• Title/Summary/Keyword: Random Failures

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ISO 26262 의 하드웨어 ASIL 정량적 평가 절차

  • Kim, Gi-Yeong;Jang, Jung-Sun
    • Proceedings of the Korean Reliability Society Conference
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    • 2011.06a
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    • pp.271-279
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    • 2011
  • Automotive safety integrity level of hardware components can be achieved by satisfying quantitative and qualitative requirements. Based on ASIL, quantitative requirements are composed of hardware architectural metrics and evaluation of safety goal violations due to random hardware failures in ISO 26262. In this paper, the types of hardware failures will be defined and classified. Based on various metrics related with hardware failures, design essentials to achieve hardware safety integrity will be studied specifically. Issues associated with hardware development and assessment process are presented briefly.

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OPPORTUNISTIC AGE REPLACEMENT POLICY

  • Jhang, Jhy-Ping
    • Proceedings of the Korean Society for Quality Management Conference
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    • 1998.11a
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    • pp.269-276
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    • 1998
  • This paper proposes an opportunistic age replacement policy. The system has two types of failures. Type I failures (minor failures) are removed by minimal repairs, whereas type II failures are removed by replacements. Type I and type II failures are age-dependent. A system is replaced at type II failure (catastrophic failure) or at the opportunity after age T, whichever occurs first. The cost of the minimal repair of the system at age z depends on the random part C(z) and the deterministic part c(z). The opportunity arises according to a Poisson process, independent of failures of the component. The expected cost rate is obtained. The optimal $T^{\ast}$ which would minimize the cost rate is discussed. Various special cases are considered. Finally, a numerical example is given.

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A Technique for Analyzing LSI Failures Using Wafer-level Emission Analysis System

  • Higuchi, Yasuhisa;Kawaguchi, Yasumasa;Sakazume, Tatsumi
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.1 no.1
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    • pp.15-19
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    • 2001
  • Current leakage is the major failure mode of semiconductor device characteristic failures. Conventionally, failures such as short circuit breaks and gate breakdowns have been analyzed and the detected causes have been reflected in the fabrication process. By using a wafer-level emission-leakage failure analysis method (in-line QC), we analyzed leakage mode failure, which is the major failure detected during the probe inspection process for LSIs, typically DRAMs and CMOS logic LSIs. We have thus developed a new technique that copes with the critical structural failures and random failures that directly affect probe yields.

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Joint Modeling of Death Times and Number of Failures for Repairable Systems using a Shared Frailty Model (공유환경효과를 고려한 수리가능한 시스템의 수명과 고장회수의 결합모형 개발)

  • 박희창;이석훈
    • Journal of Korean Society for Quality Management
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    • v.26 no.4
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    • pp.111-123
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    • 1998
  • We consider the problem of modeling count data where the observation period is determined by the life time of the system under study. We assume random effects or a frailty model to allow for a possible association between the death times and the counts. We assume that, given a random effect or a frailty, the death times follow a Weibull distribution with a hazard rate. For the counts, given a frailty, a Poisson process is assumed with the intensity depending on time. A gamma distribution is assumed for the frailty model. Maximum likelihood estimators of the model parameters are obtained. A model for the time to death and the number of failures system received is constructed and consequences of the model are examined.

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A Periodic Replacement Model with Random Repair Costs and Threshold Levels (확률적 수리비용과 임계수준을 고려한 주기적 교체 모형에 관한 연구)

  • Gang Yeong-Gil;Gang Seong-Jin
    • Journal of the military operations research society of Korea
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    • v.18 no.2
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    • pp.114-125
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    • 1992
  • A policy of periodic replacement with minimal repair at failure is considered for a complex system. Under such a policy the system is replaced at periodic times. iT(i=1,2, $\ldots$), while minimal repair is performed at any intervening system failures. The cost of the j-th minimal repair to the component which fails at age t is g(C(t). $c_j$ (t)), where C(t) is the age-dependent random part, $c_j$(t) is the deterministic part which depends on the age and the number of the minimal repair to the component, and g is a positive nondecreasing continuous function. The cost of replacement is expensive when the number of failures occurring in (0. T) is greater than a threshold level. The problem of determining the optimal replacement period, $T^{\ast}$, which minimizes the total expected cost per unit time over an infinite time horizon is considered. Various special cases are considered.

