• Proceedings of the Optical Society of Korea Conference
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• 2008.07a
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• pp.269-270
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• 2008

Single polarization modulation polariscopic microscope for visualization of cytoskeleton was proposed for the first time. Algorithm of the single polarization modulation polariscopic microscope has beeen explained and accuracy and precision of the single polarization modulation polariscopic microscope have been measured in this paper.

• Korean Journal of Optics and Photonics
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• v.10 no.4
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• pp.267-272
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• 1999

We attached a fiber tip on the branch of a quartz crystal oscillator in order to make a feedback control system for near field optical microscope. The electrical impedance of the quartz crystal oscillator depends on the distance between the surface of the sample and the tip caused by the surface damping. Using this method, we can directly monitor the distance between the sample and the tip without inserting extra beam which might give extra optical noise. We characterize the XY scanning resolution and the amplitude of the vibrating tip and the Z-dependent decay of the evanescent wave.

• Korean Journal of Optics and Photonics
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• v.14 no.1
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• pp.80-84
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• 2003

We have constructed a scanning confocal microscope by directly oscillating an optical fiber in two different ways. Either a piezoelectric transducer or a tuning fork was used for the oscillation. Six frames of $640{\times}480$ pixel image were obtained in a second with piezoelectric oscillation and only one image of the same size was obtained in a second with tuning fork oscillation. Oscillation of optical fiber did not cause amy distortion of confocal images.

• Journal of the Korean Society for Precision Engineering
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• v.14 no.11
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• pp.118-125
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• 1997

Non-contacting optical microscopes are increasingly used in recent industrial applications of probes for coordinate measuring machines. They have been found more efficient than conventional touch trigger porbes with ball tips especially in inspecting small-sized objects. There are two major factors affecting measuring accuracy: (1) geometric relations between coordinate systems, (2) magnification ratios of a microscope. In order to determine the magnification ratios exactly, optical imaging of edge was theroretically analyzed and practically adopted to image processing for edge detection. In addition, this paper proposes a geometric calibration method to obtain exact coordinates of measured points from the relations between the machine coordinate system and the image. In the method, the error according to the squareness between the machine axises was also removed. The method was practically adopted to a real coordinate measuring machine. An ultraprecision measurement of 0.2 um uncertainty can be practically achieved.

• Journal of the Korean Society for Precision Engineering
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• v.27 no.12
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• pp.15-21
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• 2010

Recently, there is a demand for a thermal imaging microscope in the medical field as well as the semi-conductor industry Although the demand of the advanced thermal imaging microscope has been increased, it is very difficult to obtain the technology of developing a thermal camera, because it is used for defense industry. We developed the ${\times}5$ zoom microscope which has $3\;{\mu}m$ spatial resolution to research the design and fabrication of the IR (Infrared) optical system. The optical system of the IR microscope consists of four spherical lenses and four aspheric lenses. We verified individual sensitivity of each optical parameter as the first order approach to the analysis. And we also performed structure and vibration analysis. The optical elements are fabricated using Freeform 700A. The measurement results of surface roughness and form accuracy using NT 2000 and UA3P are Ra 2.36 nm and P-V $0.13\;{\mu}m$. Finally we ascertained resolution power of $3\;{\mu}m$ using USAF (United State Air Force) 1951 IR resolution test chart.

• Current Optics and Photonics
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• v.5 no.3
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• pp.229-237
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• 2021

The capabilities of the near-field scanning optical microscope (NSOM) for obtaining high resolution lateral topographical images as well as for mapping the spectroscopic and optical properties of a sample below the diffraction limit of light have made it an attractive research field for most researchers dealing with optical characteristics of materials in nano scales. The apertured NSOM technique involves confining light into an aperture of sub-wavelength size and using it to illuminate a sample maintained at a distance equal to a fraction of the sub-wavelength aperture (near-field region). In this article, we present a setup for developing NSOM using a cantilever with a sub-wavelength aperture at the tip. A single laser is used for both cantilever deflection measurement and near-field sample excitation. The laser beam is focused at the apex of the cantilever where a portion of the beam is reflected and the other portion goes through the aperture and causes local near-field optical excitation of the sample, which is then raster scanned in the near-field region. The reflected beam is used for an optical beam deflection technique that yields topographical images by controlling the probe-sample in nano-distance. The fluorescence emissions signal is detected in far-field by the help of a silicon avalanche photodiode. The images obtained using this method show a good correlation between the topographical image and the mapping of the fluorescence emissions.

• Proceedings of the Optical Society of Korea Conference
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• 2001.02a
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• pp.122-123
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• 2001

본 연구에서는 주사 근접장 광학 현미경(Near-field Scanning Optical Microscope, 이하 NSOM이라 한다)을 이용하여 빛이 전파되고 있는 광 도파로 주변에 형성되는 evanescent field를 측정함으로써 광도파로 내부에서의 빛의 전파특성을 알아보았다. 광소자의 설계에 있어서 광도파로 내부에서의 빛이 어떻게 전파되어지는 가는 매우 중요한 인자가 된다. (중략)

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1997.10a
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• pp.233-236
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• 1997

In modem industry, the accuracy and the surface-finish requirements for machined parts have been becoming ever more stringent. Optical method in measurements is playing an important role in vibration measurement, crack and defect detection and surface topography with the advent of opto-mechatronics. In this study, the principle of the general confocal microscope is introduced for surface measurement, and the advanced confocal microscope that has better measuring speed than the traditional confocal microscope is developed. A study on improving the resolution of the advanced confocal microscope is followed. Finally, Software for data acquisition and analysis of various parameters in surface geometrical features has been developed.

• The Journal of the Korea institute of electronic communication sciences
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• v.14 no.5
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• pp.871-876
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• 2019

We fabricated concave optical fiber tips using hydrofluoric acid solution and photothermal effect induced by $1.55{\mu}m$ wavelength laser applied to an optical fiber. The radius of curvature of the concave optical fiber tips fabricated with different applied laser power, etching time, and concentration of hydrofluoric acid was measured with an optical microscope. Then, we analyzed how the radius of curvature changes for those three variables. In addition, the reliability of the measurement method using a microscope was verified through a free spectral range(FSR) and a scanning electron microscope(SEM). Through this paper, the radius of curvature can be adjusted by the variables of the fabrication process of concave optical fiber tips; thus, it is overcoming the limitations of conventional optical fiber etching methods using hydrofluoric acid solutions.

• Korean Journal of Optics and Photonics
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• v.13 no.4
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• pp.301-307
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• 2002

The propagation characteristic of an optical waveguide was investigated by measuring with a near-field scanning optical microscope (NSOM) the evanescent field formed at the neighbor of its core-cladding interface. For this purpose, the NSOM system was developed specially as a form of Photon scanning tunneling microscope. The evanescent field distributions of several channel waveguides were measured at the wavelength of 1550 ㎚, and the usefulness of the system was verified by comparing experimental results with simulation results. In particular, the interference phenomena of the guided modes during their propagation along a multimode channel waveguide could be observed directly from the measured evanescent field distribution.