• Applied Microscopy
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• 제42권4호
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• pp.223-227
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• 2012

Focused Ion Beam (FIB) systems have incorporated versatile nanomanipulators with inherent sophisticated machining capability to characterize the electrical properties of highly miniature components of electronic devices. Carbon fibers were chosen as a model system to test the applicability of nanomanipulators to microscale electronic materials, with special emphasis on the direct current current-voltage characterizations in terms of electrode configuration. The presence of contact resistance affects the electrical characterization. This resistance originates from either i) the so-called "spreading resistance" due to the geometrical constriction near the electrode - material interface or ii) resistive surface layers. An appropriate electrode strategy is proposed herein for the use of FIB-based manipulators.

• Applied Microscopy
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• 제45권4호
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• pp.208-213
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• 2015

Nanomanipulators installed in focused ion beam (FIB), which is used in the lift-out of lamella when preparing transmission electron microscopy specimens, have recently been employed for electrical resistance measurements, tensile and compression tests, and in situ reactions. During the pick-up process of a single nanowire (NW), there are crucial problems such as Pt, C and Ga contaminations, damage by ion beam, and adhesion force by electrostatic attraction and residual solvent. On the other hand, many empirical techniques should be considered for successful pick-up process, because NWs have the diverse size, shape, and angle on the growth substrate. The most important one in the in-situ precedence, therefore, is to select the optimum pick-up process of a single NW. Here we provide the advanced methodologies when manipulating NWs for in-situ mechanical and electrical measurements in FIB.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2003년도 춘계학술대회
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• pp.1059-1064
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• 2003

This paper presents an overview of the mechanical properties of carbon nanotubes. The characteristics of carbon nanotubes were briefly introduced. We then present briefly the experimental techniques used to measure mechanical properties and the results obtained by other researchers. A carbon nanotube is too small to be pulled apart with standard tension devices. Manipulators should be used for mechanical testing. We introduced manipulation methods using nanomanipulators under field-emission scanning-electron microscope.

• 한국분말재료학회지
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• 제16권2호
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• pp.138-145
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• 2009

FIB와 나노메니퓰레이터를 이용한 다양한 nano manufacturing을 통해 단일 나노선 소자제작 및 평가가 가능하였으며 또한 나노물질 자체의 전기적, 기계적 특성 평가를 수행할 수 있었다. 나노메니퓰레이터를 나노선에 직접 접촉시켜 전기적 특성을 평가하는 기술은 STA 등과 함께 사용될 때 높은 신뢰도를 갖는 신호를 얻을 수 있었다. 특히, 이를 이용한 나노 소재 특성 평가기술은 소자제작 시간을 단축시킬 수 있고 패턴닝으로부터 화학적 오염을 줄일 수 있는 장점을 갖고 있었다. 또한 FIB와 나노메니퓰레이터를 적절히 이용하면 나노인장시험기로서 활용이 가능하였으며 나노선의 기계적 특성을 본격적으로 평가할 수 있었다. 본 연구의 나노인장시험으로부터 얻은 인장실험 및 TEM분석으로부터 Au 및 Pd 나노선의 인장 및 파괴거동을 직접적으로 관찰할 수 있었다. Au 나노선은 인장초기에 {111}<112> 쌍정이 생성되고 나노선의 직경이 감소하다가 더 이상 인장응력을 수용할 수 없게되면 <110> 축으로부터 <002> 방향으로 재배열하는 방식으로 네킹이 형성되며 최종적으로 결정축 재배열 이후에는 슬립에 의한 파괴가 진행된다. Pd 나노선의 경우에는 Au와는 전혀 다른 파괴거동을 보였다. 먼저 네킹없이 <002> 축으로의 재배열 현상이 관찰되며 이후 cross-slip에 의한 변형을 하였다. 두 나노선 모두 인장 응력이 가해지면 네킹 부분을 중심으로 한 부분에서만 변형이 일어나며 다른 부분에서는 아무런 변형을 찾아 볼 수 없었다.

• 한국공작기계학회:학술대회논문집
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• 한국공작기계학회 2004년도 춘계학술대회 논문집
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• pp.530-537
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• 2004

Development of a versatile nanomanipulation tool is an overarching theme in nanotechnology. Such a tool will likely revolutionize the field given that it will enable fabrication and operation of a wealth of interesting nanodevices. This study seeks funding to create a novel nanomanipulation system with the ultimate goal of using this system for nanomanufacturing at the molecular level. The proposed design differs from existing approaches. It is based on a nanoscale ion trap integrated to a scanning prove microscope (SPM) tip. In this design, molecules to be assembled will be ionized and collected in the nanoscale ion trap all in an ultra high vacuum (UHV) environment. Once filled with the molecular ions, the nanoscale ion trap-SPM tip will be moved on a substrate surface using scanning probe microscopy techniques. The molecular ions will be placed at their precise locations on the surface. By virtue of the SPM, the devices that are being nanomanufactured will be imaged in real time as the molecular assembly process is carried out. In the later stages, automation of arrays of these nanomanipulators will be developed.