complementary metal oxide semiconductor(CMOS) process. It was confirmed that the proposed APS has a wider dynamic range than the APS using the previously proposed photodetector and a higher sensitivity than the conventional APS using a p-n junction photodiode.

Analysis of issues in gate recess etching in the InAlAs/InGaAs HEMT manufacturing process

  • Byoung-Gue Min;Jong-Min Lee;Hyung Sup Yoon;Woo-Jin Chang;Jong-Yul Park;Dong Min Kang;Sung-Jae Chang;Hyun-Wook Jung
    • ETRI Journal
    • /
    • v.45 no.1
    • /
    • pp.171-179
    • /
    • 2023
  • We have developed an InAlAs/InGaAs metamorphic high electron mobility transistor device fabrication process where the gate length can be tuned within the range of 0.13㎛-0.16㎛ to suit the intended application. The core processes are a two-step electron-beam lithography process using a three-layer resist and gate recess etching process using citric acid. An electron-beam lithography process was developed to fabricate a T-shaped gate electrode with a fine gate foot and a relatively large gate head. This was realized through the use of three-layered resist and two-step electron beam exposure and development. Citric acid-based gate recess etching is a wet etching, so it is very important to secure etching uniformity and process reproducibility. The device layout was designed by considering the electrochemical reaction involved in recess etching, and a reproducible gate recess etching process was developed by finding optimized etching conditions. Using the developed gate electrode process technology, we were able to successfully manufacture various monolithic microwave integrated circuits, including low noise amplifiers that can be used in the 28 GHz to 94 GHz frequency range.

The Analysis of Breakdown Voltage for the Double-gate MOSFET Using the Gaussian Doping Distribution

  • Jung, Hak-Kee
    • Journal of information and communication convergence engineering
    • /
    • v.10 no.2
    • /
    • pp.200-204
    • /
    • 2012
  • This study has presented the analysis of breakdown voltage for a double-gate metal-oxide semiconductor field-effect transistor (MOSFET) based on the doping distribution of the Gaussian function. The double-gate MOSFET is a next generation transistor that shrinks the short channel effects of the nano-scaled CMOSFET. The degradation of breakdown voltage is a highly important short channel effect with threshold voltage roll-off and an increase in subthreshold swings. The analytical potential distribution derived from Poisson's equation and the Fulop's avalanche breakdown condition have been used to calculate the breakdown voltage of a double-gate MOSFET for the shape of the Gaussian doping distribution. This analytical potential model is in good agreement with the numerical model. Using this model, the breakdown voltage has been analyzed for channel length and doping concentration with parameters such as projected range and standard projected deviation of Gaussian function. As a result, since the breakdown voltage is greatly changed for the shape of the Gaussian function, the channel doping distribution of a double-gate MOSFET has to be carefully designed.

Multi Function IGBT Gate Driver Including Arm Short Protection (Arm Short 보호 기능을 포함한 다기능 IGBT GATE DRIVER)

  • 이경복;조국춘;최종묵
    • Proceedings of the KSR Conference
    • /
    • 2000.05a
    • /
    • pp.202-209
    • /
    • 2000
  • This paper introduces the main function and protection method of IGBT gate driver that designed by KOROS. Recently, the applications of insulated gate bipolar transistors(IGBTs) have expanded widely, particularly in the area of railway converters. This driver is suitable for railway traction applications, so they are designed for circumstance of railway vehicle such as vibration. The input control power for this driver is supplied from battery charger of railway. it is no necessary an isolated power supply board or auxiliary power supply, with substantial savings in cost and space in railway applications. This gate driver can be used wide range of input voltage. So, performance of the driver has no relation with the battery voltage(70V∼110V). The protection methods of IGBT gate driver have many kind of ways, but this gate driver it designed to apply to converter for railway system, so this gate driver includes protection for arm short current and low control power voltage, etc. And the process of protection method and protection reference value are optimized by means of sufficient test with our own facilities.

  • PDF

Analysis of Short Channel Effects Using Analytical Transport Model For Double Gate MOSFET

  • Jung, Hak-Kee
    • Journal of information and communication convergence engineering
    • /
    • v.5 no.1
    • /
    • pp.45-49
    • /
    • 2007
  • The analytical transport model in subthreshold regime for double gate MOSFET has been presented to analyze the short channel effects such as subthreshold swing, threshold voltage roll-off and drain induced barrier lowering. The present approach includes the quantum tunneling of carriers through the source-drain barrier. Poisson equation is used for modeling thermionic emission current, and Wentzel-Kramers-Brillouin approximations are applied for modeling quantum tunneling current. This model has been used to investigate the subthreshold operations of double gate MOSFET having the gate length of the nanometer range with ultra thin gate oxide and channel thickness under sub-20nm. Compared with results of two dimensional numerical simulations, the results in this study show good agreements with those for subthreshold swing and threshold voltage roll-off. Note the short channel effects degrade due to quantum tunneling, especially in the gate length of below 10nm, and DGMOSFETs have to be very strictly designed in the regime of below 10nm gate length since quantum tunneling becomes the main transport mechanism in the subthreshold region.

