• 제목/요약/키워드: Phase Measuring Profilometry

검색결과 27건 처리시간 0.021초

3-D Surface Profile Measurement Using An Acousto-optic Tunable Filter Based Spectral Phase Shifting Technique

  • Kim, Dae-Suk;Cho, Yong-Jai
    • Journal of the Optical Society of Korea
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    • 제12권4호
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    • pp.281-287
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    • 2008
  • An acousto-optic tunable filter based 3-D micro surface profile measurement using an equally spaced 5 spectral phase shifting is described. The 5-bucket spectral phase shifting method is compared with a Fourier-transform method in the spectral domain. It can provide a fast measurement capability while maintaining high accuracy since it needs only 5 pieces of spectrally phase shifted imaging data and a simple calculation in comparison with the Fourier transform method that requires full wavelength scanning data and relatively complicated computation. The 3-D profile data of micro objects can be obtained in a few seconds with an accuracy of ${\sim}10nm$. The 3-D profile method also has an inherent benefit in terms of being speckle-free in measuring diffuse micro objects by employing an incoherent light source. Those simplicity and practical applicability is expected to have diverse applications in 3-D micro profilometry such as semiconductors and micro-biology.

하이퍼센트릭 광학계를 이용한 구조 조명 형상 측정 방법 (Profilometry based on Structured Illumination with Hypercentric Optics)

  • 김성민;조민국;이맹진;한준구
    • 제어로봇시스템학회논문지
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    • 제19권12호
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    • pp.1089-1093
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    • 2013
  • Depth extraction using the structured illumination method is popularly applied since it has the benefit of measuring the object without contact. With multiple spatial frequencies and phase-shifting techniques, it is possible to extract the depth of objects with large discontinuity. For applications such as 3D (Three Dimensional) displays, 3D information of the object is required and is useful if corresponding to each view of the display. For this purpose, hypercentric optics is appropriate to measure the depth information of an object with a large field of view that is applicable for a 3D display. By experiment, we present the feasibility for phase-shifting profilometry using hypercentric optics to obtain the depth information of an object with the field of view appropriate for a 3D display.

Ultra High-speed 3-dimensional Profilometry Using a Laser Grating Projection System

  • Park, Yoon-Chang;Ahn, Seong-Joon;Kang, Moon-Ho;Kwon, Young-Chul;Ahn, Seung-Joon
    • Journal of the Optical Society of Korea
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    • 제13권4호
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    • pp.464-467
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    • 2009
  • The grating projection method with phase-shifting technique is very useful in measuring the 3-dimensional (3D) shape with high accuracy and speed. In this work, we have developed an ultra high-speed digital laser grating projection system using a high-power laser diode and a highsensitivity CMOS camera. With our system, the optical measurement required to find out the profile of a 3D object could be carried out within 2.6 ms, which is a significant ($\sim$10 times) improvement compared with those of the previous studies.

영사식 3차원 형상 측정을 위한 격자무늬 생성장치에 관한 연구 (A study on the grid fringe generator for measurement of 3-D object)

  • 박윤창
    • 한국공작기계학회:학술대회논문집
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    • 한국공작기계학회 1999년도 추계학술대회 논문집 - 한국공작기계학회
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    • pp.170-175
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    • 1999
  • Noncontact measuring methodology of 3-dimensional profile using CCD camera are very attractive because of it's high measuring speed and its's high sensitivity. Especially, when projecting a grid pattern over the object the captured image have 3 dimensional information of the object. Projection moire extract 3-D information with another grid pattern in front of CCD camera. However phase measuring profilometry(PMP) obtain similar results without additional grid pattern. In this paper, new method for grid pattern generation system by polygonal mirror and Laser Diode. This system is applied the projection moire and the PMP.

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위상천이법을 이용한 삼차원 형상측정에서 위상오차 보정 (Phase error compensation for three-dimensional shape measurement based on a phase-shifting method)

  • 박윤창;안성준;강문호;권영철;안승준
    • 한국산학기술학회논문지
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    • 제10권11호
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    • pp.3023-3030
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    • 2009
  • 고속 삼차원 형상측정에서는 충분한 위상이송 스텝 수를 적용할 시간을 확보할 수 없기 때문에, 스텝 수를 축소하게 되면서 위상측정에서의 잡음이 증가되게 된다. 본 논문에서는, 다파장 PMP법에 있어서 두 파장의 비례관계를 이용하여 측정된 위상에 포함되어 있는 위상오차를 예측하고, 이를 보정하는 방법을 제안하였으며, 제안된 보정방법의 효용성을 확인하기 위한 실험이 진행되었다. 위상천이법에서 통상적으로 사용되는 스텝 수에 비해 월등히 많은 스텝의 위상 이송으로 측정하였으며, 또한 동일한 대상물을 고속 삼차원측정에서 적용되는 3-3 step의 위상 이송으로 측정하여, 두 경우에서의 측정결과를 비교하여 고속측정에서의 측정잡음을 산출하였다. 그리고, 본 논문에서 제안하고 있는 보정 방법을 측정된 맥놀이 위상과 절대위상에 적용한 결과, 각각에 있어서 90%와 17.2%의 잡음감소가 이루어지는 것으로 확인되었다.

