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http://dx.doi.org/10.46670/JSST.2021.30.5.342

A pin type current probe using Planar Hall Resistance magnetic sensor  

Lee, Dae-Sung (Smart Sensor Research Center, Korea Electronics Technology Institute)
Lee, Nam-Young (DNJTECH)
Hong, Sung-Min (Smart Sensor Research Center, Korea Electronics Technology Institute)
Kim, CheolGi (Department of Emerging Materials Science)
Publication Information
Journal of Sensor Science and Technology / v.30, no.5, 2021 , pp. 342-348 More about this Journal
Abstract
For the characterization or failure analysis of electronic devices such as PCB (printed circuit boards), the most common method is the measurement of voltage waveforms with an oscilloscope. However, because there are many types of problems that cannot be detected by voltage waveform analysis, several other methods such as X-ray transmission, infrared imaging, or eddy current measurement have been applied for these analyses. However, these methods have also been limited to general analyses because they are partially useful in detecting physical defects, such as disconnections or short circuits. Fundamentally current waveform measurements during the operation of electronic devices need to be performed, however, commercially available current sensors have not yet been developed, particularly for applications in highly integrated PCB products with sub-millimeter fine pitch. In this study, we developed a highly sensitive PHR (planar hall resistance) magnetic sensor for application in highly integrated PCBs. The developed magnetic sensor exhibited sufficient features of an ultra-small size of less than 340 ㎛, magnetic field resolution of 10 nT, and current resolution of 1 mA, which can be applicable for PCB analyses. In this work, we introduce the development process of the magnetic sensing probe and its characteristic results in detail, and aim to extend this pin-type current probe to applications such as current distribution imaging of PCBs.
Keywords
Magnetic sensor; Current sensor; Pin type current probe; PHR(planar hall resistance); High sensitivity; Current distribution imaging;
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