• 한국국방경영분석학회지
• /
• 제23권1호
• /
• pp.76-87
• /
• 1997

This paper deals with reliability and MTTF analysis of a non-repairable man-machine system operating under different weather conditions. The system consists of a hardware(machine) and a two-operator standby subsystem such as the air combat maneuvering of fighters with dual seat. The failure times for the subsystems follow the exponential distribution with constant parameter. By considering not only the effect on hardware component but also the weather conditions and human performance factors such as the operator's errors, a Markov model is presented as a method for evaluating the system reliability of time continuous operation tasks. Laplace transforms of the various state probabilities have been derived and then reliability of the system, at any time t, has been computed by inversion process. MTTF has also been computed.

• 품질경영학회지
• /
• 제10권2호
• /
• pp.18-24
• /
• 1982

This paper estimates the reliability & mean time to failure (MTIF) of a cyclic or acyclic network system by the Monte-Carlo simulation method. Estimates of MTTF and Reliability become difficult as the complexity of a system increases. The method in this paper finds all simple paths from the given network, and then simulates the reliability of the required time and MTFF by using these paths. Life-times of the components in a network follow some probability distributions (Exponential, Weibull, Normal, Lognormal, etc.). The method, written in Level II. Basic Language, is validated for some simple examples and then estimates the reliability and MTFF of some cyclic network system.

• 한국신뢰성학회지:신뢰성응용연구
• /
• 제7권3호
• /
• pp.127-136
• /
• 2007

The accelerated life tests(ALTs) and degradation characteristics of image intensifier assembly(KIT-7) under low illuminance and high temperature were investigated. The accelerated life tests were carried out at $5{\times}10^5\;fc-40^{\circ}C,\;10{\times}10^5\;fc-40^{\circ}C,\;5{\times}10^5\;fc-50^{\circ}C,\;10{\times}10^5\;fc-50^{\circ}C$ and relationship related to illuminance and temperature was used as an accelerated life test model. An ALTA program[6] was used to calculate an acceleration factor and the test of life distribution fit, and estimate three parameters of an life test model. To sum up, MTTF 10,000 h at $5{\times}10^{-5}\;fc-40^{\circ}C$ of image intensifier assembly was certificated.

• 한국전기전자재료학회논문지
• /
• 제34권1호
• /
• pp.44-49
• /
• 2021

Recently, infrared (IR) and near-infrared (NIR) light-emitting diodes (LEDs) were widely used for home medical applications owing to its low output power and wide exposed area for curing. For deep penetration of the light under the skin, multiple LEDs with wavelengths of 700~10,000 nm were located on a flexible printed circuit board. When multiple wavelengths of LEDs were soldered on a circuit board, the lifetime of LED module highly depends on LEDs with a short lifetime. The mean time to failure (MTTF) was able to calculate with the experimental results under high temperature and the Arrhenius model. The results of this study could help companies to approve the warranty of LED modules and its product.

• 한국정보처리학회논문지
• /
• 제3권7호
• /
• pp.1917-1923
• /
• 1996

대량의 데이터를 저장하는 시스템은 다중디스크 시스템이 필수적이다. 그러나 디스 크의 갯수가 늘어나면 디스크시스템의 신뢰성이 떨어진다. 디스크시스템을 구성하는 디스크 중 하나의 디스크가 고장났을 경우에는 정상 동작하지만, 두 개이상의 디스 크가 고장일 경우에는 저장된 데이타를 잃게되는 디스크시스템을 고려하였다. 또한 각 디스크의 수명은 서로 다른 매개변수를 갖는 지수분포를 따르며, 수리시간은 일반 적인 확률분포를 갖는다고 가정한다. 이 가정을 바탕으로 하여 주어진 디스크시스템의 신뢰성을 MTTF(Mean Time To Failure)로서 분석 하였다. 그리고 디스크시스템의 설계에 필요한 파라미터를 도출하였으며, 특별한 경우 대하여 선형비용 구조하에서 디스크시 스템의 수명을 주어진 값보다 크게 하는 최소 비용 문제를 고찰하였다.

• 한국산업융합학회 논문집
• /
• 제27권3호
• /
• pp.609-618
• /
• 2024

System reliability prediction in the development stage is increasingly crucial to reliability growth management to satisfy its target reliability, since modern system usually takes a form of complex composition and various complicated functions. In most cases of development stage, however, the information available for system reliability prediction is very limited, making it difficult to predict system reliability more precisely as in the production and operating stages. In this study, a system reliability prediction process is considered when the reliability-related information such as SIL (Safety Integrity Level) and MTTFd (Mean Time to Dangerous Failure) is available in the development stage. It is suggested that when the SIL or MTTFd of a system component is known and the field operational data of similar system is given, the reliability prediction could be performed using the scaling factor for the SIL or MTTFd value of the component based on the similar system's field operational data analysis. Predicting a system reliability is then adjusted with the conversion factor reflecting the temperature condition of the environment in which the system actually operates. Finally, the case of applying the proposed system reliability prediction process to a high performance mooring platform is dealt with.

