• 제목/요약/키워드: Nano-scale Process

검색결과 253건 처리시간 0.023초

알루미늄 마이크로 박판소재의 방향성에 관한 실험적 연구 (An experimental study on the oriented mechanical properties of aluminum micro thin foil material)

  • 이혜진;이낙규;최석우;이형욱;최태훈;황재헉;곽동기
    • 한국소성가공학회:학술대회논문집
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    • 한국소성가공학회 2005년도 추계학술대회 논문집
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    • pp.295-298
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    • 2005
  • This paper is concerned with the precision material property measurement of a micro metal thin foil that is used in MEMS technology. Since these MEMS components require great precision and accuracy, evaluation of reliability such as the lift cycle endurance test, impact test, and residual stress test is necessary for these components. However, in practice, real reliability tests are not easy to perform due to consideration of various factors. Rather than actual testing, it would be much easier to evaluate the reliability of components by the analytical approach. Although the analytical method is utilized by software tools, it is obviously necessary to acquire fundamental properties of materials through real test methods. In this paper, the oriented mechanical properties of aluminum thin foil are measured by nano scale material property measurement system.

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용매 열처리법을 통한 diketopyrrolopyrroles 화합물의 안료화 및 그 특성 (Pigmentation of Diketopyrrolopyrroles Compound through Solvent Thermal-treatment and Its Property)

  • 김재환;양석원;김대성;우관주;이근대;박성수
    • 공업화학
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    • 제25권4호
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    • pp.357-362
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    • 2014
  • 본 연구에서는 높은 은폐력과 선명한 색상을 나타내는 diketopyrrolopyrroles (DPP) red 254 안료를 제조하기 위하여 미리 합성한 DPP red 254 crude를 용매 열처리 온도, 유도체 첨가 또는 볼밀링 조건들이 조합된 용매 열처리 공정을 통하여 얻어진 시료들의 물성을 비교 분석하였다. 시료의 특성은 FT-IR, UV-Vis 분광기, TEM, PSA, BET surface area analyzer, viscometer 및 spectrophotometer를 이용하여 분석하였다. 합성한 DPP red 254 crude를 볼밀링 나노화하고 용매 열처리하는 방법이 매우 효과적인 안료화 공정임을 확인하였다.

Terabit-per-square-inch Phase-change Recording on Ge-Sb-Te Media with Protective Overcoatings

  • Shin Jin-Koog;Lee Churl Seung;Suh Moon-Suk;Lee Kyoung-Il
    • 정보저장시스템학회:학술대회논문집
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    • 정보저장시스템학회 2005년도 추계학술대회 논문집
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    • pp.185-189
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    • 2005
  • We reported here nano-scale electrical phase-change recording in amorphous $Ge_2Sb_2Te_5$ media using an atomic force microscope (AFM) having conducting probes. In recording process, a pulse voltage is applied to the conductive probe that touches the media surface to change locally the electrical resistivity of a film. However, in contact operation, tip/media wear and contamination could major obstacles, which degraded SNR, reproducibility, and lifetime. In order to overcome tip/media wear and contamination in contact mode operation, we adopted the W incorporated diamond-like carbon (W-DLC) films as a protective layer. Optimized mutilayer media were prepared by a hybrid deposition system of PECVD and RF magnetron sputtering. When suitable electrical pulses were applied to media through the conducting probe, it was observed that data bits as small as 25 nm in diameter have been written and read with good reproducibility, which corresponds to a data density of $1 Tbit/inch^2$. We concluded that stable electrical phase-change recording was possible mainly due to W-DLC layer, which played a role not only capping layer but also resistive layer.

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Strong Correlation Effect by the Rare Earth Substitution on Thermoelectric Material Bi2Te3 ; in GGA+U Approach

