• Title/Summary/Keyword: Photolithography Processes

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A Study on Micro-Tip Fabrication by Plating and CMP (도금 및 CMP에 의한 Micro-Tip 제작 공정 연구)

  • Han, Myung-Soo;Park, Chang-Mo;Shin, Gwang-Soo;Ko, Hang-Ju;Kim, Doo-Gun;Hann, S-Wook;Kim, Seon-Hoon;Ki, Hyun-Chul;Kim, Hyo-Jin;Kim, Jang-Hyun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.06a
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    • pp.152-152
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    • 2009
  • We investigate micro-tip properties as Ni-Co plating and CMP processes for MEMS probe card and units. The micro-tip are fabricated by using Ni-Co plating machine, lapping machine, and chemo-mechanical polisher. In order to get high conductive and reliable micro-tip, we control Co contents and thickness by CMP speed. We have found that about 20-25% of Co contents are required and have to lapping speed of 30 rpm. Also, we investigate photolithography and Ni-Co plating processes conditions for the one-step and the three-step micro-tips.

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Investigation into direct fabrication of nano-patterns using nano-stereolithography (NSL) process (나노 스테레오리소그래피 공정을 이용한 무(無)마스크 나노 패턴제작에 관한 연구)

  • Park Sang Hu;Lim Tae-Woo;Yang Dong-Yol
    • Journal of the Korean Society for Precision Engineering
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    • v.23 no.3 s.180
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    • pp.156-162
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    • 2006
  • Direct fabrication of nano patterns has been studied employing a nano-stereolithography (NSL) process. The needs of nano patterning techniques have been intensively increased for diverse applications for nano/micro-devices; micro-fluidic channels, micro-molds. and other novel micro-objects. For fabrication of high-aspect-ratio (HAR) patterns, a thick spin coating of SU-8 process is generally used in the conventional photolithography, however, additional processes such as pre- and post-baking processes and expansive precise photomasks are inevitably required. In this work, direct fabrication of HAR patterns with a high spatial resolution is tried employing two-photon polymerization in the NSL process. The precision and aspect ratio of patterns can be controlled using process parameters of laser power, exposure time, and numerical aperture of objective lens. It is also feasible to control the aspect ratio of patterns by truncation amounts of patterns, and a layer-by-layer piling up technique is attempted to achieve HAR patterns. Through the fabrication of several patterns using the NSL process, the possibility of effective patterning technique fer various N/MEMS applications has been demonstrated.

Review of Hazardous Agent Level in Wafer Fabrication Operation Focusing on Exposure to Chemicals and Radiation (반도체 산업의 웨이퍼 가공 공정 유해인자 고찰과 활용 - 화학물질과 방사선 노출을 중심으로 -)

  • Park, Donguk
    • Journal of Korean Society of Occupational and Environmental Hygiene
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    • v.26 no.1
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    • pp.1-10
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    • 2016
  • Objectives: The aim of this study is to review the results of exposure to chemicals and to extremely low frequency(ELF) magnetic fields generated in wafer fabrication operations in the semiconductor industry. Methods: Exposure assessment studies of silicon wafer fab operations in the semiconductor industry were collected through an extensive literature review of articles reported until the end of 2015. The key words used in the literature search were "semiconductor industry", "wafer fab", "silicon wafer", and "clean room," both singly and in combination. Literature reporting on airborne chemicals and extremely low frequency(ELF) magnetic fields were collected and reviewed. Results and Conclusions: Major airborne hazardous agents assessed were several organic solvents and ethylene glycol ethers from Photolithography, arsenic from ion implantation and extremely low frequency magnetic fields from the overall fabrication processes. Most exposures to chemicals reported were found to be far below permissible exposure limits(PEL) (10% < PEL). Most of these results were from operators who handled processes in a well-controlled environment. In conclusion, we found a lack of results on exposure to hazardous agents, including chemicals and radiation, which are insufficient for use in the estimation of past exposure. The results we reviewed should be applied with great caution to associate chronic health effects.