Analytical Threshold Voltage Modeling of Surrounding Gate Silicon Nanowire Transistors with Different Geometries

  • Pandian, M. Karthigai;Balamurugan, N.B.
    • Journal of Electrical Engineering and Technology
    • /
    • v.9 no.6
    • /
    • pp.2079-2088
    • /
    • 2014
  • In this paper, we propose new physically based threshold voltage models for short channel Surrounding Gate Silicon Nanowire Transistor with two different geometries. The model explores the impact of various device parameters like silicon film thickness, film height, film width, gate oxide thickness, and drain bias on the threshold voltage behavior of a cylindrical surrounding gate and rectangular surrounding gate nanowire MOSFET. Threshold voltage roll-off and DIBL characteristics of these devices are also studied. Proposed models are clearly validated by comparing the simulations with the TCAD simulation for a wide range of device geometries.

Characterizations of nitrided gate oxides by fowler-nordheim tunneling electron injection (Fowler-nordheim 터널링 전자주입에 의한 질화 게이트 산화막의 특성 분석)

  • 장성수;문성근;노관종;노용한;이칠기
    • Journal of the Korean Institute of Telematics and Electronics D
    • /
    • v.35D no.7
    • /
    • pp.79-87
    • /
    • 1998
  • Nitrided oxides which have been investigated as alternative gate oxide for metal-oxide-semiconductor field effect devices were grown by two-step process using N$_{2}$O gas, and were chaacterized via a fowler-nordheim tunneling(FNT) electron injection technique. Electrical characteristics of nitrided gate oxides were superior to that of control oxides.Further, the FNT electron injection into the nitrided gate oxides reveals that gate oxides degrade more both if electrons were foreced to inject from the gate metal and if thicker nitrided gate oxides were used in the thickness range of 90~130.angs.. Models are suggested to explain these phenomena.

  • PDF

A Numerical Simulations on the Flow over Ogee Spillway with Tainter Gate (테인터수문이 설치된 월류형 여수로에서의 흐름에 대한 수치모의)

  • Kim, Dae-Geun;Park, Jae-Hyun;Lee, Jae-Hyung
    • Journal of Korea Water Resources Association
    • /
    • v.37 no.8
    • /
    • pp.675-685
    • /
    • 2004
  • In this study, overflow behaviors through a partially open tainter gate mounted on a standard ogee spillway were investigated by using the FLOW-3D. The results indicated that the discharge coefficient is in the range of 0.685 to 0.723. A relation of gate-controlled discharge to free discharge was proposed and a reasonable correlation between the free and controlled discharge was obtained. Pressures on the spillway crest and the gate were also investigated. As the gate opening rate decreases with a fixed gate opening height and the gate opening height increases at a fixed gate opening rate, negative pressures on the spillway crest and the dimensionless maximum pressures on the gate increase.

Study of Flow Control Range according to Valve Type (밸브 형식별 유량제어범위 결정에 관한 연구)

  • Park, Jong-Ho;Park, Han-Yung
    • The KSFM Journal of Fluid Machinery
    • /
    • v.14 no.5
    • /
    • pp.39-47
    • /
    • 2011
  • Flow control range of valve, which is installed on pipeline, varies according to valve type, pipe diameter, pipe length, roughness, and elevation difference of both ends of pipeline. A lot of computation efforts and knowledge are needed to estimate flow control range of valve, considering above many parameters. The table of flow control range of each valve type is presented for convenience of pipeline design engineers who must make decision of valve size and type in this study. Also the reason that butterfly valve is recommended for flow control, and gate valve is forbidden is presented via quantification and figures in this study.

Frequency controllable fast switching gate driver for self-resonant inverters (주파수 조절이 가능한 자려식 공진형 인버터의 고속 게이트 구동회로)

  • Ryoo, Tae-Ha;Chae, Gyun;Cho, Gyu-Hyeong
    • Proceedings of the KIEE Conference
    • /
    • 1999.07f
    • /
    • pp.2783-2785
    • /
    • 1999
  • A fast switching gate driver suitable for high performance self resonant electronic ballasts is presented. The proposed gate driver has negligible switching loss and driving loss owing to pnpn structure and zero voltage switching( ZVS ); moreover, the gate driver has frequency control capability. Therefore, a self resonant inverter using proposed gate driver can operate as external exciting resonant inverters. The experiments confirm that the proposed gate driver perform the desired operations over full power control range for 40W fluorescent lamp electronic ballast.

  • PDF