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Profilometry based on Structured Illumination with Hypercentric Optics

하이퍼센트릭 광학계를 이용한 구조 조명 형상 측정 방법

  • Kim, Sungmin (School of Electronics Engineering, Kyungpook National University) ;
  • Cho, Minguk (School of Electronics Engineering, Kyungpook National University) ;
  • Lee, Maengjin (School of Electronics Engineering, Kyungpook National University) ;
  • Hahn, Joonku (School of Electronics Engineering, Kyungpook National University)
  • Received : 2013.08.20
  • Accepted : 2013.10.04
  • Published : 2013.12.01

Abstract

Depth extraction using the structured illumination method is popularly applied since it has the benefit of measuring the object without contact. With multiple spatial frequencies and phase-shifting techniques, it is possible to extract the depth of objects with large discontinuity. For applications such as 3D (Three Dimensional) displays, 3D information of the object is required and is useful if corresponding to each view of the display. For this purpose, hypercentric optics is appropriate to measure the depth information of an object with a large field of view that is applicable for a 3D display. By experiment, we present the feasibility for phase-shifting profilometry using hypercentric optics to obtain the depth information of an object with the field of view appropriate for a 3D display.

Keywords

References

  1. E. Stoykova, J. Harizanova, and V. Sainov, "Pattern projection profilometry for 3D coordinates measurement of dynamic scenes," in Three-Dimensional Television: Capture, Transmission, Display., Springer, pp. 85-164, 2008.
  2. J. Geng, "Structured-light 3D surface imaging: a tutorial," Adv. Opt. Photon., vol. 3, no. 2, pp. 128-160, 2011. https://doi.org/10.1364/AOP.3.000128
  3. J. Salvi, J. Pages, and J. Batlle, "Pattern codification strategies in structured light systems," Pattern Recogn., vol. 37, no. 4, pp. 827-849, 2004. https://doi.org/10.1016/j.patcog.2003.10.002
  4. J. Shin and S. Y. Yi, "Development of omnidrectional ranging system based on structured light image," Journal of Institute of Control, Robotics and Systems (in Korean), vol. 18, no. 5, pp. 479-486, 2012. https://doi.org/10.5302/J.ICROS.2012.18.5.479
  5. T. Baumbach, W. Osten, C. Kopylow, and W. Juptner, "Remote metrology by comparative digital holography," Appl. Opt., vol. 45, no. 5, pp. 925-934, 2006. https://doi.org/10.1364/AO.45.000925
  6. D. M. Meadows, W. O. Johnson, and J. B. Allen, "Generation of surface contours by Moire patterns," Appl. Opt., vol. 9, no. 4, pp. 942-947, 1970. https://doi.org/10.1364/AO.9.000942
  7. H. Takasaki, "Moire topography," Appl. Opt., vol. 9, no. 6, pp. 1467-1472, 1970. https://doi.org/10.1364/AO.9.001467
  8. J. A. N. Buytaert and J. J. J. Dirckx, "Moire profilometry using liquid crystals for projection and demodulation," Opt. Express, vol. 16, no. 1, pp. 179-193, 2008. https://doi.org/10.1364/OE.16.000179
  9. I. Yamaguchi, "Phase-shifting digital holography," in Digital Holography and Three-Dimensional Display, Springer, pp. 145-171, 2006.
  10. J. Hahn, H. Kim, S.-W. Cho, and B. Lee, "Phase-shifting interferometry with genetic algorithm-based twin image noise elimination," Appl. Opt., vol. 47, no. 22, pp. 4068-4076, 2008. https://doi.org/10.1364/AO.47.004068
  11. G. Mauvoisin, F. Bremand, and A. Lagarde, "Three-dimensional shape reconstruction by phase-shifting shadow Moire," Appl. Opt., vol. 33, no. 11, pp. 2163-2169, 1994. https://doi.org/10.1364/AO.33.002163
  12. S. Hwang, J. Jang, and K. Park, "Solving 2pi ambiguity problem of a laser scanner based on phase-shift measurement method for long distances measurement," ICCAS 2012, pp. 1250-1252, 2012.
  13. K.-I. Joo, C.-S. Park, M.-K. Park, K.-W. Park, J.-S. Park, Y. Seo, J. Hahn, and H.-R. Kim, "Multi-spatial-frequency and phase-shifting profilometry using a liquid crystal phase modulator," Appl. Opt., vol. 51, no. 14, pp. 2624-2632, 2012. https://doi.org/10.1364/AO.51.002624
  14. E.-H. Kim, J. Hahn, H. Kim, and B. Lee, "Profilometry without phase unwrapping using multi-frequency and four-step phase-shift sinusoidal fringe projection," Opt. Express, vol. 17, no. 10, pp. 7818-7830, 2009. https://doi.org/10.1364/OE.17.007818
  15. M. Chang and C. S. Ho,"Phase measuring profilometry using sinusoidal grating," Exp. Mech., vol. 33, no. 2, pp. 117-122, 1993. https://doi.org/10.1007/BF02322487
  16. R. Zheng, Y. Wang, X. Zhang, and Y. Song, "Two-dimensional phase-measuring profilometry," Appl. Opt., vol. 44, no. 6, pp. 954-958, 2005. https://doi.org/10.1364/AO.44.000954
  17. M. Takeda, Q. Gu, M. Kinoshita, H. Takai, and Y. Takahashi, "Frequency-multiplex Fourier-transform rofilometry: a single-shot three-dimensional shape measurement of objects with large height discontinuities and/or surface isolations," Appl. Opt., vol. 36, no. 22, pp. 5347-5354, 1997. https://doi.org/10.1364/AO.36.005347
  18. J.-L. Li, H.-J. Su, and X.-Y. Su, "Two-frequency grating used in phase-measuring profilometry," Appl. Opt., vol. 36, no. 1, pp. 277-280, 1997. https://doi.org/10.1364/AO.36.000277
  19. J. Li, L. G. Hassebrook, and C. Guan, "Optimized two-frequency phase-measuring-profilometry lightsensor temporal-noise sensitivity," J. Opt. Soc. Am. A, vol. 20, no. 1, pp. 106-115, 2003. https://doi.org/10.1364/JOSAA.20.000106
  20. E.-H. Kim, J. Hahn, and B. Lee, "On-axis phase-shifting profilometry with two spatial frequencies using concentric-circular patterns," OSA Optics & Photonics Congress, 2009.
  21. M. Cho, M. J. Kim, and J. Hahn, "On-Axis Phase-Shifting Profilometry with Inverted Perspective," The 12th International Meeting on Information Display, 2012.
  22. D. Lanman, D. Crispell, and G. Taubin, "Surround Structured Lighting: 3-D Scanning with Orthographic Illumination," Computer Vision and Image Understanding, vol. 113, no. 11, pp. 1107-1117, 2009. https://doi.org/10.1016/j.cviu.2009.03.016