• 한국신뢰성학회지:신뢰성응용연구
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• 제10권1호
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• pp.65-71
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• 2010

NAND-type SONOS with a separated double-gate FinFET structure (SDF-Fin SONOS) flash memory devices are proposed to reduce the unit cell size of the memory device and increase the memory density in comparison with conventional non volatile memory devices. The proposed memory device consists of a pair of control gates separated along the direction of the Fin width. There are two unique alternative technologies in this study. One is a channel doping method and the other is an oxide thickness variation method, which are used to operate the SDF-Fin SONOS memory device as two-bit. The fabrication processes and the device characteristics are simulated by using technology comuter-adided(TCAD). The simulation results indicate that the charge trap probability depends on the different channel doping concentration and the tunneling oxide thickness. The proposed SDG-Fin SONOS memory devices hold promise for potential application.

• 통상정보연구
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• 제9권2호
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• pp.423-439
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• 2007

The purpose of this study was to analyze market competitiveness of Korean and Chinese computer parts industry in the between two countries' market by using Index of Export Bias and Market Comparative Advantage Index. For attaining the purpose of study, we classified the computer parts which exported to the two countries' market and the imported products as the memory devices and input/output peripheral devices. Analyzing period was 2001-2006. The analysis of Korean results of Index of Export Bias indicated that memory devices represented low overall numerical value and the Chinese results of Index of Export Bias indicated that memory devices represented high gradual numerical value. On the other hand, Korean input/output peripheral devices have been increasing steadily for analysis period and China input/output peripheral devices have been decreasing steadily for analysis period. Additional results indicated that the Korean and China computer parts which gained market competitiveness between two countries market were as follows. Korean memory devices have been losing competitiveness in the China market steadily and Chinese memory devices have been acquire competitiveness in the Korean market gradually. In input/output peripheral devices case, Korean products represented powerful competitiveness in the China market and Chinese products have been gaining competitiveness in the Korea market.

• 진공이야기
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• 제1권3호
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• pp.4-8
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• 2014

Since the modern computer architecture was suggested by Von Neumann in 1945, computer has become inevitable for our life. This brilliant growth of computer has been led by device miniaturization trend, so called Moore's law. Especially, the explosive growth of memory devices such as DRAM and Flash have played key role in huge enlarging utilization of computer. However, abrupt increase of data used for many applications in big data era provoke the excessive energy consumption of data center which results from the inefficiency of conventional memory-storage hierarchy. As a solution, the application of new memory devices has been brought up for innovative memory-storage hierarchy. In this paper, the current development status and prospect of new memory devices will be discussed.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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• pp.281.2-281.2
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• 2016

Two-dimensional van der Waals (2D vdWs) materials have been extensively studied for future electronics and materials sciences due to their unique properties. Among them, black phosphorous (BP) has shown infinite potential for various device applications because of its high mobility and direct narrow band gap (~0.3 eV). In this work, we demonstrate a few-nm thick BP-based nonvolatile memory devices with an well-known poly(vinylidenefluoride-trifluoroethylene) [P(VDF-TrFE)] ferroelectric polymer gate insulator. Our BP ferroelectric memory devices show the highest linear mobility value of $1159cm^2/Vs$ with a $10^3$ on/off current ratio in our knowledge. Moreover, we successfully fabricate the ferroelectric complementary metal-oxide-semiconductor (CMOS) memory inverter circuits, combined with an n-type $MoS_2$ nanosheet transistor. Our memory CMOS inverter circuits show clear memory properties with a high output voltage memory efficiency of 95%. We thus conclude that the results of our ferroelectric memory devices exhibit promising perspectives for the future of 2D nanoelectronics and material science. More and advanced details will be discussed in the meeting.

• 전자공학회논문지CI
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• 제47권5호
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• pp.41-49
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• 2010

휴대용 정보기기와 엔터테인먼트기기 등의 사용이 대중화 되면서 플래쉬 메모리의 수요도 급격히 증가하였다. 일반적으로 플래시 메모리는 장착되는 장치에 따라 다양한 형태의 오류 패턴을 가지며, 메모리 생산자들은 최종적인 생산과정에서 실제 장착되는 기기와 동일한 환경에서 전기적/물리적 테스트를 수행한다. 이 과정을 메모리의 응용기기 실장 테스트라고 하며, 여기에서 사용되는 장비를 메모리 실장기라 한다. 현재 여러 가지 종류의 실장기들이 제작되어 메모리 생산 환경에서 사용되고 있으나 대부분이 검수자의 청각이나 시각 등의 감각에 의존하여 메모리의 오류를 판단하고 있다. MP3 실장기의 경우 음원의 재생 기능을 이용하여 메모리 오류를 판단하는데 적절한 자동 검수 기법이 존재하지 않아 검수자가 실장기에서 재생되는 음원을 직접 듣고 오류를 판단한다. 이런 과정은 실장환경의 자동화에 있어 큰 걸림돌이 되고 있으며 인력 활용 측면에서도 비효율적이다. 본 논문에서는 MP3 장치용 플래시 메모리의 효과적인 오류 검증을 위한 음원 비교 기법을 제안한다. 제안하는 방법은 원본 파일과 MP3 장치에서 재생되는 샘플값의 분산을 활용함으로써 메모리 오류 발생 여부를 판단한다.