  • Quang, Tran Van;Kim, Miyoung
    • 한국자기학회:학술대회 개요집
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    • 한국자기학회 2013년도 임시총회 및 하계학술연구발표회
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    • pp.19-20
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    • 2013
  • Thermoelectic properties of the typical thermoelectric host materials, the tellurides and selenides, are known to be noticeably changed by their volume change due to the strain [1]. In the bismuth telluride ($Bi_2Te_3$) crystal, a substitution of rare-earth element by replacing one of the Bi atoms may cause the change of the lattice parameters while remaining the rhombohedral structure of the host material. Using the first-principles approach by the precise full potential linearized augmented plane wave (FLAPW) method [2], we investigated the Ce substitution effect on the thermoelectric transport coefficients for the bismuth telluride, employing Boltzmann's equation in a constant relaxation-time approach fed with the FLAPW wave-functions within the rigid band approximation. Depending on the real process of re-arrangement of atoms in the cell to reach the equilibrium state, $CeBiTe_3$ was found to manifest a metal or a narrow bandgap semiconductor. This feature along with the strong correlation effect originated by the 4f states of Ce affect significantly on the thermoelectric properties. We showed that the position of the strongly localized f-states in energy scale (Fig. 1, f-states are shaded) was found to alter critically the transport properties in this material suggesting an opportunity to improve the thermoelectric efficiency by tuning the external strain which may changing the location of the f-sates.

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전하량제어에 의한 주기적 분극반전 Ti:LiNbO3 (PPLN) 제작 공정에 관한 연구 (A study on the fabrication of periodically poled Ti:LiNbO3 (PPLN) by the control of charge)

  • 김원정;정홍식;이한영
    • 한국광학회지
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    • 제16권4호
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    • pp.366-375
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    • 2005
  • Ti 확산 리튬나오베이트 채널 광도파로의 z-축 분극을 주기적으로 $180^{\circ}$ 위상 변화시키는 Ti:PPLN 제작 공정을 검토하고, 개선하였다. 분극반전 공정에 적합한 지그와 Labview 프로그램을 이용하여 전하량 제어시스템을 고안하였다. 분극반전에 필요한 전하량으로부터 분극에 적절한 고전압 펄스와 duty-cycle을 조절하였으며, 분극에 필요한 임계 전압 보다 작은 전압을 인가한 상태에서 누설전류의 변화를 관찰하여 절연파괴 현상을 또한 최소화하였다.

Microstructural Investigation of CoCrFeMnNi High Entropy Alloy Oxynitride Films Prepared by Sputtering Using an Air Gas

  • Le, Duc Duy;Hong, Soon-Ku;Ngo, Trong Si;Lee, Jeongkuk;Park, Yun Chang;Hong, Sun Ig;Na, Young-Sang
    • Metals and materials international
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    • 제24권6호
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    • pp.1285-1292
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    • 2018
  • Microstructural properties of as-grown and annealed CoCrFeMnNi high entropy alloy (HEA) oxynitride thin films were investigated. The CoCrFeMnNi HEA oxynitride thin film was grown by magnetron sputtering method using an air gas, and annealed under the argon plus air flow for 5 h at $800^{\circ}C$. The as-grown film was homogeneous and uniform composed of nanometer-sized crystalline regions mixed with amorphous-like phase. The crystalline phase in the as-grown film was face centered cubic structure with the lattice constant of 0.4242 nm. Significant microstructural changes were observed after the annealing process. First, it was fully recrystallized and grain growth happened. Second, Ni-rich region was observed in nanometer-scale range. Third, phase change happened and it was determined to be $Fe_3O_4$ spinel structure with the lattice constant of 0.8326 nm. Hardness and Young's modulus of the as-grown film were 4.1 and 150.5 GPa, while those were 9.4 and 156.4 GPa for the annealed film, respectively.

Density control of ZnO nanorod arrays using ultrathin seed layer by atomic layer deposition

  • Shin, Seokyoon;Park, Joohyun;Lee, Juhyun;Choi, Hyeongsu;Park, Hyunwoo;Bang, Minwook;Lim, Kyungpil;Kim, Hyunjun;Jeon, Hyeongtag
    • Journal of Ceramic Processing Research
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    • 제19권5호
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    • pp.401-406
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    • 2018
  • We investigated the effect of ZnO seed layer thickness on the density of ZnO nanorod arrays. ZnO has been deposited using two distinct processes consisting of the seed layer deposition using ALD and subsequent hydrothermal ZnO growth. Due to the coexistence of the growth and dissociation during ZnO hydrothermal growth process on the seed layer, the thickness of seed layer plays a critical role in determining the nanorod growth and morphology. The optimized thickness resulted in the regular ZnO nanorod growth. Moreover, the introduction of ALD to form the seed layer facilitates the growth of the nanorods on ultrathin seed layer and enables the densification of nanorods with a narrow change in the seed layer thickness. This study demonstrates that ALD technique can produce densely packed, virtually defect-free, and highly uniform seed layers and two distinctive processes may form ZnO as the final product via the initial nucleation step consisting of the reaction between $Zn^{2+}$ ions from respective zinc precursors and $OH^-$ ions from $H_2O$.

