• 제목/요약/키워드: Phosphorus doped

검색결과 89건 처리시간 0.03초

Binary Doping of N-B and N-P into Graphene and Graphene Nanoribbons: Structural, Electronic, and Transport properties

  • Kim, Hyo Seok;Kim, Han Seul;Kim, Seong Sik;Kim, Yong Hoon
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
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    • pp.647-647
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    • 2013
  • We apply a density functional theory (DFT) and DFT-based non-equilibrium Green's function approach to study the structures, energetics and charge transport characteristics of nitrogen-doped graphene and graphene nanoribbons (GNRs) with additional doping of phosphorus or boron atoms. Considering graphitic, pyridinic, and porphrin-like N doping sites and increasing N-doping concentration, we analyze the structures of N-P and N-B doped graphene and particularly focus on how they affect the charge transport along the lateral direction. For the GNRs, we also consider the differences between defects formed at the edge and bulk regions. Implications of our findings in the context of electronic and energy device applications will be also discussed.

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Coulomb Interaction Induced Gap in an Al/SiO2/Si:P tunnelling Device

  • Jo, Yongcheol;Kim, Jongmin;Cho, Sangeun;Kim, Hyungsang;Im, Hyunsik
    • Applied Science and Convergence Technology
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    • 제26권3호
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    • pp.50-51
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    • 2017
  • Strongly correlated electron systems which induce strong electron-electron interaction at ultra-low temperatures have always been an intriguing topic in mesoscopic condensed matter physics. Below 130 mK, a peculiar gap can be found in Al/$SiO_2$/Si:P structured tunnelling devices. The gap survives at the base temperature of more than 1800 gauss (30 mK), contrary to the superconductivity of the top Al electrode, which is completely suppressed above 100 gauss. This outcome implies that the observed gap is induced by Coulomb interaction in the heavily doped Si.

The Study of Transmission Spectrum of Twisted Nematic Liquid Crystal Doped with Phosphorus Micro Particles Apply for Vehicle Lamp

  • Minh-Tran, Anh
    • International Journal of Internet, Broadcasting and Communication
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    • 제15권1호
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    • pp.145-149
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    • 2023
  • In this study, the spectrum changes induced from the doping of phosphor micro particles in a twist nematic liquid crystal cell was observed. The experimental results show that the achromatic transmission can be observed with a proper driving condition, which may be applied to the design of an achromatic liquid crystal device. In this paper, we tried to figure out the spectrum changes induced from the doping of phosphor micro particles. The experimental result of the phosphor powder doped twist nematic liquid crystal cell shows that the achromatic transmission and the wavelength linearly dependent transmission both can be observed with some proper driving conditions, respectively. The result is useful on developing an achromatic liquid crystal device and it can be applied for Vihicle lamp.

대기압 플라즈마의 선택적 도핑 공정에서 온도에 의한 인(Phosphorus)의 확산연구 (Study of the Diffusion of Phosphorus Dependent on Temperatures for Selective Emitter Doping Process of Atmospheric Pressure Plasma)

  • 김상훈;윤명수;박종인;구제환;김인태;최은하;조광섭;권기청
    • 한국표면공학회지
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    • 제47권5호
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    • pp.227-232
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    • 2014
  • In this study, we propose the application of doping process technology for atmospheric pressure plasma. The plasma treatment means the wafer is warmed via resistance heating from current paths. These paths are induced by the surface charge density in the presence of illuminating Argon atmospheric plasmas. Furthermore, it is investigated on the high-concentration doping to a selective partial region in P type solar cell wafer. It is identified that diffusion of impurities is related to the wafer temperature. For the fixed plasma treatment time, plasma currents were set with 40, 70, 120 mA. For the processing time, IR(Infra-Red) images are analyzed via a camera dependent on the temperature of the P type wafer. Phosphorus concentrations are also analyzed through SIMS profiles from doped wafer. According to the analysis for doping process, as applied plasma currents increase, so the doping depth becomes deeper. As the junction depth is deeper, so the surface resistance is to be lowered. In addition, the surface charge density has a tendency inversely proportional to the initial phosphorus concentration. Overall, when the plasma current increases, then it becomes higher temperatures in wafer. It is shown that the diffusion of the impurity is critically dependent on the temperature of wafers.

선택적 에미터 결정질 실리콘 태양전지 제작을 위한 할로겐 램프 장치 개발 (Equipment Manufacturing of Lamp Heating to Fabricate Selective Emitter Silicon Solar Cell)

  • 한규민;최성진;이희덕;송희은
    • 한국태양에너지학회 논문집
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    • 제32권5호
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    • pp.102-107
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    • 2012
  • Halogen lamp was applied to fabricate the selective emitter crystalline silicon solar cell. In selective emitter structure, the recombination of minority carriers is reduced with heavily doped emitter under metal grid, consequently improving the conversion efficiency. Laser selective emitter process which is recently used the most generally induces the damage on the silicon surface. However the lamp has enough heat to form heavily doped emitter layer by diffusing phosphorus from PSG without surface damage. In this work, we have studied to find the design and the suitable condition for halogen lamp such as power, time, temperature and figured out the possibility to fabricate the selective emitter silicon solar cell by lamp heating. The sheet resistance with $100{\Omega}/{\Box}$ was lower to $50{\Omega}/{\Box}$ after halogen lamp treatment. Heat transfer to lightly doped emitter region was blocked by using the shadow mask.