Fabrication of Si Inverted Pyramid Structures by Cu-Assisted Chemical Etching for Solar Cell Application (결정질 실리콘 태양전지의 효율개선을 위한 실리콘 역 피라미드 구조체 최적화)

  • Park, Jin Hyeong;Nam, Yoon-Ho;Yoo, Bongyoung;Lee, Jung-Ho
    • Journal of the Korean institute of surface engineering
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    • v.50 no.5
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    • pp.315-321
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    • 2017
  • Antireflective pyramid arrays can be readily obtained via anisotropic etching in alkaline solution (KOH, NaOH), which is widely used in crystalline-Si (c-Si) solar cells. The periodic inverted pyramid arrays show even lower light reflectivity because of their superior light-trapping characteristics. Since this inverted pyramidal structures are mostly achieved using very complex techniques such as photolithograpy and laser processes requiring extra costs, here, we demonstrate the Cu-nanoparticle assisted chemical etching processes to make the inverted pyramidal arrays without the need of photolithography. We have mainly controlled the concentration of $Cu(NO_3)_2$, HF, $H_2O_2$ and temperature as well as time factors that affecting the reaction. Optimal inverted pyramid structure was obtained through reaction parameters control. The reflectance of inverted pyramid arrays showed < 10% over 400 to 1100 nm wavelength range while showing 15~20% in random pyramid arrays.

Research Trends of Scheduling Techniques for Domestic Major Industries (국내 주요 산업별 스케줄링 기법의 연구동향)

  • Lee, Jae-yong;Shin, Moonsoo
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.41 no.1
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    • pp.59-69
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    • 2018
  • The up-to-date business environment for Korean manufacturers is very complex and rapidly changing. Especially, the companies have faced with various changes derived from small quantity batch production, diversification of customer demands, and short life cycles of products. Consequently, the Korean manufacturing companies are in need of more efficient production planning and scheduling techniques. In this paper, the research trend of scheduling techniques is investigated to provide relevant information to researchers in this field. Furthermore, some implications for future researches are presented regarding literatures published in Korea over the last 10 years. This paper presents an entire investigation into Korean research works on scheduling (2,569 papers) that are published from 2007 to 2016. Especially, detailed analysis was carried out in the following three industry : 1) semiconductor, 2) shipbuilding and 3) automobile. In this paper, approaches to scheduling presented in the literature are categorized into the following three categories : 1) application, 2) algorithm, and 3) simulation modeling. First, in the semiconductor industry, scheduling techniques related to semiconductor cleaning processes, photolithography processes, chemical processes, transport and transport equipment have been found to be dominant. Second, the shipbuilding industry is focused on assembly processes, transporter, crane and various existing production management system. On the other hand, the scheduling research of the automobile industry is mainly focused on the vehicle movement routing and procurement supply-chain planning algorithm in terms of logistics. The conclusion of this study are expected to provide many implications for various types of academic and practical follow-up studies related to scheduling in consideration of main characteristics of semiconductor, shipbuilding and automobile industries.

BST Thin Film Multi-Layer Capacitors

  • Choi, Woo Sung;Kang, Min-Gyu;Ju, Byeong-Kwon;Yoon, Seok-Jin;Kang, Chong-Yun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.319-319
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    • 2013
  • Even though the fabrication methods of metal oxide based thin film capacitor have been well established such as RF sputtering, Sol-gel, metal organic chemical vapor deposition (MOCVD), ion beam assisted deposition (IBAD) and pulsed laser deposition (PLD), an applicable capacitor of printed circuit board (PCB) has not realized yet by these methods. Barium Strontium Titanate (BST) and other high-k ceramic oxides are important materials used in integrated passive devices, multi-chip modules (MCM), high-density interconnect, and chip-scale packaging. Thin film multi-layer technology is strongly demanded for having high capacitance (120 nF/$mm^2$). In this study, we suggest novel multi-layer thin film capacitor design and fabrication technology utilized by plasma assisted deposition and photolithography processes. Ba0.6Sr0.4TiO3 (BST) was used for the dielectric material since it has high dielectric constant and low dielectric loss. 5-layered BST and Pt thin films with multi-layer sandwich structures were formed on Pt/Ti/$SiO_2$/Si substrate by RF-magnetron sputtering and DC-sputtering. Pt electrodes and BST layers were patterned to reveal internal electrodes by photolithography. SiO2 passivation layer was deposited by plasma-enhanced chemical vapor deposition (PE-CVD). The passivation layer plays an important role to prevent short connection between the electrodes. It was patterned to create holes for the connection between internal electrodes and external electrodes by reactive-ion etching (RIE). External contact pads were formed by Pt electrodes. The microstructure and dielectric characteristics of the capacitors were investigated by scanning electron microscopy (SEM) and impedance analyzer, respectively. In conclusion, the 0402 sized thin film multi-layer capacitors have been demonstrated, which have capacitance of 10 nF. They are expected to be used for decoupling purpose and have been fabricated with high yield.

