• Title/Summary/Keyword: Photo C-V

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Sorting Instagram Hashtags all the Way throw Mass Tagging using HITS Algorithm

  • D.Vishnu Vardhan;Dr.CH.Aparna
    • International Journal of Computer Science & Network Security
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    • v.23 no.11
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    • pp.93-98
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    • 2023
  • Instagram is one of the fastest-growing online photo social web services where users share their life images and videos with other users. Image tagging is an essential step for developing Automatic Image Annotation (AIA) methods that are based on the learning by example paradigm. Hashtags can be used on just about any social media platform, but they're most popular on Twitter and Instagram. Using hashtags is essentially a way to group together conversations or content around a certain topic, making it easy for people to find content that interests them. Practically on average, 20% of the Instagram hashtags are related to the actual visual content of the image they accompany, i.e., they are descriptive hashtags, while there are many irrelevant hashtags, i.e., stophashtags, that are used across totally different images just for gathering clicks and for search ability enhancement. Hence in this work, Sorting instagram hashtags all the way through mass tagging using HITS (Hyperlink-Induced Topic Search) algorithm is presented. The hashtags can sorted to several groups according to Jensen-Shannon divergence between any two hashtags. This approach provides an effective and consistent way for finding pairs of Instagram images and hashtags, which lead to representative and noise-free training sets for content-based image retrieval. The HITS algorithm is first used to rank the annotators in terms of their effectiveness in the crowd tagging task and then to identify the right hashtags per image.

The study of ${\mu}c-Si/CaF_2$/glass properties for thin film transistor application (박막트랜지스터 응용을 위한 ${\mu}c-Si/CaF_2$/glass 구조특성연구)

  • Kim, Do-Young;Ahn, Byeung-Jae;Lim, Dong-Gun;Yi, Jun-Sin
    • Proceedings of the KIEE Conference
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    • 1999.07d
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    • pp.1514-1516
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    • 1999
  • This paper covers our efforts to improve the low carrier mobility and light instability of hydrogenated amorphous silicon (a-Si:H) films with microcrystalline silicon $({\mu}c-Si)$ films. We successfully prepared ${\mu}c-Si$ films on $CaF_2$/glass substrate by decomposition of $SiH_4$ in RPCVD system. The $CaF_2$ films on glass served as a seed layer for ${\mu}c-Si$ film growth. The XRD analysis on $CaF_2$/glass illustrated a (111) preferred $CaF_2$ grains with the lattice mismatch less than 5 % of Si. We achieved ${\mu}c-Si$ films with a crystalline volume fraction of 61 %, (111) and (220) crystal orientations. grain size of $706\AA$, activation energy of 0.49 eV, and Photo/dark conductivity ratio of 124. By using a $CaF_2$/glass structure. we were able to achieve an improved ${\mu}c-Si$ films at a low substrate temperature of $300^{\circ}C$.

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A Study on the PD Measurement System for Estimating Reliabilities of Low-voltage Electrical and Electronic Components (저압용 전기전자부품의 신뢰성 평가를 위한 부분방전 측정시스템에 관한 연구)

  • Seo, Hwang-Dong;Snog, Jae-Yong;Moon, Seung-Bo;Kil, Gyung-Suk;Kang, Dong-Sik;Hwang, Don-Ha
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.11a
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    • pp.321-322
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    • 2005
  • In this paper, we dealt with a partial discharge(PD) measurement system that has been accepted as an effective and non-destructive technique for estimating reliabilities of low-voltage electrical and electronic components. Calibration tests on laboratory set-up have shown that the PD measurement system has a stable sensitivity of 37.6 mv/pC. In an application test on photo coupler, we could detect 0.1 pC level of partial discharge at the applied voltage of AC 520 $V_{peak}$.

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Characteristics of fluoride/glass as a seed layer for microcrystalline silicon film growth

  • Choi, Seok-Won;Kim, Do-Young;Ahn, Byeong-Jae;Yi, Jun-Sin
    • 한국정보디스플레이학회:학술대회논문집
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    • 2000.01a
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    • pp.65-66
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    • 2000
  • Various fluoride films on a glass substrate were prepared and characterized to provide a seed layer for crystalline Si film growth. The XRD analysis on $CaF_2/glass$ illustrated (220) preferential orientation and showed lattice mismatch less than 5 % with Si. We achieved a fluoride film with breakdown electric field of 1.27 MV/cm, leakage current density about $10^{-6}$ $A/cm^2$, and relative dielectric constant less than 5.6. This paper demonstrates microcrystalline silicon $({\mu}c-Si)$ film growth by using a $CaF_2/glass$ substrate. The ${\mu}c-Si$ films exhibited crystallization in (111) and (220) planes, grain size of $700\;{\AA}$, crystalline volume fraction over 65 %, dark- and photo-conductivity ratio of 124, activation energy of 0.49 eV, and dark conductivity less than $4{\times}10^{-7}$ S/cm.