• Journal of Power Electronics
• /
• 제16권4호
• /
• pp.1426-1437
• /
• 2016

In different industrial and mission oriented applications, redundant or standby semiconductor systems can be implemented to improve the reliability of power electronics equipment. The proper structure for implementation can be one of the redundant or standby structures for series or parallel switches. This selection is determined according to the type and failure rate of the fault. In this paper, the reliability and the mean time to failure (MTTF) for each of the series and parallel configurations in two redundant and standby structures of semiconductor switches have been studied based on different failure rates. The Markov model is used for reliability and MTTF equation acquisitions. According to the different values for the reliability of the series and parallel structures during SC and OC faults, a comprehensive comparison between each of the series and parallel structures for different failure rates will be made. According to the type of fault and the structure of the switches, the reliability of the switches in the redundant structure is higher than that in the other structures. Furthermore, the performance of the proposed series and parallel structures of switches during SC and OC faults, results in an improvement in the reliability of the boost dc/dc converter. These studies aid in choosing a configuration to improve the reliability of power electronics equipment depending on the specifications of the implemented devices.

• 조명전기설비학회논문지
• /
• 제25권1호
• /
• pp.85-92
• /
• 2011

The role of RCDs(Residual Current Protective Device) that are installed before the load is very important for preventing electric shock and electrical fire. However, although fault rate of RCD is increasing due to deterioration and long period usage, the RCD is permanently used without a checking of performance evaluation and it causes the electrical accident. In this paper, the amount of airborne chloride is researched in domestic costal area and the accelerated life test is conducted using a salt water spray tester in order to decide the life time of RCD. Aa a result of an accelerated life test, the MTTF(Mean Time To Failure) of RCD is 110.81 hours and B10 life time of RCD is 45.81 hours for the all samples. when an accelerated life test result is applied to within 2 km costal area, the life time of RCD is predicted about 5 years.

• 대한산업공학회지
• /
• 제39권4호
• /
• pp.290-297
• /
• 2013

The increasing level of operation in high-tech industry is likely to require ever more complex structure in reliability problem. Furthermore, system failures are more significant on society as a whole than ever before. Reliability redundancy optimization problem (RROP) plays a important role in the designing and analyzing the complex system. RROP involves selection of components with multiple choices and redundancy levels for maximizing system reliability with constraints such as cost, weight, etc. Meanwhile, previous works on RROP dealt with system with perfect failure detection, which gave at most a good solution. However, we studied RROP with imperfect failure detection and switching. Using absorbing Markov Chain, we present not a good solution but the optimal one. In this study, the optimal system configuration is designed with warm and cold-standby redundancy for k-out-of-n system in terms of MTTF that is one of the performance measures of reliability.

• 한국해안·해양공학회논문집
• /
• 제32권3호
• /
• pp.147-160
• /
• 2020

추계학적 WP을 이용하여 불확실성을 고려하면서 항만 구조물의 실시간에 따른 피해와 파괴확률 그리고 잔류수명을 해석할 수 있는 모형을 수립하였다. 과거부터 현재까지의 피해상태와 미래에 발생될 피해 진행 과정에 포함되는 불확실성을 고려할 수 있는 추계학적 확률모형이다. 피해경로를 추적할 수 있으며 누적피해의 밀도함수도 산정하여 파괴확률을 추정할 수 있다. 또한 구조물의 잔류수명에 대한 밀도함수도 구할 수 있다. 최소자승법과 최우도법을 이용하여 모형의 파라미터를 추정할 수 있는 방법도 제시하였다. 검증을 위해 시간의 진행에 따른 누적피해와 잔류수명에 대한 밀도함수를 산정하고 해석하였는데 이론적인 결과가 MCS 기법의 수치적인 결과와 매우 잘 일치하였다. 또한 내구수명이나 잔류수명에 대한 밀도함수의 거동과 MTTF와 MRL이 정량적으로 잘 일치하였다. 한편 본 연구에 수립된 모형을 경사제에 적용하기 위하여 피복재 피해에 대한 수리모형 실험자료를 활용하여 모형의 파라미터들을 추정하였다. 시간의 진행에 따른 피복재 누적피해의 밀도함수와 파괴확률을 산정하였는데 MCS의 결과와 이론적인 결과가 매우 잘 일치하였다. 경과시간이 클수록 밀도함수가 우측으로 이동하면서 불확실성이 커지면서 파괴확률이 급격하게 증가하였다. 또한 재령에 따른 잔류수명의 거동특성을 해석하였는데, 잔류수명의 분포함수에서 좌측보다는 우측 꼬리 부분이 길게 형성되어 MRL이 급격하게 감소하는 경향을 보였다. 이는 경사제 피복재의 피해가 완만하게 증가하는 현상을 반영한 것으로 판단된다. 특히 재령과 내구수명 그리고 잔류수명의 관계를 해석하였는데, 재령이 오래될수록 재령과 MRL의 합이 MTTF와 큰 차이를 보이고 있다. 이는 재령이 증가하면 잔류수명의 평균인 MRL이 불확실성에 의하여 급격히 감소하기 때문이다.