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Development of Micro Milling EDM and Analysis of Machined Characteristics (마이크로 밀링 EDM 머신 개발 및 가공특성 분석)

  • Kim, Sun-Ho;Lim, Han-Seok
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.10 no.1
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    • pp.1-7
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    • 2011
  • Micromachining is gaining popularity due to recent advancements in MEMS(Micro Electro Mechanical Systems). Using conventional micromachining, it is relatively difficult to produce moving components in the order of microns. Photolithography for silicon material has high accuracy machining, but it has low aspect ratio. X-ray lithography has ultra high accuracy machining, but it has expensive cost. Micro-EDM(electro discharge machining) has been gaining popularity as a new alternative method to fabricate micro-structures. In this study, Micro-EDM machine is developed available for fabricate micro-structures and two processes such as side cut EDM and milling EDM is proposed. Several sets of experiment results have been performed to study the characteristics of the machining process.

Manufacturing Mechanism of FIB-CVD using Focused Ion Beam (집속이온빔의 가공 공정 메카니즘 연구)

  • 강은구;최병열;이석우;홍원표;최헌종
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2004.10a
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    • pp.925-928
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    • 2004
  • The application of focused ion beam (FIB) technology in micro/nano machining has become increasingly popular. Its use in micro/nano machining has advantages over contemporary photolithography or other micro/nano machining technologies such as small feature resolution, the ability to process without masks and being accommodating for a variety of materials and geometries. This paper was carried out some experiments and verifications of mechanism on FIB-CVD using SMI8800 made by Seiko. FIB-CVD has in fact proved to be commercially useful for repair processes because the beam can be focused down to 0.05$\mu\textrm{m}$ dimensions and below and because the same tool can be used to sputter off material with sub-micrometer precision simply by turning off the gas ambient. Recently the chemical vapour deposition induced ion beam has been required more deposition rate and accurate pattern because of trying to manufacture many micro and nano parts. Therefore this paper suggested the optimization parameters and discussed some mechanism of chemical vapour deposition induced ion beam on FIB-CVD for simple pattern.

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Transparent ZnO Transistor Array by Means of Plasma Enhanced Atomic Layer Deposition

  • Kopark, Sang-Hee;Hwang, Chi-Sun;Kwack, Ho-Sang;Lee, Jung-Ik;Chu, Hye-Yong
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.601-604
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    • 2006
  • We have developed ZnO TFT array using conventional photolithography and wet etching processes. Transparent 20 nm of ultra thin ZnO film deposited by means of plasma enhanced atomic layer deposition at $100^{\circ}C$ was used for the active channel. The ZnO TFT has a mobility of $0.59cm^2/V.s$, a threshold voltage of 7.2V, sub-threshold swing of 0.64V/dec., and an on/off ratio of $10^8$.

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Plating Process of Micro-needle for MEMS Probe Card (MEMS Probe Card용 Micro Needle 공정 연구)

  • Han, Myung-Soo;Ahn, Su-Chang;Nam, An-Sik;Kim, Jang-Hyun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.152-152
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    • 2008
  • Micro probe with Ni-Co tip was designed. Unit processes for fabricating the micro probe were developed. We are investigated the micro probe tip using by Ni-Co alloy. One-step and three-step needle was fabricated by plating process, CMP, and photolithography process. The plating thickness was varied by current density and time. Futher data will be extract by different process conditions.

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