Electrical Characterization of Electronic Materials Using FIB-assisted Nanomanipulators |
Roh, Jae-Hong
(Nano-analysis Center, Korea Institute of Science & Engineering)
You, Yil-Hwan (Department of Materials Science & Engineering, Hongik University) Ahn, Jae-Pyeong (Nano-analysis Center, Korea Institute of Science & Engineering) Hwang, Jinha (Department of Materials Science & Engineering, Hongik University) |
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