• Title/Summary/Keyword: MTTF

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A Study on the Prediction of Failure Rate of Airforce OO Guided Missile Based on Field Failure Data (야전운용제원에 기반한 공군 OO유도탄 고장률 예측에 관한 연구)

  • Park, Cheonkyu;Ma, Jungmok
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.21 no.7
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    • pp.428-434
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    • 2020
  • The one-shot weapon system is destroyed after only one mission. So, the system requires high reliability. Guided missiles are one-shot weapon systems that have to be analyzed by storage reliability since they spend most of their life in storage. The analysis results depend on the model and the ratio of correct censored data. This study was conducted to propose a method to more accurately predict the future failure rate of Air force guided missiles. In the proposed method, the failure rate is predicted by both MTTF (Mean Time To Failure) and MTBF (Mean Time Between Failure) models and the model with a smaller error from the real failure rate is selected. Next, with the selected model, the ratio of correct censored data is selected to minimize the error between the predicted failure rate and the real failure rate. Based on real field data, the comparative result is determined and the result shows that the proposed sampling rate can predict the future failure rate more accurately.

종속 고장을 가지는 원형 Consecutive-k-out-of-n:F 시스템의 경제적 설계

  • 윤원영;김귀래;고용석;류기열
    • Proceedings of the Korean Reliability Society Conference
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    • 2000.11a
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    • pp.387-395
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    • 2000
  • Circular consecutive-k-out-of-n:F system when the failure of component is dependent is studied. We assume that the failure of a component in the system increase the failure rate of the survivor which is working just before the failed component. In this case, a mean time to failure (MTTF), a average failure number of the system, and the expected cost per unit time are obtained. Then the minimum number of consecutive failed components to cause system failure to minimize the expected cost per unit time is determined as searching paths to system failure. And various numerical examples are studied.

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Dependability Simulation of Multimedia Servers Using Fault Injection (결함 주입 기법을 이용한 멀티미디어 서버의 의존도 시뮬레이션)

  • 정지영;김성수
    • Proceedings of the Korean Information Science Society Conference
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    • 1999.10c
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    • pp.626-628
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    • 1999
  • 최근 컴퓨터와 통신 기술의 비약적인 발전은 가까운 시일 내에 대규모 멀티미디어 서비스가 실현될 수 있음을 보여주고 있다. 이와 관련하여 멀티미디어 서버의 구조 및 데이터 배치에 따른 다양한 큐잉 모델과 비용 모델이 제안되어 왔으나 의존도(dependability)에 대한 연구는 미미한 실정이다. 시스템의 디자인 단계에서 시뮬레이션은 성능과 의존도 분석을 위한 중요한 실험적인 수단이며 결함 주입 실험은 시스템의 의존도를 구하기 위해 사용되어 왔다. 본 논문에서는 병렬 비디오 서버의 의존도 분석을 위해 결함 주입을 이용한 시뮬레이션 모델을 제안하여 신뢰도(reliability)와 MTTF(Mean Time To Failure)를 구한다.

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집중 감시제어 설비의 신뢰성에 관한 연구

  • 이상복;박영택;장병태;장문섭
    • Proceedings of the Korean Society for Quality Management Conference
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    • 2004.04a
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    • pp.548-555
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    • 2004
  • 현재 변전소의 감시 및 제어 설비로 활용되고 있는 집중감시제어반은 24시간 상시 운전상태로 운영되기 때문에 컴퓨터의 CPU 및 메인보드, 하드디스크 등의 노후화로 인해 개개의 특성 및 기능이 저하되고 있다. 도입된 지 10년 가까이 지난 집중감시제어반에 대한 효율적 교체가 불가피하게 되었다. 이에 대한 최적 교체주기에 대한 합리적인 결정을 하기 위해서 신뢰분포함수와 평균사용일수(MTTF)를 구하였다.

