• Proceedings of the Optical Society of Korea Conference
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• 1991.06a
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• pp.90-93
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• 1991

일곤 레이저의 두 파장(488 nm, 514.5 nm)을 사용하여 은 박막과 은 박막 위에 덧증착한 ZnS 박막의 유일한 광학 상수와 두께를 Kretschmann 구조의 표면 플라즈몬 공명을 이용하여 결정하였다.

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 2004.11a
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• pp.227-231
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• 2004

Technological advance in information technology has sparked the necessity of small form factor (SFF) optical disk for mobile devices. Small form factor optical disk is highly anticipated to be a next generation storage device because it can be used for a cost-effective way compared with solid state memory. For the application to the 5 mm height small-form-factor optical disk drive, we have presented an optical flying head and swing arm actuator. In this study, we propose a small 1-axis actuator for compensating ficus error and SA due to the variation of cover-layer thickness in the cover-layered small optical disk. The main design issues of the 1-axis actuator are the realization of compact structure and the new support structure of the actuator: Finally, the compensating principle and performance of the 1-axis actuator will be explained.

• Korean Journal of Optics and Photonics
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• v.30 no.1
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• pp.15-22
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• 2019

$Si_3N_4$ rib-optical waveguides for evanescent-wave integrated-optical biosensors were analytically interpreted, to derive the single-mode propagation conditions. The integrated-optical biosensor structure based on two-mode interference was proposed, and the rib width and thickness and core thickness for a single-mode and two-mode waveguide (sensing region) were proposed to be $3{\mu}m$, 2 nm, and 150 nm and $3{\mu}m$, 20 nm, and 340 nm respectively. The optical characteristics of each guided-wave mode were investigated utilizing the film mode-matching (FMM) analysis.

• Korean Journal of Materials Research
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• v.23 no.8
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• pp.469-475
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• 2013

Al-doped ZnO(AZO) thin films were synthesized using atomid layer deposition(ALD), which acurately controlled the uniform film thickness of the AZO thin films. To investigate the electrical and optical properites of the AZO thin films, AZO films using ALD was controlled to be three different thicknesses (50 nm, 100 nm, and 150 nm). The structural, chemical, electrical, and optical properties of the AZO thin films were analyzed by X-ray diffraction, X-ray photoelectron spectroscopy, field-emssion scanning electron microscopy, atomic force microscopy, Hall measurement system, and UV-Vis spectrophotometry. As the thickness of the AZO thin films increased, the crystallinity of the AZO thin films gradually increased, and the surface morphology of the AZO thin films were transformed from a porous structure to a dense structure. The average surface roughnesses of the samples using atomic force microscopy were ~3.01 nm, ~2.89 nm, and ~2.44 nm, respectively. As the thickness of the AZO filmsincreased, the surface roughness decreased gradually. These results affect the electrical and optical properties of AZO thin films. Therefore, the thickest AZO thin films with 150 nm exhibited excellent resistivity (${\sim}7.00{\times}10^{-4}{\Omega}{\cdot}cm$), high transmittance (~83.2 %), and the best FOM ($5.71{\times}10^{-3}{\Omega}^{-1}$). AZO thin films fabricated using ALD may be used as a promising cadidate of TCO materials for optoelectronic applications.

• Korean Journal of Optics and Photonics
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• v.27 no.4
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• pp.143-150
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• 2016

The thickness of each layer in a multilayered system is determined by a Fourier-transform method using spectroscopic reflectance measurements. To verify this method, we first generate theoretical reflectance spectra for three layers, and these are fast-Fourier-transformed using our own Matlab program. Each peak of the Fourier-transformed delta function denotes the optical thickness of each layer, and these are transformed to physical thicknesses. The relative thickness error of the theoretical model is less than 1.0% while a layer's optical thickness is greater than 730 nm. A PI-(thin $SiO_2$)-PImultilayeredstructure produced by the bar-coating method was analyzed, and the thickness errors compared to SEM measurements. Even though this Fourier-transform method requires knowing the film order and the refractive index of each layer prior to analysis, it is a fast and nondestructive method for the analysis of multilayered structures.

