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http://dx.doi.org/10.5909/JBE.2013.18.4.525

Automatic TFT-LCD Mura Defect Detection using Gabor Wavelet Transform and DCT  

Cho, Sang-Hyun (Dept. of Computer Engineering, The Catholic University of Korea)
Kang, Hang-Bong (Dept. of Digital Media, The Catholic University of Korea)
Publication Information
Journal of Broadcast Engineering / v.18, no.4, 2013 , pp. 525-534 More about this Journal
Abstract
Recently, mura defect inspection techniques are receiving attention in LCD production procedure since demands of TFT-LCD are growing. In this paper, we propose an automatic mura defect inspection method using gabor wavelet transform and DCT. First, we generate a reference panel image using DCT based method. For original panel image and generated reference panel image, we apply a gabor wavelet transform to eliminate texture information in images. Then, we extract mura defect regions from the difference image between gabor wavelet transform image of original panel and generated reference panel image. Finally, all mura defect regions are quantified to detect accurate mura defects. Experimental results show that our method is more accurate and efficient than previous methods.
Keywords
Mura defects; LCD inspection; automatic optical inspection; TFT-LCD; DCT;
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