An Experimental Study on the Low Noise Property of the Bipolar Junction Transistor Fabricated by HCI Gettering (HCI Gettering Oxidation을 이용한 BJT의 저잡음화에 관한 실험적 연구)
-
- Journal of the Korean Institute of Telematics and Electronics
- /
- v.21 no.1
- /
- pp.7-12
- /
- 1984