• 한국윤활학회:학술대회논문집
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• 한국윤활학회 2003년도 학술대회지
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• pp.291-298
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• 2003

Recently, load/unload(L/UL) process is applied to a computer information storage device due to its advantages such as lower power consumption, larger data zone, simpler fabrication of disk for no bumped parking zone, and rarer contact between the slider and media. An analysis of the transient motion for the slider is very important to design an air bearing surface (ABS) of the slider to secure the stable performance of the system. During the L/UL process, however, there are several issues occurred such as contact or collision between slider and media. Sometimes this will cause the system failure. In this study, the dynamics of the slider during the loading process are investigated through a numerical simulation using FEM analysis and experiment.

• 한국전기전자재료학회논문지
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• 제33권5호
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• pp.386-392
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• 2020

In this study, the drift current characteristics of charged particles are analyzed for panels fabricated by varying the waveform biasing of the active particle loading method (APLM), which is a method driven by the electrophoretic principle of loading charged particles into a cell of a barrier rib-type electronic paper. We prepare 3 panels using APLM and 1 panel without APLM. The waveform of APLM uses square wave and ramp wave, and the step voltage wave is applied to the driving voltage. The drift currents measured from the square wave and ramp wave with the same period applied by APLM are 4.872 µC and 5.464 µC, respectively, and the ramp wave is shown to be relatively advantageous for loading charged particles that have a large q/m. The time-current curve results confirm that the abrupt movement of charged particles is occurring. When the step form wave signal with a short time of 1s is first applied, initial large movement of the charged particles is confirmed to occur in all samples, which is understood as the effect of applying the voltage necessary to remove the imaging force. The results of this study are expected to improve the loading of charged particles into the electronic paper cell, driven by the electrophoretic principle and optimization of the driving conditions.

• International Journal of Reliability and Applications
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• 제18권2호
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• pp.21-44
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• 2017

Accelerated life tests (ALTs) are frequently used in manufacturing industries to evaluate the reliability of products within a reasonable amount of time and cost. Test units are subjected to elevated stresses which yield quick failures. Most of the previous works on designing ALT plans are focused on tests that involve a single stress. Many times more than one stress factor influence the product's functioning. This paper deals with the design of optimum modified ramp-stress ALT plan for Burr type XII distribution with Type-I censoring under two stress factors, viz., voltage and switching rate each at two levels- low and high. It is assumed that usage time to failure is power law function of switching rate, and voltage increases linearly with time according to modified ramp-stress scheme. The cumulative exposure model is used to incorporate the effect of changing stresses. The optimum plan is devised using D-optimality criterion wherein the ${\log}_{10}$ of the determinant of Fisher information matrix is maximized. The method developed has been explained using a numerical example and sensitivity carried out.

• International Journal of Reliability and Applications
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• 제15권2호
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• pp.125-150
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• 2014

Accelerated life tests (ALTs) are extensively used to determine the reliability of a product in a short period of time. Test units are subject to elevated stresses which yield quick failures. ALT can be carried out using constant-stress, step-stress, progressive-stress, cyclic-stress or random-stress loading and their various combinations. An ALT with linearly increasing stress is ramp-stress test. Much of the previous work on planning ALTs has focused on constant-stress, step-stress, ramp-stress schemes and their various combinations where the stress is generally increased. This paper presents an optimal design of ramp soak-stress ALT model which is based on the principle of Thermal cycling. Thermal cycling involves applying high and low temperatures repeatedly over time. The optimal plan consists in finding out relevant experimental variables, namely, stress rates and stress rate change points, by minimizing variance of reliability function with pre-specified mission time under normal operating conditions. The Burr type XII life distribution and time-censored data have been used for the purpose. Burr type XII life distribution has been found appropriate for accelerated life testing experiments. The method developed has been explained using a numerical example and sensitivity analysis carried out.

• 한국소음진동공학회:학술대회논문집
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• 한국소음진동공학회 2004년도 추계학술대회논문집
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• pp.586-591
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• 2004

A load/unload mechanism is applied to most small form factor hard disk drives. Loading velocity is ones of the most important factors to ensure the reliability of the load/unload operations. Especially, the lower the flying height of the head becomes, the more important the accuracy of the loading velocity control becomes. Because there is no sensor during the load/unload operations, BEMF voltage is used to sense the head velocity. To measure BEMF voltage, a simple circuit is added to the load/unload HDD control system. Overall acceptable results are obtained by using the simple PI controller but the errors from the target velocity occur when the head moves along the ramp and then reaches the disk. Feedforward profile and disturbance observer are used to remove those errors effectively.

