• Journal of Broadcast Engineering
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• v.18 no.4
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• pp.525-534
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• 2013

Recently, mura defect inspection techniques are receiving attention in LCD production procedure since demands of TFT-LCD are growing. In this paper, we propose an automatic mura defect inspection method using gabor wavelet transform and DCT. First, we generate a reference panel image using DCT based method. For original panel image and generated reference panel image, we apply a gabor wavelet transform to eliminate texture information in images. Then, we extract mura defect regions from the difference image between gabor wavelet transform image of original panel and generated reference panel image. Finally, all mura defect regions are quantified to detect accurate mura defects. Experimental results show that our method is more accurate and efficient than previous methods.

• 한국정보디스플레이학회:학술대회논문집
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• 2009.10a
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• pp.590-593
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• 2009

In the 2D local dimmable LED backlight system, each LED segment can be controlled separately. This can enhance the contrast ratio and reduce overall power consumption of LCDs. However, an artifact such as 'halo mura' can be observed around the bright object in the dark background. This is caused by the light leakage from the bright area into the dark one. Therefore, the 'halo mura' can be more easily observed in the oblique viewing direction. Thus, in this study, the perceivable degree of the halo mura is evaluated according to the level of the off-axis light leakage of LCDs. It is found that an acceptable degree of halo mura can be obtained in 2.0 cd/$m^2$ of the diagonal light leakage. In addition, the halo mura is unperceivable under 0.7 cd/$m^2$ of the diagonal light leakage which can be achieved with optimally compensated polarizers.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08a
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• pp.841-844
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• 2007

In this paper, a vertical block mura, which massively occurred in the LCD products, was investigated extensively by various methods, source drain (SD) line shift is found out to be one of the key reasons. This work to some extent, establishes theoretic hypothesis for further research and solutions similar issues.

• 한국정보디스플레이학회:학술대회논문집
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• 2005.07a
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• pp.426-429
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• 2005

The fringe-field switching (FFS) mode associated with a transition from a homogenously aligned to twist deformation require rubbing process. In this devices, $1^o$ of misalignment in an azimuthal direction could cause voltage-dependent transmittance (V-T) to be different from that in a normal area and consequently results in a rubbing mura. According to our studies, the single domain FFS cells are much more sensitive to the rubbing mura than the dual domain FFS cell. Moreover, the FFS cells with negative LC are much more sensitive to the rubbing mura than the FFS cells with positive LC.

• 한국정보디스플레이학회:학술대회논문집
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• 2009.10a
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• pp.1440-1443
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• 2009

We have devised a methodology based on the concept of foveal (or parafoveal) vision to investigate viewing angle related mura of a backlight unit (BLU). Three different cases of mura phenomenon in BLUs are studied with optical simulation software ASAP in this work. Simulation results, illuminance comparisons between emitting light from BLUs without and with "angle sorting" as well as experimental results are presented. They show good agreement between simulations and experimental observations that demonstrates the method's validation and robustness.

• 한국정보디스플레이학회:학술대회논문집
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• 2008.10a
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• pp.995-998
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• 2008

Lamp mura has become a challenge for slim LCD-TV backlight design. The aim of this paper is to apply a novel diffuser plate to improve lamp mura issue instead of increasing lamps or optical films. The results are positive and contribute to the design of slimmer TV without cost up.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.8
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• pp.871-874
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• 2004

In recent, it is said that the trend of LCD is direction to pursue high qualities like as high transmittance, high contrast ratio, wide viewing angle, fast response time, and so on. Especially, it is known that these qualities are essential to large size LCD like as LCD TV and we can realize them through to uniform cell gap and deep black state. Until now, the ball spacer has been used to control of uniform cell gap. However, the existence of ball spacer inside the cell causes the deformation of the liquid crystal molecules and damage to alignment layer. Such a deformation of the liquid crystal causes light-leakage in the dark state, which lowers contrast ratio of the display. Nowadays, this problem has been solved by using Patterned Spacer on Color Filter. but Side Effect just as gravity mura has been induced. In this paper, we studied the mechanism on gravity mura in case of using patterned spacer on color filter.

• Journal of the Institute of Electronics Engineers of Korea SP
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• v.44 no.5
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• pp.20-27
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• 2007

Generally, the TFT-LCD image signal have nonuniform brightness and are composed of largely varying background signal, noise signal and abruptly changing Mura signal within Mura region. In this paper, Mura region enhancing algorithms using the proposed modified-MTF, which describes how human-visual-system's sensitivity varies in frequency domain, is proposed. The validity of the proposed algorithm was demonstrated ideal 1-dimensional signal and also then it was also tested TFT-LCD image. By the experimental results, the proposed algorithm is very effective in TFT-LCD image Mura enhancement.

• Journal of Korea Multimedia Society
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• v.19 no.3
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• pp.626-632
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• 2016

In this paper, we propose the defect emphasis in TFT-LCD panel image. The defect emphasis image consist of S(Shape) map and B(Brightness) map. S map based on DoG(difference of gaussian) is made with the mura defect shape characteristic. And B map use defect intensity property that defect intensity is higher than background. The experiments were conducted to evaluate the performance of the proposed defect emphasis method. The results of experiments show the validity of the defect emphasis using the proposed method.

• 한국정보디스플레이학회:학술대회논문집
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• 2008.10a
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• pp.101-104
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• 2008

Too high stress of the bottom Mo layer of the gate line is thought to be the main reason for H-line mura. H-Line mura is eliminated effectively by changing the gate line metal structure from Mo/AlNd/Mo to AlNd/Mo. The new structure does not influence the panel's electrical characteristics.