• 제목/요약/키워드: Mo doping

검색결과 136건 처리시간 0.028초

전기충격법을 통한 몰리브덴이 도핑된 타이타니아 나노튜브 (The preparation of TiO2 nanotubes with a doping of Mo by potential shock)

  • 하동흔;최진섭
    • 한국표면공학회:학술대회논문집
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    • 한국표면공학회 2017년도 춘계학술대회 논문집
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    • pp.145-145
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    • 2017
  • 음극재에 사용되는 타이타니아 나노튜브($TiO_2$ nanotubes)는 높은 종횡비를 가지고 있으며, 기계적인 강도가 우수하고 화학적인 안정성이 높다. 그러나 낮은 전기전도도와 상대적으로 넓은 밴드갭(bandgap)은 다양한 활용 분야에 이 물질이 활용되는 것을 제한하고 있는 상황이다. 전기 화학적 분야에서 광화학 반응 또는 과전압에서 밴드갭을 줄이기 위한 타이타니아 나노튜브의 나노 구조 변형에 대한 많은 연구가 있어왔다. 본 연구에서는 산화 몰리브덴(Molybdenum oxide)을 촉매로 사용하여 타이타니아 나노튜브에 전기충격법을 이용하여 도핑했다. 생성된 타이타니아 나노튜브를 $450^{\circ}C$에서 1시간 30분 동안 가열하여 타이타니아 나노구조를 아나타제(anatase) 구조로 변형켰다. 타이타니아 나노튜브의 구조적인 변화를 scanning electron microscopy(SEM), energy-dispersive X-ray spectroscopy(EDS) 등을 통해 측정했고 UV-Visiblespectroscopy를 통해 도핑된 타이타니아 나노튜브의 밴드갭을 측정하였다. 몰리브덴이 도핑된 타이타니아 나노튜브는 기존의 타이타니아 나노튜브가 가지는 밴드갭인 3.0 ~ 3.2eV 범위보다 더 낮아진 2.6 ~ 2.8eV의 범위를 가지는 것을 확인하였다. 몰리브덴이 도핑된 타이타니아 나노튜브는 다양한 광촉매 분야에 적용될 수 있을 것으로 예상된다.

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고내압 SiC-IGBT 소자 소형화에 관한 연구 (A Study on High Voltage SiC-IGBT Device Miniaturization)

  • 김성수;구상모
    • 한국전기전자재료학회논문지
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    • 제26권11호
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    • pp.785-789
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    • 2013
  • Silicon Carbide (SiC) is the material with the wide band-gap (3.26 eV), high critical electric field (~2.3 MV/cm), and high bulk electron mobility (~900 $cm^2/Vs$). These electronic properties allow attractive features, such as high breakdown voltage, high-speed switching capability, and high temperature operation compared to Si devices. In general, device design has a significant effect on the switching and electrical characteristics. It is known that in this paper, we demonstrated that the switching performance and breakdown voltage of IGBT is dependent with doping concentration of p-base region and drift layer by using 2-D simulations. As a result, electrical characteristics of SiC-IGBT deivce is higher breakdown voltage ($V_B$= 1,600 V), lower on-resistance ($R_{on}$= 0.43 $m{\Omega}{\cdot}cm^2$) than Si-IGBT. Also, we determined that processing time and cost is reduced by the depth of n-drift region of IGBT was reduced.

Programmable Metallization Cell 응용을 위한 Ag-doped 칼코게나이드 박막의 전기적 저항 변화 특성 (Properties on Electrical Resistance Change of Ag-doped Chalcogenide Thin Films Application for Programmable Metallization Cell)

  • 최혁;구상모;조원주;이영희;정홍배
    • 한국전기전자재료학회논문지
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    • 제20권12호
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    • pp.1022-1026
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    • 2007
  • We have demonstrated new functionalities of Ag doped chalcogenide glasses based on their capabilities as solid electrolytes. Formation of such amorphous systems by the introduction of silver via photo-induced diffusion in thin chalcogenide films is considered. The influence of silver on the properties of the newly formed materials is regarded in terms of diffusion kinetics and Ag saturation is related to the composition of the hosting material. Silver saturated chalcogenide glasses have been used in the formation of solid electrolyte which is the active medium in programmable metallization cell (PMC) devices. In this paper, we investigated electrical and optical properties of Ag-doped chalcogenide thin film on changed thickness of Ag and chalcogenide thin films, which is concerned at Ag-doping effect of PMC cell. As a result, when thickness of Ag and chalcogenide thin film was 30 nm and 50 nm respectively, device have excellent characteristics.

