• 제목/요약/키워드: Nano-thickness

검색결과 842건 처리시간 0.031초

Aeroelastic behavior of nano-composite beam-plates with double delaminations

  • Mousavi, S.B.;Yazdi, Ali A.
    • Steel and Composite Structures
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    • 제33권5호
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    • pp.653-661
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    • 2019
  • In this paper aeroelastic behavior of 3-phase nano-composite beam-plate with double delaminations is investigated. It is tried to study the effect of carbon nano-tubes (CNTs) on critical flutter pressure of reinforced damaged nano-composite structures. In this case, the CNTs are appending to the polymer matrix uniformly. The Eshelby-Mori-Tanaka model is used to obtain the effective material properties of 3-phase nano-composite beam-plate. To investigate the aeroelastic behavior of delaminated beam-plate subjected to supersonic flow, it is assumed that the damaged segments are forced to vibrate together. The boundary conditions and auxiliary conditions at edges of delaminated segments are used to predict critical flutter pressure. The influence of CNTs and different delamination parameters such as delamination length, axial position and its position through thickness are investigated on critical flutter pressure.

DGMOSFET에서 채널길이와 두께 비에 따른 문턱전압변화분석 (Analysis of Threshold Voltage Roll-off for Ratio of Channel Length and Thickness in DGMOSFET)

  • 정학기
    • 한국정보통신학회:학술대회논문집
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    • 한국해양정보통신학회 2010년도 춘계학술대회
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    • pp.765-767
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    • 2010
  • 본 연구에서는 상단게이트와 하단게이트를 갖는 더블게이트 MOSFET에서 채널길이와 채널두께의 비에 따른 문턱전압의 변화에 대하여 분석하였다. 더블게이트 MOSFET는 두개의 게이트를 가지고 있기 때문에 전류제어 능력이 기존 MOSFET의 두배에 가깝고 나노소자에서 단채널효과를 감소시킬 수 있다는 장점이 있다. MOSFET에서 채널길이와 채널두께는 소자의 크기를 결정하며 단채널효과에 커다란 영향을 미치고 있다. 채널길이가 짧아지면서 채널두께와의 비에 따라 단채널효과 중 문턱전압의 변화가 크게 영향을 받고 있다. 그러므로 이 연구에서는 DGMOSFET에서 채널길이와 채널두께의 비를 변화시키면서 문턱전압의 변화를 분석할 것이다.

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PECVD를 이용한 DLC 두께 제어에 따른 간섭색 구현 (Tuning the Interference Color with PECVD Prepared DLC Thickness)

  • 박새봄;김광배;김호준;김치환;최현우;송오성
    • 한국재료학회지
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    • 제31권7호
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    • pp.403-408
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    • 2021
  • Various surface colors are predicted and implemented using the interference color generated by controlling the thickness of nano-level diamond like carbon (DLC) thin film. Samples having thicknesses of up to 385 nm and various interference colors are prepared using a single crystal silicon (100) substrate with changing processing times at low temperature by plasma-enhanced chemical vapor deposition. The thickness, surface roughness, color, phases, and anti-scratch performance under each condition are analyzed using a scanning electron microscope, colorimeter, micro-Raman device, and scratch tester. Coating with the same uniformity as the surface roughness of the substrate is possible over the entire experimental thickness range, and more than five different colors are implemented at this time. The color matched with the color predicted by the model, assuming only the reflection mode of the thin film. All the DLC thin films show constant D/G peak fraction without significant change, and have anti-scratch values of about 19 N. The results indicate the possibility that nano-level DLC thin films with various interference colors can be applied to exterior materials of actual mobile devices.

