• Korean Journal of Optics and Photonics
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• v.4 no.4
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• pp.397-402
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• 1993

This paper presents a new computational algorithm of phase-shifting interferometry which can effectively eliminate the uncertainty errors of the reference phases encountered in obtaining multiple interferograms. The algorithm treats the reference phases as additional unknowns and determines their exact values by analyzing interferograms using numerical least square technique. A series of simulations prove that this algorithm can improve measuring accuracy being unaffected by the nonlinear and random errors of phase-shifters.

• Journal of the Korean Society for Precision Engineering
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• v.25 no.1
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• pp.85-91
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• 2008

White light scanning interferometry has gotten a firm position in 3D surface profile measuring field. Recently, the LCD industry gave a chance for this technology to enter into real industry fields. It is known that white-light phase-shifting algorithm give a best resolution compare to other algorithms, but there are some problems to be resolved. One of them is 300nm jump in height profile, called bat-wing effect. The main reason of this problem is an ambiguity of phase-peak detection algorithm, and some solution has been proposed, but it didn't work perfectly. In this paper, I will show the cases when these effects are occurred, and these height discrepancies will be almost disappeared when broad-band illuminators are used.

• Transactions of the Korean Society of Mechanical Engineers
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• v.16 no.9
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• pp.1728-1735
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• 1992

Holographic interferometry technique has been used for the measurement of whole-field deformation with high sensitivity. However there are some difficulties in quantitatively analyzing the holographic fringes. Recently, quantitative and automatic fringe analysis by using phase shifting method in interferometry has been studied in many fields. In this paper, a real time holographic interferometry system and a phase shifting method combined with digital image processing technique are employed to record and quantitatively analyze holographic fringe patterns. To evaluate our system and analyze errors, comparison of measured deformation with theoretical deformation of cantilever beam was carried out. The accuracy of 4.5% in our system was verified We have tried to apply this method to quantitatively measure the deformation of turbine blade under the bending force.

• Current Optics and Photonics
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• v.7 no.6
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• pp.673-682
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• 2023

In this paper, a three-key triple data encryption algorithm (TDEA) of a digital cryptosystem based on phase-shifting interferometry is proposed. The encryption for plaintext and the decryption for the ciphertext of a complex digital hologram are performed by three independent keys called a wavelength key k₁(λ), a reference distance key k₂(d_r) and a holographic encryption key k₃(x, y), which are represented in the reference beam path of phase-shifting interferometry. The results of numerical simulations show that the minimum wavelength spacing between the neighboring independent wavelength keys is about δλ = 0.007 nm, and the minimum distance between the neighboring reference distance keys is about δd_r = 50 nm. For the proposed three-key TDEA, choosing the deviation of the key k₁(λ) as δλ = 0.4 nm and the deviation of the key k₂(d_r) as δd_r = 500 nm allows the number of independent keys k₁(λ) and k₂(d_r) to be calculated as N(k₁) = 80 for a range of 1,530-1,562 nm and N(d_r) = 20,000 for a range of 35-45 mm, respectively. The proposed method provides the feasibility of independent keys with many degrees of freedom, and then these flexible independent keys can provide the cryptosystem with very high security.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2013.05a
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• pp.1079-1080
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• 2013

• Journal of the Korean Society for Precision Engineering
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• v.18 no.7
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• pp.149-154
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• 2001

This study discusses a non-contact optical technique, electronic speckle pattern interferometry(ESPI), that is well suited for a deformation measurement of structure. Phase shifting method and unwrapping method have used to make deformation quantitative widely. In this paper, a previous numerical formula for phase shifting method is reconstructed in addition to least square fitting method to improve sensitivity and phase unwrapping based on vertical-horizontal scanning method is applied to analyze in-plane and out-of-plane deformation quantitatively.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2010.05a
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• pp.815-816
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• 2010

• Journal of the Optical Society of Korea
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• v.14 no.4
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• pp.409-414
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• 2010

This paper describes the surface form measurement of a spherical smooth surface by using single shot off-axis Fizeau interferometry. The demodulated phase map is obtained and unwrapped to remove the $2\pi$ ambiguity. The unwrapped phase map is converted to height and the 3D surface height of the surface object is reconstructed. The results extracted from the single shot off-axis geometry are compared with the results extracted from four-frame phase shifting in-line interferometry, and the results are in excellent agreement.

• Journal of the Korean Society for Precision Engineering
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• v.15 no.12
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• pp.113-119
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• 1998

Recently Electronic Speckle Pattern Interferometry(ESPI) has been studied because it has the advantages to be able to measure the whole-field surface deformations of engineering components and materials in industrial areas with noncontact. The speckle patterns to be formed with interference phenomena of scattering light from rough surfaces illuminated by laser light have phase informations of surface deformations. In this study we used this interference phenomena and the phase shifting method to measure the inplane deformations, together with the use of digital image equipment to process the informations contained in the speckle pattern and to display consequent interferograms on TV monitor. FEA was performed before experiments and we obtained good agreement between the experimental results and FEA.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2001.04a
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• pp.226-230
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• 2001

Electronic Speckle Pattern Interferometry (ESPI) has been recently developed and widely used because it has advantage to be able to measure surface deformations of engineering components and materials in industrial areas with non-contact. The spekle patterns to be formed with interference phenomena of scattering phenomena measure the out-of-plane deformations, together with the use of digital image equipment to process the informations included in the speckle patterns and the display consequent interferogram on a computer monitor. In this study, the experimental results of a canti-levered plate using ESPI were compared with those obtained from the simple beam theory. The ESPI results of the canti-levered plate analyzed by 4-step phase shifting method are close to the theoretical expectation. Also, out-0of-plane displacements of a spot welded canti-levered plate were measured by ESPI with 4-step phase shifting technique. The phase map of the spot welded canti-levered plate is quite different from that of the canti-levered plate without spot welding.