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http://dx.doi.org/10.9717/kmms.2016.19.3.626

Mura Defect Enhancement based on Saliency Map in TFT-LCD Image  

Lee, Eun Young (Electronics Engineering, Kyunpook National University)
Park, Kil Houm (Electronics Engineering, Kyunpook National University)
Publication Information
Journal of Korea Multimedia Society / v.19, no.3, 2016 , pp. 626-632 More about this Journal
Abstract
In this paper, we propose the defect emphasis in TFT-LCD panel image. The defect emphasis image consist of S(Shape) map and B(Brightness) map. S map based on DoG(difference of gaussian) is made with the mura defect shape characteristic. And B map use defect intensity property that defect intensity is higher than background. The experiments were conducted to evaluate the performance of the proposed defect emphasis method. The results of experiments show the validity of the defect emphasis using the proposed method.
Keywords
TFT-LCD; Defect Enhancement; Mura Defect;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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