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The Photo-reproducibility and Stability of Long Chain Fatty Acid Containing Azobenzene (아조벤젠을 함유한 장쇄 지방산의 광재현성과 안정성에 관한 연구)

  • Par, Keun-Ho;Park, Tae-Gone
    • Journal of the Korean Applied Science and Technology
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    • v.12 no.1
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    • pp.109-114
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    • 1995
  • The Synthesis of long chain fatty acid containing azobenzene and $(C_{n}-Azo)$ was optimized, starting from p-(p'-hydroxy phenyl azo)-benzoic acid and the product of reaction containing azobenzene chromophores was investigated by ultraviolet spectrophotometery in chloroform solvent at the various temperature. In addition, Reversibility and stability of azo compounds have been measured by means of Ultraviolet and the structure of these compound were ascertained by means of FT-IR and NMR. Recrystallization of reaction product in the solvent results the experimental yield obtained about 62.93% p-(p'-octadecyloxy phenyl azo)-benzoic acid. Long chain azobenzene derivatives in chloroform solution are induced photoisomerization by u. v. and visible light irradiation. The solution of long chain fatty acids$(C_{n}-Azo)$ containing azobenzene are possible of being applied to functional molecular devices such as photomemory and light switching.

Photo and Electrical Properties of SiNx for Nano Floating Gate Memory (나노 부유 게이트 메모리 소자 응용을 위한 SiNx의 광 특성 및 전기적 특성에 대한 연구)

  • Jung, Sung-Wook;Hwang, Sung-Hyun;Yi, Jun-Sin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.06a
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    • pp.130-131
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    • 2006
  • 차세대 반도체 정보기억장치로서 활발하게 연구되고 있는 나노 부유 게이트 메모리 (Nano Floating Gate Memory) 소자를 위해 필수적인 요소인 나노 크리스탈의 형성을 위하여 다양한 굴절률을 가진 실리콘 질화막 (SiNx)을 형성하고 고온 열처리 (rapid thermal annealing)를 실시하여 나노 크리스탈의 형성과 특성에 대한 연구를 진행하였다. 다양한 굴절률을 가진 실리콘 질화막을 형성한 후 나노 크리스탈의 형성을 위하여 열처리를 수행하였고, photoluminescence (PL)를 통하여 굴절률이 높은 Si-rich SiNx 박막의 고온 열처리를 수행한 실리콘 질화막으로부터 나노 크리스탈의 형성을 확인할 수 있었다. 또한 열처리한 실리콘 질화막 위에 Al을 증착하여 MIS 구조를 형성한 후 Capacitance-Voltage (C-V) 특성을 측정하였으며, $900^{\circ}C$에서 열처리한 박막에서 나노 크리스탈에 의한 메모리 효과를 확인할 수 있었다.

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Effect of Deposition Temperature on Structural Properties of ZnO Thin Films on 4H-SiC Substrate (4H-SiC 기판 위에 성장된 ZnO 박막의 온도에 따른 구조적 특성 분석)

  • Kim, Ji-Hong;Cho, Dae-Hyung;Moon, Byung-Moo;Bahng, Wook;Kim, Sang-Cheol;Kim, Nam-Kyun;Koo, Sang-Mo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.120-120
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    • 2008
  • We demonstrate epitaxial growth of ZnO thin films on 4H-SiC(0001) substrates using pulsed laser deposition (PLD). ZnO and SiC have attracted attention for their special material properties as wide band gap semiconductors. Especially, ZnO could be applied to optoelectronic applications such as light emitting devices and photo detectors due to its direct wide bandgap (Eg) of ~3.37eV and large exciton binding energy of ~60meV. SiC shows a good lattice matching to ZnO compared with other commonly used substrates and in this regard SiC is a good candidate as a substrate for ZnO. In this work, ZnO thin films were grown on 4H-SiC(0001) substrates by PLD using an Nd:YAG laser with a 355nm wavelength. The crystalline properties of the films were evaluated by x-ray diffraction (XRD) $\theta-2\theta$, rocking curve and pole figure measurements using a high-resolution diffractometer. The surface morphology of the films was studied by atomic force microscopy (AFM).

