• Title/Summary/Keyword: Pattern of Errors

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Learning Networks for Learning the Pattern Vectors causing Classification Error (분류오차유발 패턴벡터 학습을 위한 학습네트워크)

  • Lee Yong-Gu;Choi Woo-Seung
    • Journal of the Korea Society of Computer and Information
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    • v.10 no.5 s.37
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    • pp.77-86
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    • 2005
  • In this paper, we designed a learning algorithm of LVQ that extracts classification errors and learns ones and improves classification performance. The proposed LVQ learning algorithm is the learning Networks which is use SOM to learn initial reference vectors and out-star learning algorithm to determine the class of the output neurons of LVQ. To extract pattern vectors which cause classification errors, we proposed the error-cause condition, which uses that condition and constructed the pattern vector space which consists of the input pattern vectors that cause the classification errors and learned these pattern vectors , and improved performance of the pattern classification. To prove the performance of the proposed learning algorithm, the simulation is performed by using training vectors and test vectors that are Fisher' Iris data and EMG data, and classification performance of the proposed learning method is compared with ones of the conventional LVQ, and it was a confirmation that the proposed learning method is more successful classification than the conventional classification.

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A Tow-stage Recognition Approach Based on Error Pattern Hypotheses for Connected Digit Recognition

  • Oh, Wook-Kwon;Un, Chong-Kwan
    • The Journal of the Acoustical Society of Korea
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    • v.15 no.3E
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    • pp.31-36
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    • 1996
  • In this paper, a two-stage recognition approach based on error pattern hypotheses is proposed to reduce errors of a connected digit recognizer. In the approach, a conventional recognizer is first used to produce N-best candidate strings, and then error patterns are hypothesized by examining the candidate strings. For substitution error pattern hypotheses, error-pattern-dependent classifiers having more discriminative power than the first-stage classifier are used ; and for insertion and deletion errors, word duration and energy contour information are exploited are exploited to discriminated confusing pairs. Simulation results showed that the proposed approach achieves 15% decrease in word error rate for speaker-independent Korean connected digit recognition when a hidden Markov model-based recognizer is used for the first-stage classifier.

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Enhancement of Pattern Fidelity for Metal Layer in Attenuated PSM Lithography by OPC

  • Lee Hoong Joo;Lee Jun Ha
    • Proceedings of the IEEK Conference
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    • 2004.08c
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    • pp.784-786
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    • 2004
  • Overlap errors and side-lobes can be simultaneously solved by the rule-based correction using scattering bars with the rules extracted from test patterns. Process parameters affecting the attPSM lithography simulation have been determined by the fitting method to the process data. Overlap errors have been solved applying the correction rules to the metal patterns overlapped with contact/via. Moreover, the optimal insertion rule of the scattering bars has made it possible to suppress the side-lobes and to get additional pattern fidelity at the same time.

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A Study to Rethink the Components of Teaching Korean Genitive Particle '의': Based on the Errors in Korean Learners' Corpus (한국어 학습자 대상 관형격 조사 '의'의 교육 내용 재고: 학습자 말뭉치에 나타난 오류를 바탕으로)

  • Soo-Hyun Lee;Ji-Young Sim
    • Journal of the Korean Society of Industry Convergence
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    • v.26 no.3
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    • pp.443-454
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    • 2023
  • The purpose of this study is to reveal the Korean learners' usage pattern of '의', the genitive particle, according to semantic classification, so that it can be referred to in determining the contents and methods of related education. The method of this study adopts a quantitative analysis using learners corpus established by National Institute of Korean Language. As a result of the analysis, as proficiency increases, the overall frequency of '의' increases and the number of meaning senses used increases. However, the frequency of errors also increases with it. As for the usage pattern of each sense, the meaning of 'ownership, belonging' is the most frequent, and followed by 'acting entity', 'kinship, social relations', and 'relationship(area)'. In conclusion, the meanings of 'acting subjects' and 'relationships(area) need to be supplemented with explicit education. Other meanings need to be discussed, and decisions should be made in consideration of learning purpose and proficiency.

Influence upon Machining Accuracy of Micro-Pattern Roll Mold Processed by Temperature Variation (미세 패턴 롤 금형 가공시스템의 온도변화가 가공정밀도에 미치는 영향 연구)

  • Je, T.J.;Park, S.C.;Lee, K.W.;Noh, J.S.;Choi, D.S.;Whang, K.H.
    • Transactions of Materials Processing
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    • v.18 no.2
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    • pp.107-111
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    • 2009
  • Temperature variation happens in micro prism roll mold processing system during machining the prism pattern roll mold using manufacturing optical films of LCD (liquid crystal display). This temperature variation induces pitch errors of the prism patterns. The temperature variation displaces the positions of the diamond cutting tool on the roll which was coated by the copper. In order to prevent the pitch errors, the stabilizing the temperature of machining environment is needed. Therefore, the researching on the temperature variation of the ultra-precision roll mold processing system on the machining of micro prism rot 1 mold is needed. In this paper, the temperature variation of micro prism roll mold processing system is researched, the influence is analyzed, and the study for reducing the pitch errors carried out.

