• Title/Summary/Keyword: Optical Fault

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Relationships between Carrier Lifetime and Surface Roughness in Silicon Wafer by Mechanical Damage (기계적 손상에 의한 실리콘 웨이퍼의 반송자 수명과 표면 거칠기와의 관계)

  • 최치영;조상희
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.12 no.1
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    • pp.27-34
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    • 1999
  • We investigated the effect of mechanical back side damage in viewpoint of electrical and surface morphological characteristics in Czochralski silicon wafer. The intensity of mechanical damage was evaluated by minority carrier recombination lifetime by laser excitation/microwave reflection photoconductance decay technique, atomic force microscope, optical microscope, wet oxidation/preferential etching methods. The data indicate that the higher the mechanical damage degree, the lower the minority carrier lifetime, and surface roughness, damage depth and density of oxidation induced stacking fault increased proportionally.

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Response characteristic of over current relay using optical sensor (광센서를 이용한 과전류 보호계전의 응답특성 연구)

  • 박병석;안성준;조홍근
    • 제어로봇시스템학회:학술대회논문집
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    • 1997.10a
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    • pp.1364-1366
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    • 1997
  • To operate electric power systems economically and stably, and to supply the electric power of good quality, it is necessary that the measured information (current, voltage, and so on) be detected and transmutted with high reliability and high effieincy. For the reason, the optical magnetic field sensor is possible to rapidly detect to over current and recover when electric power line have fault. In addition, the optical sensor have no electro magnetic distortion and no electric insulation. In this study, we designed OCR(Over Current Relay) using optical sensor. The designed OCR using optical sensor was measured characteristic and compared contentional OCR. This system have highest optical advantages and reliability.

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Real-time Monitoring of Ethernet Passive Optical Network Using Burst-mode FBGs

  • Binh, Nguyen Khac;Choi, Su-il
    • Current Optics and Photonics
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    • v.4 no.3
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    • pp.186-192
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    • 2020
  • This paper describes a real-time monitoring system in Ethernet passive optical networks (EPON) that uses burst-mode fiber Bragg grating (FBG) optical sensors. The FBG interrogation unit in the optical line terminal (OLT) transmits the monitoring wavelength to optical network units (ONUs). The FBG sensor unit in each ONU returns a burst-mode monitoring signal to the OLT. As the system applies time division multiple access (TDMA), a uniform Bragg wavelength can be used to monitor the EPON system. The FBG interrogation unit analyzes the received burst-mode monitoring signals and outputs fault information on the ONU branches in EPON. The simulation results show the effectiveness of the proposed monitoring system based on TDMA. In addition, we compared the proposed TDMA-based monitoring system with a WDMA-based monitoring system.

Efficient Test Techniques for Submarine Cable Repair (해저광케이블 수리를 위한 효율적인 탐지 및 측정 기법)

  • Lee, Young-Sun;Jung, Jae-Jin;Shin, Hyun-Sik
    • The Journal of the Korea institute of electronic communication sciences
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    • v.3 no.1
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    • pp.1-7
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    • 2008
  • Submarine cable is the most important IT infrastructure for international communication across oceans. However, a cable fault rarely happens by ship's anchor, fishing gears, submarine earthquake, and so on, and we need to improve on repair time for the reducing expenses of cable repair ship as well as the stability of high-capacity submarine optical network. There are several kinds of cable faults such as Shunt fault, Cable cut, Open fault and Fiber break. When a fault is occurred, cable landing stations(CLS) have to analysis failure quickly and accurately to find the type and the location of a cable fault. During the repair period, CLS should swiftly perform the tests requested by cable repair ship. In order to make rapid progress on cable repair, CLS test technique is very important. So, in order to reduce the repair time, this paper is studying the CLS test techniques of locating a submarine cable fault and of checking the splicing point performed by cable repair ship.

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Use of In-Situ Optical Emission Spectroscopy for Leak Fault Detection and Classification in Plasma Etching

  • Lee, Ho Jae;Seo, Dong-Sun;May, Gary S.;Hong, Sang Jeen
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.13 no.4
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    • pp.395-401
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    • 2013
  • In-situ optical emission spectroscopy (OES) is employed for leak detection in plasma etching system. A misprocessing is reported for significantly reduced silicon etch rate with chlorine gas, and OES is used as a supplementary sensor to analyze the gas phase species that reside in the process chamber. Potential cause of misprocessing reaches to chamber O-ring wear out, MFC leaks, and/or leak at gas delivery line, and experiments are performed to funnel down the potential of the cause. While monitoring the plasma chemistry of the process chamber using OES, the emission trace for nitrogen species is observed at the chlorine gas supply. No trace of nitrogen species is found in other than chlorine gas supply, and we found that the amount of chlorine gas is slightly fluctuating. We successfully found the root cause of the reported misprocessing which may jeopardize the quality of thin film processing. Based on a quantitative analysis of the amount of nitrogen observed in the chamber, we conclude that the source of the leak is the fitting of the chlorine mass flow controller with the amount of around 2-5 sccm.