• JSTS:Journal of Semiconductor Technology and Science
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• 제14권6호
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• pp.741-749
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• 2014

Low power double data rate 2 non-volatile memory (LPDDR2-NVM) has been deemed the standard interface to connect non-volatile memory devices such as phase-change memory (PCM) directly to the main memory bus. However, most of the previous literature does not consider or overlook this standard interface. In this paper, we propose address phase skipping by reforming the way of interfacing with LPDDR2-NVM. To verify effectiveness and functionality, we also develop a system-level prototype that includes our customized LPDDR2-NVM controller and commercial PCM devices. Extensive simulations and measurements demonstrate up to a 3.6% memory access time reduction for commercial PCM devices and a 31.7% reduction with optimistic parameters of the PCM research prototypes in industries.

• 제어로봇시스템학회논문지
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• 제13권6호
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• pp.519-524
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• 2007

The OBC(on-board computer) of a satellite which plays a role of the controller for the satellite should be equipped with preventive measures against transient errors caused by SEU(single event upset). Since memory devices are pretty much susceptible to these transient errors, it is essential to protect memory devices against SFU. A common method exploits an error detection and correction code and additional memory devices, combined with periodic memory scrubbing. This paper proposes an effective memory scrubbing scheme for the OBC of STSAT-2. The memory system of the OBC is briefly mentioned and the reliability of the information stored in the memory system is analyzed. The result of the reliability analysis shows that there exist optimal scrubbing periods achieving the maximum reliability for allowed overall scrubbing overhead and they are dependent on the significance of the information stored. These optimal scrubbing periods from a reliability point of view are derived analytically.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1998년도 추계학술대회 논문집
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• pp.13-16
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• 1998

An anomalous current characteristics which show the superposition of a low current level and high current level at the subthreshold region when SONOSFETs are in memory states were investigated. We have assumed this phenomena were resulted from the effect of parasitic transistors by LOCOS isolation and were modeled to a parallel equivalent circuit of one memory transistor and two parasitic transistors. Theoretical curves are well fitted in measured log I$_{D}$-V$_{G}$ curves independent of channel width of memory devices. The difference between low current level and high current level is apparently decreased with decrease of channel width of devices because parasitic devices dominantly contribute to the current conduction with decrease of channel width of memory devices. As a result, we concluded that the LOCOS isolation has to selectively adopt in the design of process for charge-trap type NVSM.VSM.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1988년도 추계학술대회 논문집
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• pp.14-17
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• 1988

Degradation effects observed in nonvolatile MNOS memory devices with in increasing W/E (Write/Erase) cycling were investigated using n-type MNOS capacitors. The results showed that the density of Si-SiO$_2$ interface states and the conductivity of nitride were increased with W/E cycles, therefore the memory retention characteristics of the MNOS memory devices were degraded. Also, annealing of the degraded devices restored the original Si-SiO$_2$ interface states density, but failed to restore the original nitride conductivity. Based on these experimental results, we found that the degradation of memory retention characteristic was affected by the nitride conductivity rather than by Si-SiO$_2$ interface states.

• JSTS:Journal of Semiconductor Technology and Science
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• 제17권3호
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• pp.473-482
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• 2017

Hand gesture recognition is regarded as new Human Computer Interaction (HCI) technologies for the next generation of mobile devices. Previous hand gesture implementation requires a large memory and computation power for hand segmentation, which fails to give real-time interaction with mobile devices to users. Therefore, in this paper, we presents a low latency and memory-efficient hand segmentation architecture for natural hand gesture recognition. To obtain both high memory-efficiency and low latency, we propose a streaming hand contour tracing unit and a fast contour filling unit. As a result, it achieves 7.14 ms latency with only 34.8 KB on-chip memory, which are 1.65 times less latency and 1.68 times less on-chip memory, respectively, compare to the best-in-class.