Journal of Broadcast Engineering (방송공학회논문지)

The Korean Institute of Broadcast and Media Engineers (한국방송∙미디어공학회)
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Automatic TFT-LCD Mura Defect Detection using Gabor Wavelet Transform and DCT

가버 웨이블렛 변환 및 DCT를 이용한 자동 TFT-LCD 패널 얼룩 검출

  • Cho, Sang-Hyun (Dept. of Computer Engineering, The Catholic University of Korea) ;
  • Kang, Hang-Bong (Dept. of Digital Media, The Catholic University of Korea)
  • 조상현 (가톨릭대학교 컴퓨터공학과) ;
  • 강행봉 (가톨릭대학교 미디어공학과)
  • Received : 2013.05.13
  • Accepted : 2013.07.25
  • Published : 2013.07.30
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Abstract

Recently, mura defect inspection techniques are receiving attention in LCD production procedure since demands of TFT-LCD are growing. In this paper, we propose an automatic mura defect inspection method using gabor wavelet transform and DCT. First, we generate a reference panel image using DCT based method. For original panel image and generated reference panel image, we apply a gabor wavelet transform to eliminate texture information in images. Then, we extract mura defect regions from the difference image between gabor wavelet transform image of original panel and generated reference panel image. Finally, all mura defect regions are quantified to detect accurate mura defects. Experimental results show that our method is more accurate and efficient than previous methods.

최근 다양한 형태의 TFT-LCD의 수요가 증가함에 따라 LCD 생산 과정에서 얼룩결함을 검사하는 기술에 대한 관심이 높아지고 있다. 본 논문에서는 가버 웨이블렛 변환(Gabor wavelet transform) 및 이산 코사인 변환(Discrete Cosine Transform, DCT)을 이용한 TFT-LCD 패널의 얼룩(mura)을 자동으로 검출하는 방법을 제안한다. 제안한 방법은 DCT 변환 기반의 TFT-LCD 패널 영상의 참조 패널 영상을 생성한다. 원 영상과 생성된 참조 패널 영상에 대해서 실수 가버 웨이블렛 변환(real gabor wavelet transform)을 적용하여 패널 영상에 포함되어 있는 얼룩 결함을 검출하는데 방해가 되는 텍스쳐 정보를 제거하고 변환 영상간의 차영상을 이용하여 제거 결함 영역을 추출한다. 추출된 영역에 대해서는 정량적 평가 과정을 통해 보다 정확한 얼룩 검출을 수행한다. 실험결과는 제안한 방법이 기존의 방법에 비해 보다 정확하고 효율적으로 얼룩을 검출하는 것을 보여준다.

Keywords

References

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