라만 분광법을 이용한 반도체 공정 중 표면 분석 (Surface analysis using Raman spectroscopy during semiconductor processing)

  • 최태민;유진욱;정은수;이채연;이화림;김동현;표성규
    • 한국표면공학회지
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    • 제57권2호
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    • pp.71-85
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    • 2024
  • This article provides an overview of Raman spectroscopy and its practical applications for surface analysis of semiconductor processes including real-time monitoring. Raman spectroscopy is a technique that uses the inelastic scattering of light to provide information on molecular structure and vibrations. Since its inception in 1928, Raman spectroscopy has undergone continuous development, and with the advent of SERS(Surface Enhanced Raman Spectroscopy), TERS(Tip Enhanced Raman Spectroscopy), and confocal Raman spectroscopy, it has proven to be highly advantageous in nano-scale analysis due to its high resolution, high sensitivity, and non-destructive nature. In the field of semiconductor processing, Raman spectroscopy is particularly useful for substrate stress and interface characterization, quality analysis of thin films, elucidation of etching process mechanisms, and detection of residues.

Random topological defects in double-walled carbon nanotubes: On characterization and programmable defect-engineering of spatio-mechanical properties

  • A. Roy;K. K. Gupta;S. Dey;T. Mukhopadhyay
    • Advances in nano research
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    • 제16권1호
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    • pp.91-109
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    • 2024
  • Carbon nanotubes are drawing wide attention of research communities and several industries due to their versatile capabilities covering mechanical and other multi-physical properties. However, owing to extreme operating conditions of the synthesis process of these nanostructures, they are often imposed with certain inevitable structural deformities such as single vacancy and nanopore defects. These random irregularities limit the intended functionalities of carbon nanotubes severely. In this article, we investigate the mechanical behaviour of double-wall carbon nanotubes (DWCNT) under the influence of arbitrarily distributed single vacancy and nanopore defects in the outer wall, inner wall, and both the walls. Large-scale molecular simulations reveal that the nanopore defects have more detrimental effects on the mechanical behaviour of DWCNTs, while the defects in the inner wall of DWCNTs make the nanostructures more vulnerable to withstand high longitudinal deformation. From a different perspective, to exploit the mechanics of damage for achieving defect-induced shape modulation and region-wise deformation control, we have further explored the localized longitudinal and transverse spatial effects of DWCNT by designing the defects for their regional distribution. The comprehensive numerical results of the present study would lead to the characterization of the critical mechanical properties of DWCNTs under the presence of inevitable intrinsic defects along with the aspect of defect-induced spatial modulation of shapes for prospective applications in a range of nanoelectromechanical systems and devices.

Density control of ZnO nanorod arrays using ultrathin seed layer by atomic layer deposition

  • Seokyoon Shin;Joohyun Park;Juhyun Lee;Hyeongsu Choi;Hyunwoo Park;Minwook Bang;Kyungpil Lim;Hyunjun Kim;Hyeongtag Jeon
    • Journal of Ceramic Processing Research
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    • 제19권5호
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    • pp.401-406
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    • 2018
  • We investigated the effect of ZnO seed layer thickness on the density of ZnO nanorod arrays. ZnO has been deposited using two distinct processes consisting of the seed layer deposition using ALD and subsequent hydrothermal ZnO growth. Due to the coexistence of the growth and dissociation during ZnO hydrothermal growth process on the seed layer, the thickness of seed layer plays a critical role in determining the nanorod growth and morphology. The optimized thickness resulted in the regular ZnO nanorod growth. Moreover, the introduction of ALD to form the seed layer facilitates the growth of the nanorods on ultrathin seed layer and enables the densification of nanorods with a narrow change in the seed layer thickness. This study demonstrates that ALD technique can produce densely packed, virtually defect-free, and highly uniform seed layers and two distinctive processes may form ZnO as the final product via the initial nucleation step consisting of the reaction between Zn2+ions from respective zinc precursors and OH- ions from H2O.