• Korean Journal of Materials Research
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• v.24 no.6
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• pp.326-337
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• 2014

The use of solar energy generation is steadily increasing, and photovoltaic modules are connected in series to generate higher voltage and power. However, solar panels are exposed to high-voltage stress (up to several hundreds of volts) between grounded module frames and the solar cells. Frequent high-voltage stress causes a power-drop in the modules, and this kind of degradation is called potential induced degradation (PID). Due to PID, a significant loss of power and performance has been reported in recent years. Many groups have suggested how to prevent or reduce PID, and have tried to determine the origin and mechanism of PID. Even so, the mechanism of PID is still unclear. This paper is focused on understanding the PID of crystalline-silicon solar cells and modules. A background for PID, as well as overviews of research on factors accelerating PID, mechanisms involving sodium ions, PID test methods, and possible solutions to the problem of PID, are covered in this paper.

• Current Photovoltaic Research
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• v.8 no.4
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• pp.114-119
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• 2020

In this study, Mitigation of Potential-induced degradation (PID) for PERC solar cells using SiO2 Structure of ARC layer. The conventional PID test was conducted with a cell-level test based on the IEC-62804 test standard, but a copper PID test device was manufactured to increase the PID detection rate. The accelerated aging test was conducted by maintaining 96 hours with a potential difference of 1000 V at a temperature of 60℃. As a result, the PERC solar cell of SiO2-Free ARC structure decreased 22.11% compared to the initial efficiency, and the PERC solar cell of the Upper-SiO2 ARC structure decreased 30.78% of the initial efficiency and the PID reliability was not good. However, the PERC solar cell with the lower-SiO2 ARC structure reduced only 2.44%, effectively mitigating the degradation of PID. Na+ ions in the cover glass generate PID on the surface of the PERC solar cell. In order to prevent PID, the structure of SiNx and SiO2 thin films of the ARC layer is important. SiO2 thin film must be deposited on bottom of ARC layer and the surface of the PERC solar cell N-type emitter to prevent surface recombination and stacking fault defects of the PERC solar cell and mitigated PID degradation.

• Bulletin of the Korea Photovoltaic Society
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• v.4 no.2
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• pp.14-24
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• 2018

The potential induced degradation (PID) phenomenon of crystalline silicon photovoltaic (PV) modules has been often found in outdoor PV systems until recently since firstly reported in 2010. Many studies have been conducted about the mechanism and the preventive methods, but systematic diagnosis of the PID has not been applied on-site. This paper focuses on analysis of 5 categories and 10 PID diagnosis methods using the monitoring data, light current-voltage, dark current-voltage, infrared and electroluminescence. We expect to contribute to improvement of power generation through PID diagnosis and troubleshooting in PV plants.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.08a
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• pp.312.1-312.1
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• 2013

PID (Potential Induced Degradation)는 높은 시스템 전압을 갖는 PV모듈에서 발생하는 현상으로 PV모듈의 출력을 급격하게 감소시키는 현상을 말한다. PV시스템의 높은 전압은 태양전지와 PV모듈의 프레임 사이에 전위차를 발생시키고 이로 인하여 누설전류가 흐르게 된다. 누설전류는 태양전지 표면에 전하를 축적 시켜 발전 효율을 감소시키게 된다. 이러한 누설전류는 온도와 습도가 높을수록 많이 발생하는 것으로 알려져 있다. 본 논문에서는 PV모듈을 구성하는 재료가 PID에 의한 출력변화에 어떠한 영향을 주는지에 관한 연구를 수행하였다. PID가 쉽게 발생하는 태양전지를 이용하여 일반적으로 PV모듈을 제작 할 때 사용되는 전 후면 재료를 이용하여 각각의 출력변화에 대한 연구를 수행하였다. PV모듈의 전 후면 재료를 각각 다르게 하여 이에 따른 PID 발생 정도를 출력 변화로 확인하였으며 PID의 원인이 되는 누설전류에 어떠한 변화를 주는지 분석하였다. PV모듈의 후면 재료는 PV모듈 내부로의 수분 침투와 관련하여 PID 발생에 영향을 주고 전면재료인 저철분 강화유리는 PV모듈 내부에 전하를 공급하여 누설전류가 발생하게 하는 역할을 하는 것으로 판단된다.

• Journal of the Microelectronics and Packaging Society
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• v.26 no.3
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• pp.75-80
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• 2019

Silicon solar cells have been widely used as a most promising renewable energy source due to eco-friendliness and high efficiency. As modules of silicon solar cells are connected in series for a practical electricity generation, a large voltage of 500-1,500 V is applied to the modules inevitably. Potential-induced degradation (PID), a deterioration of the efficiency and maximum power output by the continuously applied high voltage between the module frames and solar cells, has been regarded as the major cause that reduces the lifetime of silicon solar cells. In particular, the migration of the $Na^+$ ions from the front glass into Si through the anti-reflection coating and the accumulation of $Na^+$ ions at stacking faults inside Si have been reported as the reason of PID. In this research, the thickness effect of $SiO_x$ layer that can block the migration of $Na^+$ ions on the reduction of PID is investigated as it is incorporated between anti-reflection coating and p-n junction in p-type PERC solar cells. From the measurement of shunt resistance, efficiency, and maximum power output after the continuous application of 1,000 V for 96 hours, it is revealed that the thickness of $SiO_x$ layer should be larger than 7-8 nm to reduce PID effectively.