이온주입 공정을 이용한 4H-SiC p-n Diode에 관한 시뮬레이션 연구 (Simulation Study of ion-implanted 4H-SiC p-n Diodes)

  • 이재상;방욱;김상철;김남균;구상모
    • 한국전기전자재료학회논문지
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    • 제22권2호
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    • pp.128-131
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    • 2009
  • Silicon carbide (SiC) has attracted significant attention for high frequency, high temperature and high power devices due to its superior properties such as the large band gap, high breakdown electric field, high saturation velocity and high thermal conductivity. We performed Al ion implantation processes on n-type 4H-SiC substrate using a SILVACO ATHENA numerical simulator. The ion implantation model used Monte-Carlo method. We simulated the effect of channeling by Al implantation in both 0 off-axis and 8 off-axis n-type 4H-SiC substrate. We have investigated the effect of varying the implantation energies and the corresponding doses on the distribution of Al in 4H-SiC. The controlled implantation energies were 40, 60, 80, 100 and 120 keV and the implantation doses varied from $2{\times}10^{14}$ to $1{\times}10^{15}\;cm^{-2}$. The Al ion distribution was deeper with increasing implantation energy, whereas the doping level increased with increasing dose. The effect of post-implantation annealing on the electrical properties of Al-implanted p-n junction diode were also investigated.

Gapped Nearly Free-Standing Graphene on an SiC(0001) Substrate Induced by Manganese Atoms

  • Hwang, Jinwoong;Lee, Ji-Eun;Kang, Minhee;Park, Byeong-Gyu;Denlinger, Jonathan;Mo, Sung-Kwan;Hwang, Choongyu
    • Applied Science and Convergence Technology
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    • 제27권5호
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    • pp.90-94
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    • 2018
  • The electron band structure of manganese-adsorbed graphene on an SiC(0001) substrate has been studied using angle-resolved photoemission spectroscopy. Upon introducing manganese atoms, the conduction band of graphene, that is observed in pristine graphene indicating intrinsic electron-doping by the substrate, completely disappears and the valence band maximum is observed at 0.4 eV below Fermi energy. At the same time, the slope of the valence band decreases by the presence of manganese atoms, approaching the electron band structure calculated using the local density approximation method. The former provides experimental evidence of the formation of nearly free-standing graphene on an SiC substrate, concomitant with a metal-to-insulator transition. The latter suggests that its electronic correlations are efficiently screened, suggesting that the dielectric property of the substrate is modified by manganese atoms and indicating that electronic correlations in grpahene can also be tuned by foreign atoms. These results pave the way for promising device application using graphene that is semiconducting and charge neutral.

NMOS 소자의 제작 및 평가 (Fabrication and Evaluation of NMOS Devices)

  • 이종덕
    • 대한전자공학회논문지
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    • 제16권4호
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    • pp.36-46
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    • 1979
  • 본 연구에서는 N -채널 실리콘 게이트 제작기술에 의하여 일련의 크기를 가지는 커페시터와 트렌지스터들이 제작되었다. 그 결과 다양한 이온 주입 조걸, 즉 B 의 경우 에너지 30keV∼60keV와 도오스 3 × 10 ~ 5 × 10 개/㎠ 그리고 P 의 경우 에너지 1001keV∼ 175keV와 4 ×10 ~ 7×11개/㎠ 도오스 영역에서 이들에 대한 D.C. 인자들의 측정치들이 이론적인 계산치들과 비상, 분석되어 있다. 이 D.C. 인자들에는 threshold전압, 공핍층의 폭, 게이트 산화물 두께, 표면상태, 가동 하전입자 밀도, 전자의 이동도 그리고 마지막으로 누설전류가 있는데, 이중 실제 MOS의 제작에 있어서 특허 중요한 threshold전압에 있어서는, 커어브트레이서와 C - V plot을 통하여 측정된 값들이 실제 재산에서 이용된 SUPREM II 컴퓨우터 프로그램에 의한 결과와 훌륭히 접근하고 있다. 그 밖에 여기나온 D.C.인자들 중에서 도오핑 수준은 기판의 역 게이트 바이어스에서 threshold전압들로 부터 계산된 것이고, 역전도는 정의된 subthreshold 기울기로 부터 추산된 것임을 밝혀 둔다. 마지막으로 이와같은 D. C. 시험 결과들을 종합적으로 평가해 볼 때 만들어진 커페시터와 트렌지스터들이 N -채널 MOS I. C. 기억소자용으로 적합함을 보여주고 있다.

