• 제어로봇시스템학회:학술대회논문집
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• 2005.06a
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• pp.792-793
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• 2005

Circuit testing process is very important in IC Manufacturing there are two ways in research for circuit testing improvement. These are ATPG Tool Design and Test simulation application. We are interested in how to use parallel technique such as one-side communication, parallel IO and dynamic Process with data partition for circuit testing improvement and we use one-side communication technique in this paper. The parallel ATPG Tool can reduce the test pattern sets of the circuit that is designed in laboratory for make sure that the fault is not occur. After that, we use result for parallel circuit test simulation to find fault between designed circuit and tested circuit. From the experiment, We use less execution time than non-parallel Process. And we can set more parameter for less test size. Previous experiment we can't do it because some parameter will affect much waste time. But in the research, if we use the best ATPG Tool can optimize to least test sets and parallel circuit testing application will not work. Because there are too little test set for circuit testing application. In this paper we use a standard sequential circuit of ISCAS89.

• The Transactions of the Korean Institute of Electrical Engineers D
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• v.54 no.8
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• pp.475-481
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• 2005

In the existing ICT technique, the mounted electronic devices on the printed circuit board are tested whether the devices are good or not by comparing and measuring the value of the devices after separating the devices to be tested from around it based on the guarding method. But, in case that resistance, inductor and capacitor are configured as a parallel circuit on the circuit pattern, values for each device can not be measured because the total impedance value of the parallel circuit is measured. Accordingly, it is impossible to test whether the parallel circuit is good or not in case that the measured impedance value is within the tolerance error. Also, it is difficult to identify that which device among R, L and C of the parallel circuit is bad in case that the measured impedance value is out of the tolerance error. Accordingly, this paper proposes a test method which can enhance the quality and productivity by separating and measuring accurately R, L and C components from the RLC parallel circuits on the device-mounted printed circuit board. First, the RLC parallel circuit to be test is separated electrically from around it using three-terminal guarding technique. And then R, L and C values are computed based on the total impedance values and phase angles between voltage and current of the parallel circuit measured from two AC input signals with other frequency, Finally, the availability and accuracy of the proposed test method is verified by reviewing the simulation results.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.18 no.9
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• pp.863-869
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• 2005

We investigated quench characteristics of superconducting elements connected in series and parallel each other. The serial and parallel connections of superconducting elements causes a difficulty in simultaneous quench due to slight difference between their critical current densities. In other to induce simultaneous quench, we fabricated four type circuits; serially connected circuit before parallel connection, the circuit connected in parallel before serial connection, serially connected circuit before parallel connection with reactors, the circuit connected in Parallel before serial connection with reactors. We confirmed that the simultaneous quenches occurred in serial and parallel connections of superconducting elements using reactors. In addition, the power burden of superconducting elements was smaller than those of serial and parallel connections of superconducting elements without reactors.

• Korean Journal of Air-Conditioning and Refrigeration Engineering
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• v.22 no.5
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• pp.259-267
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• 2010

An experiment has been performed in order to investigate the characteristics of multiple thermoelectric modules (TEMs) with electrical circuits. The open circuit voltage of TEM connected parallel circuit is equal to the sum of individual TEMs. In contrast, the open circuit voltage is equal to the average of that individual TEM for a series circuit. The power output and conversion efficiency of TEM for both parallel and series circuits increase as the operating temperature conditions for individual TEMs becomes identical. Comparing parallel with series circuits, the power generation performance is more excellent for series circuit than parallel circuit. This result is attributed to the power loss from the TEM with better power generation performance.

• Proceedings of the KIPE Conference
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• 1996.06a
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• pp.56-59
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• 1996

In this paper, we developed a micro-stepping drive circuit of step motor and proposed software algorithm for parallel operation of step motors drived by micro-stepping circuit. Also, we implemented a parallel operation controller with a 16-bit micro-controller.

• The Journal of the Acoustical Society of Korea
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• v.38 no.2
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• pp.222-230
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• 2019

In this paper, the power of the energy harvesting circuit using the PVDF (Polyvinylidene fluoride) piezoelectric sensor transformed by vortex was analyzed. For power analysis, a general bridge diode rectifier circuit and a P-SSHI (Parallel Synchronized Switch Harvesting on Inductor) rectifier circuit with a switching circuit were used. The P-SSHI circuit is a circuit that incorporates a parallel synchronous switch circuit at the input of a general rectifier circuit to improve energy conversion efficiency. In this paper, the output power of general rectifier circuit and P-SSHI rectifier circuit is analyzed and verified through theory and experiment. It was confirmed that the efficiency was increased by 69 % through the experiment using the wind. In addition, a circuit for storing the harvested energy in the supercapacitor was implemented to confirm its applicability as a secondary battery.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.11a
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• pp.478-479
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• 2007

Many electrical fires are occurred by leakage currents and sparks generated by a short circuit. Earth leakage circuit breakers (ELCBs) should be tripped at the moment of the faults mentioned above. In this paper, we described the tripping characteristics of ELCBs against parallel arcing faults. A diesel engine generator with the capacity of 375 kVA source was adopted to provide enough large current when a parallel arcing occurred. The experimental results showed that most ELCBs we experimented were not tripped against short-duration pulse currents produced by parallel arcing because the ELCBs are designed to be tripped by a large current with long duration similar to power frequency.

• 한국태양에너지학회:학술대회논문집
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• 2008.04a
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• pp.241-246
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• 2008

In this paper, we analyze the I-V curve and hot-spot phenomenon caused by solar cells' serial and parallel connected circuit. The mis-match loss of parallel interconnection with low Isc string decrease lower than serially interconnected one and temperature caused by hot-spot does. Also, mis-match loss of parallel interconnection with low Voc string increase more than serially interconnected one. The string having low Voc happened hot-spot phenomenon when open circuit. The bad solar cell in string gives revere bias to good solar cell and make hot-spot phenomenon. If we consider the mis-match loss, when designing PV module and array. the efficiency of PV system might increase.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.19 no.7
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• pp.761-770
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• 2008

Impedance or admittance inverter is a conceptual 2-port device frequently used in microwave filter design. In this paper, the equivalent circuit using inverter for general loss less 2-port circuit is presented. Our equivalent circuit can be directly and easily represented with z- or y-parameters compared with the conventional methods. Based on the representation, the derived results for various coupled lines such as parallel coupled line and anti-parallel coupled lines are compared ours. In addition, the results of other workers for improvement of the distortion in frequency response of microstrip coupled line filter are derived using our representation and compared. The proposed equivalent circuit shows the difference with conventional equivalent circuit so the conventional design method can not be applied to parallel coupled line filter with our representation. So in this paper the novel design method is proposed and we showed the method yields more accurate design results.

• Proceedings of the KIEE Conference
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• 2005.05a
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• pp.148-151
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• 2005

This paper proposes a high speed interface using redundant multi-valued logic for high speed communication ICs. This circuit is composed of encoding circuit that serial binary data are received and converted into parallel redundant multi-valued data, and decoding circuit that convert redundant multi-valued data to parallel binary data. Because of the multi-valued data conversion, this circuit makes it possible to achieve higher operating speeds than that of a conventional binary logic. Using this logic, a 1:4 demultiplexer (DEMUX, serial-parallel converter) IC was designed using a 0.35${\mu}m$ standard CMOS Process. Proposed demultiplexer is achieved an operating speed of 3Gb/s with a supply voltage of 3.3V and with power consumption of 48mW. Designed circuit is limited by maximum operating frequency of process. Therefore, this circuit is to achieve CMOS communication ICs with an operating speed greater than 3Gb/s in submicron process of high of operating frequency.