Implementation of Optical Magnetic Field Sensor for Measurement of Over Current (과전류 계측을 위한 광자계센서의 구현)

  • Park, Hae-Soo;Roh, Jong-Dae;Kim, Yo-Hee;Park, Byung-Seok;Ahn, Seong-Joon;Jo, Hong-Keun
    • Proceedings of the KIEE Conference
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    • 1997.07e
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    • pp.1871-1873
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    • 1997
  • The conventional current transformers are often take faults and out of order that for detect to over current of electric power lines because electromagnetic interference. But, it is possible to implement protection relay of high reliability using optical magnetic field sensor which are immunity and small size. The optical magnetic field sensor is possible to rapidly detect to over current and recover when electric power line have fault. And it is not necessary to make with capacitance of electric power lines as optical magnetic field sensor is have linearity from 0 to about 20kA. In this study, we designed and constructed compensative feedback circuit in order to minimize of optical power intensity variation with environ- mental variations(temperature, drive current) of light source. And this system have highest optical advantages and reliability.

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Fault Analysis of Semiconductor Device (반도체 장치의 결함해석)

  • Park, S.J.;Choi, S.B.;Oh, C.S.
    • Journal of Energy Engineering
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    • v.25 no.1
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    • pp.192-197
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    • 2016
  • We have surveyed on technical method of fault analysis of semiconductor device. Fault analysis of semiconductor should first be found the places of fault spots. For this process they are generally used the testers; EB(emission beam tester), EM(emission microscope), OBIRCH(optical beam induced resistance change method) and LVP(laser voltage probing) etc. Therefore we have described about physical interpretation and technical method in using scanning electron microscope, transmission electron microscope, focused ion beam tester and Nano prober.

(A Study on the Control Mechanism for Network Survivability in OVPN over IP/GMPLS over DWDM) (DWDM기반의 OVPN에서 네트워크 생존성을 위한 제어 메커니즘 연구)

  • Cho Kwang-Hyun;Jeong Chang-Hyun;Hong Kyung-Dong;Kim Sung-Un
    • Journal of the Institute of Electronics Engineers of Korea TC
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    • v.42 no.9 s.339
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    • pp.85-96
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    • 2005
  • A ' Virtual Private Network (YPN) over Internet' has the benefits of being cost-effective and flexible. However, given the increasing demands for high bandwidth Internet and for reliable services in a 'VPN over Intemet,' an IP/GMPLS over DWDM backbone network is regarded as a very favorable approach for the future 'Optical VPN (OVPN)' due to the benefits of transparency and high data rate. Nevertheless, OVPN still has survivability issues such that a temporary fault can lose a large amount of data in seconds, moreover unauthorized physical attack can also be made on purpose to eavesdrop the network through physical components. Also, logical attacks can manipulate or stop the operation of GMPLS control messages and menace the network survivability of OVPN. Thus, network survivability in OVPN (i.e. fault/attack tolerant recovery mechanism considering physical structure and optical components, and secured transmission of GMPLS control messages) is rising as a critical issue. In this Paper, we propose a new path establishment scheme under shared risk link group (SRLG) constraint for physical network survivability. And we also suggest a new logical survivability management mechanism by extending resource reservation protocol-traffic engineering extension (RSVP-TE+) and link management protocol (LMP). Finally, according to the results of our simulation, the proposed algorithms are revealed more effective in the view point of survivability.

Analysis on System Effects of SUS Tube in Optical Fiber Composite Power Cable Systems Using EMTP (EMTP를 이용한 광 복합 지중송전케이블 광 유니트 금속관의 시스템 영향분석)

  • Jung, Chae-Kyun;Jang, Tai-In;Kang, Ji-Won
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.63 no.9
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    • pp.1180-1185
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    • 2014
  • This paper describes the effects on SUS tube of power optical fiber composite cable on underground transmission lines. The effects on grounding, air gap between SUS tube and metal sheath, contact resistance between outer semi-conducting layer and metal sheath and grounding of SUS tube application or not are variously analysed using EMTP in normal operating condition as well as single line to ground fault. From these results, in this paper, the scheme for protecting the electrically abnormal phenomena will be established on power-optical fiber composite cable of underground transmission lines. This paper can contribute to specification of grounding reference of SUS tube of optical fiber composite power cable system.