롤러 가압 임프린트 공정에서 잔류막 두께 예측에 관한 연구 (A Study on the expectation of residual layer thickness in roller pressing imprint process)

  • 조영태;정윤교
    • 한국기계가공학회지
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    • 제12권1호
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    • pp.104-109
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    • 2013
  • In order to apply nano imprint technology in large area process, roller pressing is promising because of its low cost and high productivity. When pressing mold by roller, liquid resin is locally squeezed between mold and substrate. In this study, the main focus is to understand which process parameter affects residual layer. To do this, a simple analytical model was introduced. Especially, we consider the aspect ratio of patterns as essential cause of variation of the thickness in the equation. As a result, when the aspect ratio of pattern in the mold increases, the thickness of residual layer also increases. In conclusion, we show that the uniformity of residual layer could be accomplished by the control of velocity and pressing force in roller pressing imprint process.

PC소재의 선형 패턴 제작에 관한 연구 (A study on Linear Pattern Fabrication of Plate-type PC)

  • 정유나;이은경;강충길
    • 한국소성가공학회:학술대회논문집
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    • 한국소성가공학회 2008년도 춘계학술대회 논문집
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    • pp.277-280
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    • 2008
  • Recently, a demand of nano/micro patterned polymer for display or biochip has been rising. Then many studies have been carried out. Nano/micro-embossing is a deformation process where the workpiece materials is heated to permit easier material flow and then forced over a planar patterned tool. In this work, the hot-emboss process is performed with different forming conditions; forming temperature, load, press hold time, to get the proper condition for linear pattern fabrication on plated-type polymers (PC). Replicated pattern depth increases in proportion to the forming temperature, load and time. Reduction of the workpiece thickness increases according to press hold time. In process of time, reduction ratio of workpiece thickness decreases because of surface area increment of the workpiece and pressure decline on it.

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폴리스티렌 나노 비드를 이용한 플라즈모닉 나노 구조체의 광학 특성 (Optical Characteristics of Plasmonic Nano-structure Using Polystyrene Nano-beads)

  • 김두근;정병규;김홍승;김태룡;김선훈;기현철;김태언;신재철;최영완
    • 한국전기전자재료학회논문지
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    • 제28권4호
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    • pp.244-248
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    • 2015
  • We proposed and demonstrated the double layered metallic nano-hole structure using polystyrene beads process to enhance the sensitivity of surface plasmon resonance (SPR). The double layered SPR structures are calculated using the finite-difference time-domain (FDTD) method for the width, thickness, and period of the metallic nano-hole structures. The thickness of the metal film and the metallic nano-hole is 30 and 20 nm in the 214 nm wide nano-hole size, respectively. The double layered SPR structures are fabricated with monolayer polystyrene beads of 420 nm wide. The sensitivities of the conventional SPR sensor and the double layered SPR sensor are obtained to 42.2 and 52.1 degree/RIU, respectively.

단결정 실리콘 태양전지의 광 포획 효과 개선을 위한 Ag nano-dots 구조 적용 연구 (A Study on the Application of Ag Nano-Dots Structure to Improve the Light Trapping Effect of Crystalline Silicon Solar Cell)

  • 최정호;노시철;서화일
    • 반도체디스플레이기술학회지
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    • 제18권3호
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    • pp.19-24
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    • 2019
  • In this study, the Ag nano-dots structure was applied to the textured wafer surface to improve the light trapping effect of crystalline silicon solar cell. The Ag nano-dots structure was formed by the annealing of Ag thin film. Ag thin film deposition was performed using a thermal evaporator. The effect of light trapping was compared and analyzed through light reflectance measurements. The optimization process of the Ag nano-dots structure was made by varying the thickness of Ag thin film, the annealing temperature and time. The thickness of Ag thin films was in the range of 5 ~ 20 nm. The annealing temperature was in the range of 450~650℃ and the annealing time was in the range of 30 ~ 60 minutes. As a result, the light reflectance of 10 nm Ag thin film annealed at 650℃ for 30 minutes showed the lowest value of about 9.67%. This is a value that is about 3.37% lower than the light reflectance of the sample that has undergone only the texturing process. Finally, the change of the light reflectance by the HF treatment of the sample on which the Ag nano-dots structure was formed was investigated. The HF treatment time was in the range of 0 ~ 120 seconds. As a result, the light reflectance decreased by about 0.41% due to the HF treatment for 75 seconds.