• Journal of the Optical Society of Korea
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• v.12 no.2
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• pp.112-117
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• 2008

Single-mode propagation conditions of X-ray waveguides are investigated by numerical calculations in order to understand the importance of waveguide design parameters, such as core thickness and the optical constants of waveguide materials, on the transmission and coherence properties of the waveguide. The simulation code for mode analyzing is developed based on a numerical solution of the parabolic wave equation. The initial boundary value problem is solved numerically using a finite-difference scheme based on the Crank-Nicolson scheme. The E-field intensities in a core layer are calculated at an X-ray energy of 8.0 keV for air and beryllium(Be) core waveguides with different cladding layers such as Pt, Au, W, Ni and Si to determine the dependence on waveguide materials. The highest E-field intensity radiated at the exit of the waveguide is obtained from the Pt cladded beryllium core with a thickness of 20 nm. However, the intensity from the air core waveguide with Pt cladding reaches 64% of the Be-Pt waveguide. The dependence on the core thickness, which is the major parameter used to generate a single mode in the waveguide, is investigated for the air-Pt, and Be-Pt waveguides at an X-ray energy of 8.0 keV. The mode profiles at the exit are shown for the single mode at a thickness of up to 20 nm for the air-Pt and the Be-Pt waveguides.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.11 no.10
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• pp.903-910
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• 1998

Ti:LiNbO$_3$ optical waveguides have been fabricated by Ti-diffusion in wet oxygen atmosphere. The fabrication conditions of furnace temperature, diffusion time and bubbler temperature were 105$0^{\circ}C$, 8 hours and 9$0^{\circ}C$, respectively and Ti thickness was varied from 700$\AA$ to 1500$\AA$. In this paper, the nearfield patterns, mode sizes (hirizontal/vertical) and insertion loss of waveguides were discussed at wavelength 1550 nm ad function of Ti thickness. With the planar waveguide, the effective index change and diffusion depth were calculated at 632.8nm using the prism coupling method. From these results, the best Ti thickness in our conditions seems like to by 1200$\AA$~1300$\AA$.

• Korean Journal of Optics and Photonics
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• v.12 no.6
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• pp.472-478
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• 2001

We determined the optical constants and thickness of organic electroluminescence thin films using variable angle spectroscopic ellipsometry. Using the measured transmittance spectra and the spectroscopic ellipsomeoy data of the organic films on glass substrates in the optically transparent region, we determined the effective thickness and the refractive indices of organic thin films. Then by applying a numerical inversion method to variable angle spectro-ellipsometry data, we determined the complex refractive index at each wavelength including the optically absorbing region, as well as the thickness and surface micro-roughness of the organic thin films. The calculated transmittance spectra showed a tight agreement with the measured ones, confining the validity of the present model analysis.

• Atmosphere
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• v.25 no.3
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• pp.521-528
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• 2015

In this study star photometry was applied to retrieve aerosol optical thickness (AOT) at night. The star photometry system consisted of small refractor, optical filters, CCD camera, and driving mount and was located in Suwon. The calibration constants were retrieved from the astronomical Langley method but standard deviations of these were more than 10% of the mean values. After the calibration the nighttime AOT was retrieved and cloud-screened in clear six days from 25 Nov. 2014 to 17 Jan. 2015. To estimate the quality of the measurements the nighttime AOT was combined with daytime AOT retrieved from sky-radiometer that was located in Seoul and 17 km away from the star photometry system. In spite of the uncertainty of the calibration constants and the spatial difference of two observation systems, the temporal changes of the nighttime AOT coincided with the daytime. The nighttime ${\AA}ngstr{\ddot{o}}m$ exponent was about 20% lower and more variable than the daytime because of the uncertainty of the calibration constants. If the calibration process is more precise, the combination of star and sun or sky photometry system can monitor the air pollution day and night constantly.

• Korean Journal of Optics and Photonics
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• v.6 no.3
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• pp.245-256
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• 1995

Rugate filters of inhomogeneous refractive index were designed using the Fourier transform and the effect of reflectance, stop bandwidth, optical thickness, and Q function on the rugate filter was investigated. An iterative correction process using a merit function was employed to fit an initial design to the target spectrum. Three Q functions derived by Sossi, Bovard, and Fabricius, respectively, were compared in terms of the number of iteration, merit function, and optimum optical thickness. The result shows that after a number of iterations the Q functions by Bovard and Fabricius produce high rejection rugate filters closer to the target spectrum than the Sossi's Q function and the optimal optical thickness is determined by the stop-band width of the rugate filter. ilter.