이온 도핑 방법에 의한 실리콘 박막의 도핑 연구 (A Study on Ion Shower Doping in Si Thin Film)

  • 유순성;전정목;이경하;문병연;장진
    • 전자공학회논문지A
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    • 제31A권5호
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    • pp.106-112
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    • 1994
  • We have developed a large area ion shower doping system with an RF plasma ion source. The ion current density (i.e., doping concentration) increases with RF power and acceleration voltage. Using this technique, we investigated the optimum condition for ion doping of phosphorus in a-Si:H and poly-Si films. The optimum acceleration voltage and doping time are 6KV and 90sec, respectively, in a-Si:H films. Under this condition the electrical conductivity of ion-doped a-Si:H film is obtained ~10$^{-3}$/cm at room temperature. The sheet resistance decreases witnh acceleration voltage in ion-doped poly-Si, and a heavily-doped layer with a sheet resistance of 920$\Omega$/ㅁ is obtained by using ion doping and subsequent activation.

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Fabrication of excimer laser annealed poly-si thin film transistor by using an elevated temperature ion shower doping

  • Park, Seung-Chul;Jeon, Duk-Young
    • E2M - 전기 전자와 첨단 소재
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    • 제11권11호
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    • pp.22-27
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    • 1998
  • We have investigated the effect of an ion shower doping of the laser annealed poly-Si films at an elevated substrate temperatures. The substrate temperature was varied from room temperature to 300$^{\circ}C$ when the poly-Si film was doped with phosphorus by a non-mass-separated ion shower. Optical, structural, and electrical characterizations have been performed in order to study the effect of the ion showering doping. The sheet resistance of the doped poly-Si films was decreased from7${\times}$106 $\Omega$/$\square$ to 700 $\Omega$/$\square$ when the substrate temperature was increased from room temperature to 300$^{\circ}C$. This low sheet resistance is due to the fact that the doped film doesn't become amorphous but remains in the polycrystalline phase. The mildly elevated substrate temperature appears to reduce ion damages incurred in poly-Si films during ion-shower doping. Using the ion-shower doping at 250$^{\circ}C$, the field effect mobility of 120 $\textrm{cm}^2$/(v$.$s) has been obtained for the n-channel poly-Si TFTs.

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X-doped (X=Ru, P, Si) 𝛾-Al2O3 상의 Cu 흡착 제일원리 계산 연구 (First-Principle Calculation Study of Cu Adsorption on X-doped (X=Ru, P, Si) 𝛾-Al2O3)

  • 이은혜;지현진;최은영;이정훈;조장현
    • 한국수소및신에너지학회논문집
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    • 제33권1호
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    • pp.105-112
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    • 2022
  • Copper (Cu)-based catalysts have been widely used in a methanol steam reforming (MSR) reaction for hydrogen production for air-independent propulsion (AIP) applications and their good catalytic activities have attracted much attention. However, the agglomeration of the catalytic active site Cu causes deteriorating the catalytic performance and suppression of Cu agglomeration is a crucial issue in the AIP applications that the MSR system is typically operated at 250-300℃ for a long time. R. Sakai et al. recently showed a computational study on the anchoring effect that reduces an agglomeration of active sites by doping in a supporter. In order to present the anchoring effect on 𝛾-Al2O3 supported Cu-based catalysts, in this study, the adsorption energies of Cu on X-doped (X=ruthenium, phosphorus, silicon) 𝛾-Al2O3 were calculated and Cu adsorption energy decreased due to a change of the electronic structure originated from doping, thereby proving the anchoring effect.

텅스텐 폴리사이드 게이트 구조에서의 열처리 효과 (Effect of Heat Treatments on Tungsten Polycide Gate Structures)

  • 고재석;천희곤;조동율;구경완;홍봉식
    • 한국진공학회지
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    • 제1권3호
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    • pp.376-381
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    • 1992
  • Tungsten silicide films were deposited on the highly phosphorus-doped poly Si/SiO2/Si substrates by Low Pressure Chemical Vapor Deposition. They were heat treated in different conditions. XTEM, SIMS and high frequency C-V analysis were conducted for characterization. It can be concluded that outdiffusion of phosphours impurity throught the silicide films lead to its depletion in the poly-Si gate region near the gate oxide, resulting in loss of capacitance and increase of effective gate oxide thickness.

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LDD MOSFET의 최적화에 관한 연구 (Study on the Optimization of LDD MOSFET)

  • Dal Soo Kim
    • 대한전자공학회논문지
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    • 제24권3호
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    • pp.478-485
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    • 1987
  • Optimization of the sub-micron N-channel MOSFET with the LDD(Lightly Doped Drain)structure has been investigated. LDD devices with various length of n-region, n-dose and n-implantation species were fabricated for this purpose. It will be shown that LDD devices have lower substrate current by an order of magnitude and higher breakdown voltage than the conventional devices with comparable channel length. Optimized LDD structure has been found when the sidewall thickness is 2500\ulcorner and n-region is phosphorus implantd with the dose of 1.0E13/cm\ulcorner It has been found that transconductance degradation is less than 20%.

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