• Journal of the Korean Society for Industrial and Applied Mathematics
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• 제25권3호
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• pp.117-131
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• 2021

The problem of generalized thermoelasticity of two-temperature for finite piezoelectric rod will be modified by applying three different types of heating applications namely, thermal shock, ramp-type heating and harmonically vary heating. The solutions will be derived with direct approach by the application of Laplace transform and the Caputo-Fabrizio fractional order derivative. The inverse Laplace transforms are numerically evaluated with the help of a method formulated on Fourier series expansion. The results obtained for the conductive temperature, the dynamical temperature, the displacement, the stress and the strain distributions have represented graphically using MATLAB.

• International Journal of Reliability and Applications
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• 제18권2호
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• pp.45-63
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• 2017

In this paper, we have formulated optimum Accelerated Life Test (ALT) plan for a parallel system with two independent components using masked data with ramp-stress loading scheme and Type-I censoring. Consider a system of two independent and non-identical components connected in parallel. Such a system fails whenever all of its components has failed. The exact component that causes the system to fail is often unknown due to cost and time constraint. For each parallel system at test, we observe its system's failure time and a set of component that includes the component actually causing the system to fail. The stress-life relationship is modelled using inverse power law, and cumulative exposure model is assumed to model the effect of changing stress. The optimal plan consists in finding out the optimum stress rate using D-optimality criterion. The method developed has been explained using a numerical example and sensitivity analysis carried out.

• 정보저장시스템학회논문집
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• 제5권2호
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• pp.82-88
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• 2009

Understanding the adhesion behavior and characteristics of toner film is required to achieve image and text printing with high quality resolution. Toner can be considered as a thin film coating on a media such as paper or polymer film. Quantitative measurement of adhesion characteristics of the thin film is important to assess the reliability of the system. In this work the main objective was to investigate the adhesion characteristic between the toner and the media by ramp loading scratch test method. The scratch test may be used to obtain quantitative information about the adhesion of the film to the substrate. In the scratch test a diamond tip was used to scratch the surface of the toner film under an increasing normal load until the toner detached or fractured. The critical load (LC) was obtained from the experimental results. Also, the relationship between the critical load and the adhesive strength of the interface between the substrate and the toner was obtained by measuring the normal and tangential forces during the scratch test. Finally, theoretical analysis of the toner scratch characteristics was performed based on Benjamin and Weaver theory, Plowing model, and Laugier model.

• 한국운동역학회지
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• 제18권3호
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• pp.71-82
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• 2008

본 연구의 목적은 $20^{\circ}$ 경사로에 서 앞 뒤 보행 동작 시 지면반력 형태를 비교 분석하고자 한다. 본 연구를 위해서 두 대의 지면 반력기를 통해 전 후, 좌 우, 수직 지면반력값, 최대값, 최소값, 평균값 압력 중심 변위, 부하율과 감소율을 측정하였다. BD보행 시 RTO 시점에서 수직 지면반력값이 FU 보행에 비해 유의하게 높은 수치를 보인 반면, $RHC_2$ 시점에서는 더 낮은 수치를 보였다. 이는 보행 동작의 차이와 보행 시 발목과 무릎의 위치 변화, 무게 중심의 변화가 지면 반력의 형태에 직접적인 영향을 미치는 것으로 판단되어진다. 전 후 압력중심변위는 하향 보행 시 상향 보행에 비해 낮은 변화를 보였는데 이는 하향 시 생기는 불안정성을 상쇄하기 위해 더 강한 제동력이 발생되어 진 것으로 사료되어 진다. BD보행 시 부하율이 다른 보행에 비해 낮은 것을 알 수 있는데 이러한 결과를 통해 등산로에서 후방 보행 동작이 하지 근골격계에 지속적인 스트레스를 감소시켜 상해를 예방할 수 있는 방법으로 제시될 수 있을 것이다.

• 품질경영학회지
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• 제27권3호
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• pp.79-93
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• 1999

The common accelerated life test(ALT) consists of test methods applying a constant stress, higher than the use condition stress, to items. There we, however, situations for which a progressive stress ALT, in which the stress on a test item is continuously increased with time, Is more convenient to perform testing and simpler in analyzing data than a constant stress ALT. When a product under constant stress s follows a Weibull distribution with parameters $\theta$(5) and $\beta$, maximum likelihood(ML) estimators of parameters involved in the model are obtained and their asymptotic distributions are derived under stress bounded ramp tests in which the stress is increased linearly from use condition stress to the stress upper bound. The optimum test plans are also found which minimize the asymptotic variance of the ML estimator of the log mean life at design constant stress. For selected values of the design parameters, tables useful for finding optimal test plans are given. The effect of the pre-estimates of design parameters is studied.