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Short Channel SB-FETs의 Schottky 장벽 Overlapping (Schottky barrier overlapping in short channel SB-MOSFETs)

  • 최창용;조원주;정홍배;구상모
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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    • pp.133-133
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    • 2008
  • Recently, as the down-scailing of field-effect transistor devices continues, Schottky-barrier field-effect transistors (SB-FETs) have attracted much attention as an alternative to conventional MOSFETs. SB-FETs have advantages over conventional devices, such as low parasitic source/drain resistance due to their metallic characteristics, low temperature processing for source/drain formation and physical scalability to the sub-10nm regime. The good scalability of SB-FETs is due to their metallic characteristics of source/drain, which leads to the low resistance and the atomically abrupt junctions at metal (silicide)-silicon interface. Nevertheless, some reports show that SB-FETs suffer from short channel effect (SCE) that would cause severe problems in the sub 20nm regime.[Ouyang et al. IEEE Trans. Electron Devices 53, 8, 1732 (2007)] Because source/drain barriers induce a depletion region, it is possible that the barriers are overlapped in short channel SB-FETs. In order to analyze the SCE of SB-FETs, we carried out systematic studies on the Schottky barrier overlapping in short channel SB-FETs using a SILVACO ATLAS numerical simulator. We have investigated the variation of surface channel band profiles depending on the doping, barrier height and the effective channel length using 2D simulation. Because the source/drain depletion regions start to be overlapped each other in the condition of the $L_{ch}$~80nm with $N_D{\sim}1\times10^{18}cm^{-3}$ and $\phi_{Bn}$ $\approx$ 0.6eV, the band profile varies as the decrease of effective channel length $L_{ch}$. With the $L_{ch}$~80nm as a starting point, the built-in potential of source/drain schottky contacts gradually decreases as the decrease of $L_{ch}$, then the conduction and valence band edges are consequently flattened at $L_{ch}$~5nm. These results may allow us to understand the performance related interdependent parameters in nanoscale SB-FETs such as channel length, the barrier height and channel doping.

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이종접합 Gate 구조를 갖는 수평형 NiO/Ga2O3 FET의 전기적 특성 연구 (Electrical Characterization of Lateral NiO/Ga2O3 FETs with Heterojunction Gate Structure)

  • 이건희;문수영;이형진;신명철;김예진;전가연;오종민;신원호;김민경;박철환;구상모
    • 한국전기전자재료학회논문지
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    • 제36권4호
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    • pp.413-417
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    • 2023
  • Gallium Oxide (Ga2O3) is preferred as a material for next generation power semiconductors. The Ga2O3 should solve the disadvantages of low thermal resistance characteristics and difficulty in forming an inversion layer through p-type ion implantation. However, Ga2O3 is difficult to inject p-type ions, so it is being studied in a heterojunction structure using p-type oxides, such as NiO, SnO, and Cu2O. Research the lateral-type FET structure of NiO/Ga2O3 heterojunction under the Gate contact using the Sentaurus TCAD simulation. At this time, the VG-ID and VD-ID curves were identified by the thickness of the Epi-region (channel) and the doping concentration of NiO of 1×1017 to 1×1019 cm-3. The increase in Epi region thickness has a lower threshold voltage from -4.4 V to -9.3 V at ID = 1×10-8 mA/mm, as current does not flow only when the depletion of the PN junction extends to the Epi/Sub interface. As an increase of NiO doping concentration, increases the depletion area in Ga2O3 region and a high electric field distribution on PN junction, and thus the breakdown voltage increases from 512 V to 636 V at ID =1×10-3 A/mm.