백색광 간섭계의 정밀도 향상을 위한 노이즈 제거 방법 (Development of Elimination Method of Measurement noise to Improve accuracy for White Light Interferometry)

  • 고국원;조수용;김민영
    • 제어로봇시스템학회논문지
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    • 제14권6호
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    • pp.519-522
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    • 2008
  • As industry of a semiconductor and LCD industry have been rapidly growing, precision technologies of machining such as etching and 3D measurement are required. Stylus has been important measuring method in traditional manufacturing process. However, its disadvantages are low measuring speed and damage possibility at contacting point. To overcome mentioned disadvantage, non-contacting measurement method is needed such as PMP(Phase Measuring Profilometry), WSI(white scanning interferometer) and Confocal Profilometry. Among above 3 well-known methods, WSI started to be applied to FPD(flat panel display) manufacturing process. Even though it overcomes 21t ambiguity of PMP method and can measure objects which has specular surface, the measuring speed and vibration coming from manufacturing machine are one of main issue to apply full automatic total inspection. In this study, We develop high speed WSI system and algorithm to reduce unknown noise. The developing WSI and algorithm are implemented to measure 3D surface of wafer. Experimental results revealed that the proposed system and algorithm are able to measure 3D surface profile of wafer with a good precision and high speed.

간섭무늬 투영 방식을 이용한 3차원 형상측정법 (3-D shapes measurement technique using pattern projection)

  • 박준식;나성웅;이연태;강영준
    • 한국광학회:학술대회논문집
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    • 한국광학회 2002년도 하계학술발표회
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    • pp.26-27
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    • 2002
  • 광학식 3차원 형상측정 기술은 산업현장과 의료분야에서 광범위하게 사용되어지고 있으며, 이에 대한 연구도 활발히 진행되고 있다. 본 연구에서는 비접촉식 3차원 형상측정 방법인 위상측정법(Phase Measuring Profilometry; PMP)을 실험적으로 구현하였으며 위상추출 알고리즘으로는 위상이동방법(Phase shifting method)과 푸리에 변환법(Fourier Transform)을 사용하여 그 결과를 비교 및 고찰하였다. (중략)

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피치가변격자를 이용한 자유곡선 형상측정에 관한 연구 (A Study on the Measurement of 3-D object, make use of grid fringe generator)

  • 박윤창;정경민;박경근;장석준
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2000년도 추계학술대회 논문집
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    • pp.19-22
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    • 2000
  • Noncontact measuring methodology of 3-dimensional profile using CCD camera are very attractive because of it's high measuring speed and its's high sensitivity. Especially, when projecting a grid pattern over the object the captured image have 3 dimensional information of the object. Projection moire extract 3-D information with another grid pattern in front of CCD camera. However phase measuring profilometry(PMP) obtain similar results without additional grid pattern. In this paper, new method for grid pattern generation system by polygonal mirror and Laser Diode. This system is applied the projection moire and the PMP.

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단일격자 이송을 이용한 영사식 3차원 물체 형상 측정에 관한 연구 (A Study on the measurement of 3-D Object with Single Grating Shiftings)

  • 박윤창;정경민
    • 한국공작기계학회:학술대회논문집
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    • 한국공작기계학회 1999년도 춘계학술대회 논문집
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    • pp.187-192
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    • 1999
  • Noncontact measuring methodology of 3-dimensional profile using CCD camera are very attractive because of it's high measuring speed and its's high sensitivity. Especially when projecting a grid pattern over the object, the captured image have 3 dimensional information of the object. Projection moire extract 3-D information with another grid pattern in front of CCD camera. However phase measuring profilometry(PMP) obtain similar results without additional grid pattern. In this paper, the projection moire are compared with the PMP mathematically, and it is shown that PMP can generate moire image with simple mathematical computations. Experimental works are also carried out showing the same results. It is shown that using a single gird pattern, moire image can be obtained directly without any mathematical operation when some conditions are satisfied.

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