기계.화학적인 연마에서 슬러리의 특성에 따른 나노토포그래피의 영향과 numerical시뮬레이션 (Effect of Slurry Characteristics on Nanotopography Impact in Chemical Mechanical Polishing and Its Numerical Simulation)

  • Takeo Katoh;Kim, Min-Seok;Ungyu Paik;Park, Jea-Gun
    • 한국재료학회:학술대회논문집
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    • 한국재료학회 2003년도 추계학술발표강연 및 논문개요집
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    • pp.63-63
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    • 2003
  • The nanotopography of silicon wafers has emerged as an important factor in the STI process since it affects the post-CMP thickness deviation (OTD) of dielectric films. Ceria slurry with surfactant is widely applied to STI-CMP as it offers high oxide-to-nitride removal selectivity. Aiming to control the nanotopography impact through ceria slurry characteristics, we examhed the effect of surfactant concentration and abrasive size on the nanotopography impact. The ceria slurries for this study were produced with cerium carbonate as the starting material. Four kinds of slurry with different size of abrasives were prepared through a mechanical treatment The averaged abrasive size for each slurry varied from 70 nm to 290 nm. An anionic organic surfactant was added with the concentration from 0 to 0.8 wt %. We prepared commercial 8 inch silicon wafers. Oxide Shu were deposited using the plasma-enhanced tetra-ethyl-ortho-silicate (PETEOS) method, The films on wafers were polished on a Strasbaugh 6EC. Film thickness before and after CMP was measured with a spectroscopic ellipsometer, ES4G (SOPRA). The nanotopogrphy height of the wafer was measured with an optical interferometer, NanoMapper (ADE Phase Shift)

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전자빔 용접된 Cu / STS 304강의 미세조직에 관한 연구 (Microstructure of Electron Beam Welded Cu / STS 304 Dissimilar Materials)

  • 박경태;김인호;백준호;천병선
    • Journal of Welding and Joining
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    • 제28권2호
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    • pp.47-53
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    • 2010
  • According to the research report for the recent a few years, the dissimilar welding of Cu and STS 304 alloy have been presented that a weldability is very poor. This article present a study on Lap joint by Electron beam welding dissimilar materials. The weld metals was constituted between pure copper and STS 304 steel. The experiment was performed with 125mA welding current, 520mA focusing current. The Vacuum condition of chamber is 5${\times}$10-5torr and welding speed is 300mm/min. Showing the bead shape of weld metal, the thickness of the stainless 304 using as the protect materials is 3mm and the thickness of a copper is 15mm. The analysis about the microstructure were carried out in which it was observed with SEM. The results showed that complex heterogeneous fusion zone microstructure characterized both by rapid cooling and mixing of the molten metal, however the liquation crack was formated in the fusion line.

글라스 기판위에 증착한 CdS 박막의 광전특성 평가 (Photo-conductive properties of CdS thin film deposited on glass substrate)

  • 웬마이프엉;허성기;김의태;윤순길
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2007년도 하계학술대회 논문집 Vol.8
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    • pp.338-338
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    • 2007
  • Photo-conductive properties of CdS films deposited on glass substrates by a reactive sputtering in Ar atmosphere were characterized as a function of working pressure and the film thickness. The XRD measurements of CdS films revealed obvious (002) preferred orientation. In 300nm-thick of films, difference between dark and photo-resistance increases with increasing working pressure within the films. The films at 5 mTorr of working pressure show a dark resistance of approximately $1\;{\times}\;10^6\;{\Omega}/{\square}$ and a photo-resistance of $3\;{\times}\;10^4\;{\Omega}/{\square}$. The decrease dark- and photo-resistance of films as thickness decrease were $1.4\;{\times}\;10^6$ and $3\;{\times}\;10^4\;{\Omega}/{\square}$, respectively. CdS films deposited on glass substrates are considered tobe suitable for photo-conductivity materials in stealth radome applications.

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