• Journal of the Korean Solar Energy Society
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• v.35 no.5
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• pp.57-65
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• 2015

The Potential Induced Degradation(PID) in PV module mainly affected by various performance conditions such as a potential difference between solar cell and frame, ambient temperature and relative humidity. The positive charges as sodium ions in front glass reach solar cell in module by a potential difference and are accumulated in the solar cell. The ions accelerate the recombination of generation electrons within solar cell under illumination, which reduces the entire output of module. Recently, it was generally known that PID generation is suppressed by controlling the thickness of SiNx AR coating layer on solar cell or using Sodium-free glass and high resistivity encapsulant. However, recovery effects for module with PID are required, because those methods permanently prevent generating PID of module. PID recovery method that voltage reversely applies between solar cell and frame contract to PID generation begins to receive attention. In this paper, PID recovery tests by using voltage under various outdoor conditions as humidity, temperature, voltage are conducted to effectively mitigate PID in module. We confirm that this recovery method perfectly eliminates PID of solar cell according to repeative PID generation and recovery as well as the applied voltage of three factors mainly affect PID recovery.

• Bulletin of the Korea Photovoltaic Society
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• v.3 no.2
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• pp.42-47
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• 2017

The potential induced degradation (PID) phenomenon shows severe power loss within several years from the initial installation of solar power system. The accumulated power loss by PID is inevitable because the PID is suspected only if the power loss exceeds several percent. In this paper, we analyzed the cases of PID diagnosis and recovery by visiting the suspected PID site about 17 months after the installation of the 100kW PV system. The power difference of the two 50kW inverters was more than 20kWh, and the PR difference was more than 8%. From the beginning of the installation, the difference in power gradually increased. The recovery was observed for about 7 months by applying 1000V in the reverse bias at night. As a result, the power difference of the two inverters was recovered to within 2kWh. In the case of a power station suffering from PID in the field, it will be helpful for stable development operation by quick diagnosis and problem solving.

• Journal of the Microelectronics and Packaging Society
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• v.27 no.4
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• pp.55-60
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• 2020

The PERC photovoltaic (PV) modules installed in PV power plant are still reports potential-induced degradation (PID) degradation due to high voltage potential differences. This is because Na+ ions in the cover glass of PV modules go through the encapsulant (EVA) and transferred to the surface of solar cells. As positive charges are accumulated at the ARC (SiOx/SiNx) interface where many defects are distributed, shunt-resistance (Rsh) is reduced. As a result, the leakage current is increased, and decrease in solar cell's power output. In this study, to prevent of this phenomenon, a Moth-eye nanostructure was deposited on the rear surface of an optical film using Nano-Imprint Lithography method, and a solar mini-module was constructed by inserting it between the cover glass and the EVA. To analyze the PID phenomenon, a cell-level PID acceleration test based on IEC 62804-1 standard was conducted. Also analyzed power output (Pmax), efficiency, and shunt resistance through Light I-V and Dark I-V. As a result, conventional solar cells were decreased by 6.3% from the initial efficiency of 19.76%, but the improved solar cells with the Moth-eye nanostructured optical film only decreased 0.6%, thereby preventing the PID phenomenon. As of Moth-eye nanostructured optical film, the transmittance was improved by 4%, and the solar module output was improved by 2.5%.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.26 no.10
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• pp.760-765
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• 2013

PID (potential induced degradation) of PV module is the degradation of module due to the high potential difference between the front surface of solar cells and ground when PV modules operate under high humidity and temperature conditions. PID is generally derived from the positive sodium ions in front glass that are accumulated on P-type solar cells. Therefore, some papers for the electrical characteristic of only front components as glass, EVA sheet, solar cell under PID generation condition were revealed. In this paper, we analyzed the different outputs of module with PID by considering the all parts of module including the back side elements such as glass, back sheet. Mini modules with one solar cell were fabricated with the various parts on front and back sided of module. To generate PID of module in a short time, the all modules were applied.1,000 V in $85^{\circ}C$, 85% RH. The outputs, dark IV curves and EL images of all modules before and after experiments were also measured to confirm the main components of module for PID generation. From the measured results, the outputs of all modules with front glass were remarkably reduced and the performances of modules with back and front glass were greatly deteriorated. We suggest that the obtained data could be used to reduce the PID phenomenon of diverse modules such as conventional module and BIPV (building integrated photovoltaic) module.

• Proceedings of the KIPE Conference
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• 2018.07a
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• pp.366-367
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• 2018

본 논문은 태양광발전 시스템에서 태양광 모듈의 출력 저하 특성을 야기하는 PID (Potential Induced Degradation) 현상의 발생원인 및 출력회복을 위한 PID 저감 기법을 연구하였다. 태양광 모듈의 프레임과 셀 간에 발생하는 전위차로 인한 PID 현상의 직접적인 원인인 분극현상에 대해 분석하였으며, PID 현상이 태양광 모듈의 출력특성에 미치는 영향을 I-V 특성곡선 변화를 통해 해석하였다. PID 현상의 발생 원인을 기반으로 태양광 모듈의 전극 출력단인 양극과 음극을 단락시키고 접지된 프레임을 기준으로 양의 전압을 인가함으로써 태양광모듈의 출력특성을 회복하는 PID 저감 기법을 제안하였다.