• 정보저장시스템학회논문집
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• 제5권2호
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• pp.64-69
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• 2009

In this paper, we investigate field distribution and interference pattern in the exit pupil and in the focal region. Also, we compare with metal and dielectric substrate for near-field recording. To obtain field distribution, we use modified vector diffraction theory and Zernike Polynomials. Finally, we design and optimize refractive index and thickness of disk for near-field surface recording and cover-layer incident recording.

• 한국정밀공학회지
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• 제22권5호
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• pp.80-86
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• 2005

Optical performance evaluation results and an interference fringe pattern analysis of alignment errors for an optical head of a near-field receding (NFR) system are presented. The focusing unit is an optical head of a NFR system and is composed of a solid immersion lens (SIL) and an objective lens (OL). Generally, the size of the focusing unit is smaller than that of the conventional optical recording head. Hence there are difficulties to assemble the small focusing unit precisely. We composed an evaluation system with an interferometer and evaluated some focusing unit samples aligned and assembled by manual and present the obtained results. Using the conventional optical tool, Code V, a tolerance analysis of the alignment error between the SIL and the objective lens and an interference pattern analysis for the assembly error are executed. Then, through an analysis of the simulation results, the conceptual auto-alignment methodology using a neural network approach is considered.

• 전기전자학회논문지
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• 제22권2호
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• pp.510-513
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• 2018

최근 전자파 적합성(EMC: electromagnetic compatibility)의 중요성이 매우 높아짐에 따라 칩 수준에서의 전자파 간섭(EMI: electromagnetic interference) 측정이 자주 요구되고 있다. IEC 61967 및 IEC 62508에서 규정된 근거리 전자장 스캐닝(NFS: near-field scanning) 시스템은 칩 레벨에서의 전자파 간섭을 분석하는 대표적인 방법이다. 칩이 점점 고속화되면서 근거리 전자장 스캐닝 시스템의 측정 주파수는 광대역화되어야 하지만 근거리 전자장 탐침(NFP: near-field probe)의 신호 대 잡음 비(SNR: signal-to-noise ratio)가 저하된다는 문제가 있다. 본 논문에서는 근거리 전자장 스캐닝 시스템에서 광대역 특성을 가지면서도 잡음 대 성능 비를 향상시키는 기술에 대해 살펴본다.

• 정보저장시스템학회:학술대회논문집
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• 정보저장시스템학회 2005년도 추계학술대회 논문집
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• pp.14-15
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• 2005

In near-field recording (NFR) optics using solid immersion lens (SIL), near-field air gap induces unwanted spherical aberration, defocus and astigmatism. This phenomenon can be explained with the apodization of phase and amplitude between each linearly polarized light. In this paper, we analyzed the effect of phase and amplitude apodization with the fundamental multiple beam interference theory, and we compared resultant diffracted patterns on the image plane for the Si-disk first surface media structure and cover-layer incident media structure.

• 한국항공우주학회지
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• 제48권10호
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• pp.753-763
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• 2020

29.7% 축소 NASA Common Research Model을 벨리 스팅 모형지지부에 장착하여 저속에서 풍동시험을 수행하였다. 다양한 형상의 페어링을 장착한 벨리 스팅 모형지지부에 대하여 공력계수를 측정하는 시험을 수행하였으며 그 결과를 고찰하였다. 벨리 스팅 모형지지부에 장착된 CRM 형상을 이용하여 힘과 모멘트를 측정하였다. 벨리 스팅 페어링 형상 변화에 따른 피칭모멘트로부터 벨리 스팅 간섭 효과를 감소시키는 형상을 찾았다. 전산해석을 통해 벨리 스팅 모형지지부의 간섭과 시험부 페어링의 간섭 감소효과를 확인하였다.

• Journal of the Korean Physical Society
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• 제73권11호
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• pp.1698-1702
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• 2018

We simulate the light transmission through an extremely small nanoscale aperture having a 10 nm diameter punctured in a metal film positioned at the center of a plasmonic bull's eye grating. A considerable directive emission of transmitted light with a divergence angle of 5.7 degrees was observed at $10{\mu}m$ from the nanohole opening at the frequency of surface plasmon polariton excitation, an confirmed by measuring the distance dependent transmission amplitude. Observations of the electric field in cross-sectional, near-field, and far-field views near-field enhancement associated with the surface plasmon excitation, and the interference of the electric field light through the nanohole in the near-field region is responsible for such a considerable directive emission.

• 대한기계학회논문집
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• 제18권6호
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• pp.1474-1482
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• 1994

In order to study the influence of a circular inclusion on a stress field neat a crack tip, mutual interference of a crack and the circular inclusion is analyzed by using the two dimensional boundary element method program made for the analysis of a bimaterial inclusion. The stress intensity factor of an inclusion which has small stiffness is a little greater than that of large stiffness in the near-by crack tip, and similar values tends to appear for distant crack tips. A line crack shows the repetition phenomena which caused by stress mutual interference depending on the radius and stiffness of an inclusion, and the repetition phenomena becoms weak in the inclusion which has large stiffness. Stress mutual interference shows repetition phenomena after extension of a line crack by the length of the radius of the inclusion which has small stiffness.

• 한국군사과학기술학회지
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• 제5권2호
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• pp.116-122
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• 2002

Electro Explosive Devices can be susceptible to electromagnetic interference. When these components are exposed to external electromagnetic fields, it may cause to induce sufficient current to generate enough heat for an inadvertent detonation. It is almost impossible to monitor the event of firing throughout the electromagnetic environment test. The survivability of EED for hazards of electromagnetic radiation is investigated. A fiber optic sensor is installed near the bridge wire after removing explosive material in order to measure the induced current on the bridge wire. The length of lead-wire of the EED fabricated is around 15 cm.

• Bulletin of the Korean Chemical Society
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• 제28권12호
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• pp.2195-2199
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• 2007

We demonstrate that high-resolution (~60 nm) near-field fluorescence images of fluorescent nanospheres can be obtained by utilizing the tip-induced fluorescence quenching process. A time-stamped photon counting (TSPC) technique employed enables us to efficiently measure the degree of fluorescence quenching caused by the dielectric or metallic atomic force microscopy tip. We find that the degree of quenching is not only determined by the tip-material but also by the local morphology of the tip. The fringe patterns around individual nanospheres observed are explained in terms of the interference between the excitation field that is directly induced by the laser source, and the scattered excitation field from the tip.

• 한국군사과학기술학회지
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• 제11권6호
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• pp.74-80
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• 2008

Analysis of the electromagnetic environment on topside of a ship is needed for optimal arrangement of all kinds of antennas to be installed on the shipboard in order to minimize the probability of EMI of equipment and subsystems in real ship after construction phase. In this paper we analyze the characteristics of electric-fields such as radiation patterns and near E-fields of V/UHF antennas installed on a shipboard. We compare simulated results with measurements on the real ship for near E-fields to verify the reliability of the computed electromagnetic environment. Although there are various factors causing errors such as cable loss and impedance mismatching etc. when measuring near E-field, both data show similar trends in the range of the acceptable tolerance.