• Proceedings of the KIEE Conference
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• 1989.11a
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• pp.151-154
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• 1989

In the measurement of plasma parameters of the plasma C.V.D with probe method, the most important problem is the contamination of the probe surface. In this paper, we observe the surface contamination of probe surface with microscope and determine the critical current and the critical time to sustain the clean surface of probe in the plasma C.V.D.

• Journal of the Korean Society for Nondestructive Testing
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• v.19 no.6
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• pp.426-432
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• 1999

A plus-point eddy current test(ECT) probe was developed to examine the defects on the welds of pumps, valves, and pipings which are the major components of the electric power plants, non-destructive evaluation (NDE) techniques for detecting and sizing the flaws were studied adapting this probe. Differential plus-point ECT probe is consists of two "I"-type coils crossed each other and has an advantage having a small influence on the sensitivity by lift-off variation to the conventional types of probe. The specimens with crack-like electro discharge machining(EDM) notches on the weld of type 304 stainless-steel were fabricated in order to evaluate the plus-point ECT probe response to the flaws. NDE techniques to detect and size the flaws and estimate the flaw type were established with this specimens.

• Proceedings of the KIEE Conference
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• 2003.07c
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• pp.1719-1721
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• 2003

In this paper, electrical characteristics of inductively coupled plasma in an electrodeless fluorescent lamp were investigated using a Langmuir probe with a variation of Ar gas pressure. The RF output was applied in the range of 5-50W at 13.56MHz. The internal plasma voltage of the chamber and the probe current were measured while varying the supply voltage to the Langmuir probe in the range of -100V ${\sim}$ +100V. When the pressure of Ar gas was increased, electric current was decreased. There was a significant electric current increase when the applied RF power was increased from 10 W to 30 W. This implies that this method can be used to find an optimal RF power for efficient light illumination in an electrodeless fluorescent lamp.

• Journal of Sensor Science and Technology
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• v.30 no.5
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• pp.342-348
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• 2021

For the characterization or failure analysis of electronic devices such as PCB (printed circuit boards), the most common method is the measurement of voltage waveforms with an oscilloscope. However, because there are many types of problems that cannot be detected by voltage waveform analysis, several other methods such as X-ray transmission, infrared imaging, or eddy current measurement have been applied for these analyses. However, these methods have also been limited to general analyses because they are partially useful in detecting physical defects, such as disconnections or short circuits. Fundamentally current waveform measurements during the operation of electronic devices need to be performed, however, commercially available current sensors have not yet been developed, particularly for applications in highly integrated PCB products with sub-millimeter fine pitch. In this study, we developed a highly sensitive PHR (planar hall resistance) magnetic sensor for application in highly integrated PCBs. The developed magnetic sensor exhibited sufficient features of an ultra-small size of less than 340 ㎛, magnetic field resolution of 10 nT, and current resolution of 1 mA, which can be applicable for PCB analyses. In this work, we introduce the development process of the magnetic sensing probe and its characteristic results in detail, and aim to extend this pin-type current probe to applications such as current distribution imaging of PCBs.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2008.11a
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• pp.593-594
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• 2008

• 한국정보통신설비학회:학술대회논문집
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• 2009.08a
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• pp.54-58
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• 2009

In this paper, the ECT(eddy current testing) signal analysis of eddy current array probe for inspection of SG(steam generator) tube in NPP(nuclear power plant) using electromagnetic FEM(finite element method) was performed. To obtain the electromagnetic characteristics of probes, the governing equation was derived from Maxwell's equation, and the problem was solved by using the 3-dimensional FEM. The types of defects were FBH(flat bottomed hole) and OD groove, Spiral groove, natural defects(pitting, SCC, multiple SCC, wear). The depth of FBH defects were 20%, 40%, 60%, 80%, 100 of SG tube thickness, and it was assumed that the defects were located on the tube outside. And the operation frequency of 100kHz, 300kHz and 400kHz were used. Material of specimen was Inconel 600 which is usually used for SG tubes in NPP. The signal difference could be observed according to the variation of size and depth on FBH defects and operation frequencies. The results in this paper can be helpful when the ECT signals from EC array probe are evaluated and analyzed.

• Progress in Superconductivity
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• v.8 no.2
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• pp.169-174
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• 2007

We measured the field profiles, H(x)'s of coated conductors by using scanning Hall probe method when various magnetic fields, $H{_\alpha}'s$ or currents, I's were applied. From the measured field profiles, we calculated the current profiles, J(x)'s by the inversion method. The calculated J(x)'s of coated conductors show some different properties from the standard critical state model. $J{_c}'s$ are inhomogeneous varying with the positions and are not constant when $H_{\alpha}$ or I changes. And when I decreases the features of current reversion are remarkably different from the model.

• Tribology and Lubricants
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• v.38 no.6
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• pp.274-280
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• 2022

There is a problem that semiconductor probe pin has a short lifespan. In order to solve this problem, Ti having excellent conductivity was doped to tetrahedral amorphous carbon (ta-C) having excellent hardness and abrasion resistance. This experiment was planned through the Taguchi robust design to determine the effect of the control factor of the ta-C:Ti coating film. The effect and contribution of control factors such as Unbalanced Magnetron Sputter(UBM) discharge current, arc discharge current, temperature, and bias voltage on ta-C:Ti characteristics were analyzed from the perspective of electrical and mechanical characteristics. The UBM discharge current was set to 4, 6, and 8 A. The main control factor of thickness and resistance is the UBM discharge current, and the thickness increased and the resistance decreased as the current increased. The decrease in resistance is due to the increase in the Ti content of the ta-C:Ti coating film. The arc discharge current was set to 60, 80, and 100 A. The main control factor of hardness and wear is the arc discharge current, and as the current rises, the hardness increases and the wear area decreases. This is due to the increased ta-C content of the ta-C:Ti coating film. Since resistance and wear are important for Probe Pin, the optimal level is set from the perspective of resistance and wear and a confirmation experiment is conducted.

• Progress in Superconductivity and Cryogenics
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• v.19 no.1
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• pp.26-29
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• 2017

We studied the distribution of the current density and its magnetic-field dependence in GdBCO coated conductors with AC bias currents using low temperature scanning Hall probe microscopy. We selectively measured magnetic field profiles from AC signal obtained by Lock-in technique and calculated current distributions by inversion calculation. In order to confirm the AC measurement results, we applied DC current corresponding to RMS value of AC current and compared distribution of AC and DC transport current. We carried out the same measurements at various external DC magnetic fields, and investigated field dependence of AC current distribution. We notice that the AC current distribution unaffected by external magnetic fields and preserved their own path on the contrary to DC current.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2006.10a
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• pp.83-84
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• 2006