Octadecyltrichlorosilane (OTS)을 사용한 WSe2의 농도조절이 가능한 P형 도핑 방법 (Contrallable P-type method for WSe2 using Octadecyltrichlorosilane (OTS))

  • 김진옥;강동호;박진홍
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2015년도 제49회 하계 정기학술대회 초록집
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    • pp.193.2-193.2
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    • 2015
  • 최근 3차원 반도체의 물질적인 한계를 극복하기 위해 2차원 전이금속 칼코게나이드(TMD)에 대한 연구가 활발히 진행되고 있다. 하지만 TMD 물질의 도핑 방법에 대한 수많은 연구에도 불구하고 대부분이 n채널 물질인 MoS2에 대한 것에 국한되어 있다. 게다가 이전의 TMD 도핑 기술 연구 결과는 채널이 도체화 될 정도의 매우 높은 농도의 도핑 현상만을 보여주었다. 이 연구에서 우리는 WSe2로 만든 p형 채널 트랜지스터에서 Octaecyltrichlorosilane(OTS)층의 농도 조절로 제어가 가능한 약한 농도의 p형 도핑기술을 보여준다. 이 p형 도핑 현상은 OTS의 메틸기(-CH3)그룹에 의한 양성 쌍극자모멘트가 WSe2내의 전자 농도를 낮추는데서 기인한다. 제어가 가능한 p형 도핑은 $2.1{\times}10^{11}cm^{-2}$ 사이에서 $5.2{\times}10^{11}cm^{-2}$로 degenerate되지 않은 정도로 WSe2 기반의 광, 전기적인 소자에서 적절한 농도로 최적화 될 수 있다. (도핑 정도에 따른 문턱전압 상승, 전류 on/off율 상승, 전계효과 이동도 상승, 광응답성 하락, 광검출성 하락) 또한 OTS에서 비롯한 p도핑 효과는 대기중에서 오랜시간이 지나도 작은 성능 변화만을 보여주며(60시간 후 18~34% 문턱전압 감소변화량) $120^{\circ}C$의 열처리를 통하여 저하된 성능이 거의 완벽하게 회복된다. 이 연구는 Raman 분광법과 전기적, 광학적 측정을 통하여 분석되었으며 OTS 도핑현상이 WSe2 박막의 두께와 무관함 또한 확인했다.

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High performance of inverted polymer solar cells

  • Lee, Hsin-Ying;Lee, Ching-Ting;Huang, Hung-Lin
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2015년도 제49회 하계 정기학술대회 초록집
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    • pp.61.2-61.2
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    • 2015
  • In the past decades, green energy, such as solar energy, wind power, hydropower, biomass energy, geothermal energy, and so on, has been widely investigated and developed to solve energy shortage. Recently, organic solar cells have attracted much attention, because they have many advantages, including low-cost, flexibility, light weight, and easy fabrication [1-3]. Organic solar cells are as a potential candidate of the next generation solar cells. In this abstract, to improve the power conversion efficiency and the stability, the inverted polymer solar cells with various structures were developed [4-6]. The novel cell structures included the P3HT:PCBM inverted polymer solar cells with AZO nanorods array, with pentacene-doped active layer, and with extra P3HT interfacial layer and PCBM interfacial layer. These three difference structures could respectively improve the performance of the P3HT:PCBM inverted polymer solar cells. For the inverted polymer solar cells with AZO nanorods array as the electronic transportation layer, by using the nanorod structure, the improvement of carrier collection and carrier extraction capabilities could be expected due to an increase in contact area between the nanorod array and the active layer. For the inverted polymer solar cells with pentacene-doped active layer, the hole-electron mobility in the active layer could be balanced by doping pentacene contents. The active layer with the balanced hole-electron mobility could reduce the carrier recombination in the active layers to enhance the photocurrent of the resulting inverted polymer solar cells. For the inverted polymer solar cells with extra P3HT and PCBM interfacial layers, the extra PCBM and P3HT interfacial layers could respectively improve the electron transport and hole transport. The extra PCBM interfacial layer served another function was that led more P3HT moving to the top side of the absorption layer, which reduced the non-continuous pathways of P3HT. It indicated that the recombination centers could be further reduced in the absorption layer. The extra P3HT interfacial layer could let the hole be more easily transported to the MoO3 hole transport layer. The high performance of the novel P3HT:PCBM inverted polymer solar cells with various structures were obtained.

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