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A study on Optimum Inspection Policy for an equipment with two stages of failures (이단계 고장을 갖는 설비에 대한 최적 검사 정책)

  • 김정식
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.13 no.21
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    • pp.19-24
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    • 1990
  • This paper deals with a problem of choosing an optimum inspection period for an equipment with two stages of failures. Stage I failure which can be detected only through inspection detenorates the equipment and causes critical stage II failure after a random period of time. The expected average cost function is obtained and an optimum inspection policy is discussed. A numerical example is also worked out.

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Analysis Approaches to Data of Both Age and Usage Attributes (시간과 사용량의 속성을 지닌 데이터의 분석방안)

  • Jo, Jin-Nam;Baik, Jai-Wook
    • Journal of Korean Society for Quality Management
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    • v.35 no.1
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    • pp.136-141
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    • 2007
  • For many products failures depend on age and usage and, in this case, failures are random points in a two-dimensional plane with the two axes representing age and usage. Models play an important role in decision-making. In this research, an accelerate failure test (AFT) model is proposed to deal with the two-dimensional data. The parameters are proposed to be estimated through maximum likelihood estimators.

Comparative Analysis of Effective Algorithm Techniques for the Detection of Syn Flooding Attacks (Syn Flooding 탐지를 위한 효과적인 알고리즘 기법 비교 분석)

  • Jong-Min Kim;Hong-Ki Kim;Joon-Hyung Lee
    • Convergence Security Journal
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    • v.23 no.5
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    • pp.73-79
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    • 2023
  • Cyber threats are evolving and becoming more sophisticated with the development of new technologies, and consequently the number of service failures caused by DDoS attacks are continually increasing. Recently, DDoS attacks have numerous types of service failures by applying a large amount of traffic to the domain address of a specific service or server. In this paper, after generating the data of the Syn Flooding attack, which is the representative attack type of bandwidth exhaustion attack, the data were compared and analyzed using Random Forest, Decision Tree, Multi-Layer Perceptron, and KNN algorithms for the effective detection of attacks, and the optimal algorithm was derived. Based on this result, it will be useful to use as a technique for the detection policy of Syn Flooding attacks.

A Safety Assessment Methodology for a Digital Reactor Protection System

  • Lee Dong-Young;Choi Jong-Gyun;Lyou Joon
    • International Journal of Control, Automation, and Systems
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    • v.4 no.1
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    • pp.105-112
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    • 2006
  • The main function of a reactor protection system is to maintain the reactor core integrity and the reactor coolant system pressure boundary. Generally, the reactor protection system adopts the 2-out-of-m redundant architecture to assure a reliable operation. This paper describes the safety assessment of a digital reactor protection system using the fault tree analysis technique. The fault tree technique can be expressed in terms of combinations of the basic event failures such as the random hardware failures, common cause failures, operator errors, and the fault tolerance mechanisms implemented in the reactor protection system. In this paper, a prediction method of the hardware failure rate is suggested for a digital reactor protection system, and applied to the reactor protection system being developed in Korea to identify design weak points from a safety point of view.

MODIFIED GEOMETRIC DISTRIBUTION OF ORDER k AND ITS APPLICATIONS

  • JUNGTAEK OH;KYEONG EUN LEE
    • Journal of applied mathematics & informatics
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    • v.42 no.3
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    • pp.709-723
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    • 2024
  • We study the distributions of waiting times in variations of the geometric distribution of order k. Variation imposes length on the runs of successes and failures. We study two types of waiting time random variables. First, we consider the waiting time for a run of k consecutive successes the first time no sequence of consecutive k failures occurs prior, denoted by T(k). Next, we consider the waiting time for a run of k consecutive failures the first time no sequence of k consecutive successes occurred prior, denoted by J(k). In addition, we study the distribution of the weighted average. The exact formulae of the probability mass function, mean, and variance of distributions are also obtained.