The Detection of Molecular Ion $CsX^+$ (X=Al, Ga, As) for Quantitative SIMS Analysis
($CsX^+$ (X=Al, Ga, As) 분자이온을 이용한 SIMS의 정량분석)
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- Journal of the Korean Vacuum Society
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- v.1 no.1
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- pp.121-125
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- 1992