Pattern Generation for Coding Error Detection in VHDL Behavioral-Level Designs (VHDL 행위-레벨 설계의 코딩오류 검출을 위한 패턴 생성)

  • Kim, Jong-Hyeon;Park, Seung-Gyu;Seo, Yeong-Ho;Kim, Dong-Uk
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.38 no.3
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    • pp.185-197
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    • 2001
  • Recently, the design method by VHDL coding and synthesis has been used widely. As the integration ratio increases, the amount design by VHDL at a time also increases so many coding errors occur in a design. Thus, lots of time and effort is dissipated to detect those coding errors. This paper proposed a method to verify the coding errors in VHDL behavioral-level designs. As the methodology, we chose the method to detect the coding error by applying the generated set of verifying patterns and comparing the responses from the error-free case(gold unit) and the real design. Thus, we proposed an algorithm to generate the verifying pattern set for the coding errors. Verifying pattern generation is peformed for each code and the coding errors are classified as two kind: condition errors and assignment errors. To generate the patterns, VHDL design is first converted into the corresponding CDFG(Control & Data Flow Graph) and the necessary information is extracted by searching the paths in CDFG. Path searching method consists of forward searching and backward searching from the site where it is assumed that coding error occurred. The proposed algorithm was implemented with C-language. We have applied the proposed algorithm to several example VHDL behavioral-level designs. From the results, all the patterns for all the considered coding errors in each design could be generated and all the coding errors were detectable. For the time to generate the verifying patterns, all the considered designed took less than 1 [sec] of CPU time in Pentium-II 400MHz environments. Consequently, the verification method proposed in this paper is expected to reduce the time and effort to verify the VHDL behavioral-level designs very much.

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An Error Pattern ROM Compression Method for Continuous Data (연속된 데이터를 위한 에러패턴 ROM 압축 기법)

  • 양병도;김이섭
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.41 no.8
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    • pp.99-104
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    • 2004
  • This paper proposes a new error pattern ROM (EP-ROM) compression method for continuousdata. The EP-ROM reduces the ROM size by dividing the continuous data into coarse values and their errors and by storing the indices of error patterns instead of the non. This method significantly reduces the ROM size by exploiting the characteristic that the errors for continuous data possess the same patterns. The experiment results show that the EP-ROM achieves 60∼77% ROM size reductions for various continuous data.

An analysis of errors in problem solving of the function unit in the first grade highschool (고등학교 1학년 함수단원 문제해결에서의 오류에 대한 분석)

  • Mun, Hye-Young;Kim, Yung-Hwan
    • Journal of the Korean School Mathematics Society
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    • v.14 no.3
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    • pp.277-293
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    • 2011
  • The purpose of mathematics education is to develop the ability of transforming various problems in general situations into mathematics problems and then solving the problem mathematically. Various teaching-learning methods for improving the ability of the mathematics problem-solving can be tried. However, it is necessary to choose an appropriate teaching-learning method after figuring out students' level of understanding the mathematics learning or their problem-solving strategies. The error analysis is helpful for mathematics learning by providing teachers more efficient teaching strategies and by letting students know the cause of failure and then find a correct way. The following subjects were set up and analyzed. First, the error classification pattern was set up. Second, the errors in the solving process of the function problems were analyzed according to the error classification pattern. For this study, the survey was conducted to 90 first grade students of ${\bigcirc}{\bigcirc}$high school in Chung-nam. They were asked to solve 8 problems in the function part. The following error classification patterns were set up by referring to the preceding studies about the error and the error patterns shown in the survey. (1)Misused Data, (2)Misinterpreted Language, (3)Logically Invalid Inference, (4)Distorted Theorem or Definition, (5)Unverified Solution, (6)Technical Errors, (7)Discontinuance of solving process The results of the analysis of errors due to the above error classification pattern were given below First, students don't understand the concept of the function completely. Even if they do, they lack in the application ability. Second, students make many mistakes when they interpret the mathematics problem into different types of languages such as equations, signals, graphs, and figures. Third, students misuse or ignore the data given in the problem. Fourth, students often give up or never try the solving process. The research on the error analysis should be done further because it provides the useful information for the teaching-learning process.

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Korean Agraphia Subsequent to Right Hemispheric Lesion (우반구 손상 환자의 한글 실서증 특징)

  • Yoon, Ji-Hye;Shin, Ji-Cheol;Kim, Deog-Young;Suh, Mee-Kyung;Kim, Hyang-Hee
    • Speech Sciences
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    • v.13 no.3
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    • pp.121-132
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    • 2006
  • In Hangeul, the graphemes of syllables are organized in horizontal, vertical and mixed (both horizontal & vertical) orientations, and the graphemic position of consonant(s) and vowel(s) within a each syllable needs to be maintained within a square pattern. We investigated the characteristics of writing errors of 9 stroke patients with right hemisphere (RH) lesions and compared it to the performances of 15 normal subjects. The subjects were asked to write to dictation of 90 Korean syllables. One of the interesting findings was that our patients manifested visuospatial errors which are not commonly observed in other language-speaking (e.g., English) patients due to the unique syllabic organizations of Korean writing system. The prominent errors in the RH group could be explained by the impaired RH which normally controls the visuospatial functions.

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Analysis on Optical Characteristics of LCD Backlight LGP (LCD 백라이트 도광판의 광학 특성에 대한 연구)

  • Sah, Jong-Youb;Park, Jong-Ryul
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.28 no.4
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    • pp.362-369
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    • 2004
  • LGP(Light-Guide Panel) of LCD backlight is one of the major componets which affect on the product quality of LCD. The optical relation between brightness and pattern has been investigated for LGP with the uniform distribution of brightness. When given the brightness distribution as target, the solutions of pattern distribution is not unique. Each solution of pattern designs shows the different brightness intensity even though they have the same brightness distribution with target's one. The manufacturing condition of pattern has an influence on the possibly-maximum-brightness intensity among the solutions of pattern design. The present study has examined the effects of LGP thickness, pattern shape errors, and reflection film on the optical characteristics of LGP.