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http://dx.doi.org/10.5302/J.ICROS.2013.13.9039

Profilometry based on Structured Illumination with Hypercentric Optics  

Kim, Sungmin (School of Electronics Engineering, Kyungpook National University)
Cho, Minguk (School of Electronics Engineering, Kyungpook National University)
Lee, Maengjin (School of Electronics Engineering, Kyungpook National University)
Hahn, Joonku (School of Electronics Engineering, Kyungpook National University)
Publication Information
Journal of Institute of Control, Robotics and Systems / v.19, no.12, 2013 , pp. 1089-1093 More about this Journal
Abstract
Depth extraction using the structured illumination method is popularly applied since it has the benefit of measuring the object without contact. With multiple spatial frequencies and phase-shifting techniques, it is possible to extract the depth of objects with large discontinuity. For applications such as 3D (Three Dimensional) displays, 3D information of the object is required and is useful if corresponding to each view of the display. For this purpose, hypercentric optics is appropriate to measure the depth information of an object with a large field of view that is applicable for a 3D display. By experiment, we present the feasibility for phase-shifting profilometry using hypercentric optics to obtain the depth information of an object with the field of view appropriate for a 3D display.
Keywords
profilometry; structured illumination; phase shifting technology; hypercentric optics;
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