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Top gate ZnO-TFT driving AM-OLED fabricated on a plastic substrate

  • Hwang, Chi-Sun;Kopark, Sang-Hee;Byun, Chun-Won;Ryu, Min-Ki;Yang, Shin-Hyuk;Lee, Jeong-Ik;Chung, Sung-Mook;Kim, Gi-Heon;Kang, Seung-Youl;Chu, Hye-Yong
    • 한국정보디스플레이학회:학술대회논문집
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    • 2008.10a
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    • pp.1466-1469
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    • 2008
  • We have fabricated 2.5 inch QQCIF AM-OLED panel driven by ZnO-TFT on a plastic substrate for the first time. The number of photo mask for the whole panel process was 5 and the TFT structure was top gate with active protection layer as a first gate insulator. Optimizing the process for the substrate buffer layer, active layer, ZnO protection layer, and gate insulator was key factor to achieve the TFT performance enough to drive OLED. The ZnO TFT has mobility of $5.4\;cm^2/V.s$, turn on voltage of -6.8 V, sub-threshold swing of 0.39 V/decade, and on/off ratio of $1.7{\times}10^9$. Although whole process temperature is below $150^{\circ}C$ to be suitable for the plastic substrate, performance of ZnO TFT was comparable to that fabricated at higher temperature on the glass.

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Simple fabrication process and characteristic of a screen-printed triode-CNT field emission arrays for the flat lamp application

  • Jung, Y.J.;Park, J.H.;Jeon, S.Y.;Park, S.J.;Alegaonkar, P.S.;Yoo, J.B.;Park, C.Y.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.1214-1218
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    • 2006
  • We introduced simple fabrication process for field emission devices based on carbon nanotubes (CNTs) emitters. Instead of using the ITO material as a transparent electrode, a metal (Au) with thickness of 5-20nm was used. Moreover, the ITO patterning process was eliminated by depositing metal layer, before the CNT printing process. In addition, the thin metal layer on photo resist (PR) layer was used as UV block. We fabricated the CNT field emission arrays of triode structure with simple process. And I-V characteristics of field emission arrays were measured. The maximum current density of $254{\mu}A/cm2$ was achieved when the gate and the anode voltage was kept 150V and 3000V, respectively. The distance between anode and cathode was kept constant.

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Study of passivation layers for the indium antimonide photodetector

  • Lee, Jae-Yeol;Kim, Jeong-Seop;Yang, Chang-Jae;Yun, Ui-Jun
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2009.05a
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    • pp.28.2-28.2
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    • 2009
  • 군사적, 산업적 용도로 널리 활용되고 있는 적외선 검출기는 InSb, HgCdTe(MCT)와 같은 물질들을 감지 소자로 사용하고 있다. 현재 가장 많이 사용되는 MCT는 적외선의 전 영역을 감지할 수 있는 장점이 있지만, 대면적 제작이 어려운 단점이 있다. 이에 비해 InSb는 안정적인 재료의 특성, 높은 전하이동도($1.2\times10^6\;cm^2/Vs$) 그리고 대면적 소자 제작의 가능성 등이 높게 평가되어 차세대 적외선 검출소자로 각광 받고 있다. InSb 적외선 수광 소자는 1970년대부터 미국을 중심으로 이온주입, MOCVD 또는 MBE와 같은 다양한 공정을 이용하여 제작되어 왔으며, 앞으로도 군수용 제품을 비롯하여 산업전반에서 더욱 각광을 받을 것으로 예상된다. 하지만 InSb는 77 K에서 0.225 eV의 상대적으로 작은 밴드갭을 갖고 있기 때문에 누설전류로 인한 성능저하가 고질적인 문제로 대두되었고, 이를 해결하기 위한 고품질 절연막 연구가 InSb 적외선 수광 소자 연구의 주요 이슈 중 하나가 되어왔다. PECVD, photo-CVD, anodic oxidation 등의 공정을 이용하여 $SiO_2$, $Si_3N_4$, 양극산화막(anodic oxide) 등 다양한 물질들에 대한 연구가 진행되었고[1,2], 산화막과 반도체 계면에서의 열확산을 억제하여 계면트랩밀도를 최소화하기 위한 연구도 활발히 이루어졌다[3]. 하지만 InSb 소자의 성능개선을 위한 최적화된 산화막에 대한 연구는 여전히 불충분한 실정이다. 본 연구에서는 n형 (100) InSb 기판 (n = 0.2 ~ $0.85\times10^{15}cm^{-3}$ @ 77 K)을 이용하여 양극산화막, $SiO_2$, $Si_3N_4$ 등을 증착하고 절연막으로서 이들의 특성을 비교 분석하였다. 양극산화막은 상온에서 1 N KOH 용액을 이용하여 양극산화법으로 증착하였으며, $SiO_2$, $Si_3N_4$는 PECVD로 $150^{\circ}C$에서 $300^{\circ}C$까지 온도를 변화시켜가며 증착하였다. SEM분석과 XPS분석으로 두께의 균일도와 절연막의 조성, 계면확산 정도를 확인하였으며, I-V와 C-V 커브측정을 통해 각 절연막의 전기적 특성을 평가하였다. 이 분석들을 통해 각각의 공정 조건에 따른 절연막의 상태를 전기적 특성과 관련지어 설명할 수 있었다.

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