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An Error Pattern ROM Compression Method for Continuous Data  

양병도 (KAIST 전자전산학과)
김이섭 (KAIST 전자전산학과)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.41, no.8, 2004 , pp. 99-104 More about this Journal
Abstract
This paper proposes a new error pattern ROM (EP-ROM) compression method for continuousdata. The EP-ROM reduces the ROM size by dividing the continuous data into coarse values and their errors and by storing the indices of error patterns instead of the non. This method significantly reduces the ROM size by exploiting the characteristic that the errors for continuous data possess the same patterns. The experiment results show that the EP-ROM achieves 60∼77% ROM size reductions for various continuous data.
Keywords
VLSI; CMOS; ROM; and compression;
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