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A study on the Dependability Evaluation according to the structure of Duplex system (듀플렉스 시스템의 구조에 따른 신뢰성 평가에 관한 연구)

  • 김현기;강민수;신덕호;권용훈;이기서
    • Proceedings of the KSR Conference
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    • 1998.05a
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    • pp.194-202
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    • 1998
  • This paper shows two models of the duplex system having a fault tolerant system characteristic used in airplane and railway system. The architecture of these systems is based on Mc68000, and we designed the single system, single duplex system, dual system and dual duplex system to evaluate the system characteristic. We calculate the failure rate of components using MIL-SPEC-2l7F and evaluate the reliability, avaliability, safety and MTTF(Mean Time To Failure) of the designed systems by Markov model. We choose our system depending on the developing system characteristic.

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Simplified Method for Estimation of Mean Residual Life of Rubble-mound Breakwaters (경사제의 평균 잔류수명 추정을 위한 간편법)

  • Lee, Cheol-Eung
    • Journal of Korean Society of Coastal and Ocean Engineers
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    • v.34 no.2
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    • pp.37-45
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    • 2022
  • A simplified model using the lifetime distribution has been presented to estimate the Mean Residual Life (MRL) of rubble-mound breakwaters, which is not like a stochastic process model based on time-dependent history data to the cumulative damage progress of rubble-mound breakwaters. The parameters involved in the lifetime distribution can be easily estimated by using the upper and lower limits of lifetime and their likelihood that made a judgement by several experts taking account of the initial design lifetime, the past sequences of loads, and others. The simplified model presented in this paper has been applied to the rubble-mound breakwater with TTP armor layer. Wiener Process (WP)-based stochastic model also has been applied together with Monte-Carlo Simulation (MCS) technique to the breakwater of the same condition having time-dependent cumulative damage to TTP armor layer. From the comparison of lifetime distribution obtained from each models including Mean Time To Failure (MTTF), it has found that the lifetime distributions of rubble-mound breakwater can be very satisfactorily fitted by log-normal distribution for all types of cumulative damage progresses, such as exponential, linear, and logarithmic deterioration which are feasible in the real situations. Finally, the MRL of rubble-mound breakwaters estimated by the simplified model presented in this paper have been compared with those by WP stochastic process. It can be shown that results of the presented simplified model have been identical with those of WP stochastic process until any ages in the range of MTT F regardless of the deterioration types. However, a little of differences have been seen at the ages in the neighborhood of MTTF, specially, for the linear and logarithmic deterioration of cumulative damages. For the accurate estimation of MRL of harbor structures, it may be desirable that the stochastic processes should be used to consider properly time-dependent uncertainties of damage deterioration. Nevertheless, the simplified model presented in this paper can be useful in the building of the MRL-based preventive maintenance planning for several kinds of harbor structures, because of which is not needed time-dependent history data about the damage deterioration of structures as mentioned above.

A Comparative Analysis of Failure Rate, Effective Failure Rate and Equivalent Failure Rate of A System Composed of Identical Parallel Units (병렬구조 시스템의 고장률, 유효(有效) 고장률과 대등(對等) 고장률의 비교분석)

  • Cho, Kyung-Hwan
    • Journal of Applied Reliability
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    • v.15 no.4
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    • pp.256-261
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    • 2015
  • The aim of this paper is to present some issues to be discussed in relation to failure rate of a system that has identical parallel units. It is assumed that Time-to-Failure of each unit has the same exponential distribution and all units are repairable with a periodic maintenance of time interval T. Effective failure rate is widely recommended for nonrepairable systems as the reciprocal of MTTF but it should not be applied for repairable systems if delayed maintenance is used. And equivalent failure rate of an imaginary system is taken into consideration, the reliability value of which is the same as that of the redundant system when time interval T is given. With a numerical example, failure rate, effective failure rate, and equivalent failure rate of the redundant system are analyzed comparatively.

A Study of assessment criteria and reliability improvement for power supply of electrodeless fluorescent lamp (고효율 무전극형광등용 전원장치의 평가기준 및 신뢰성향상 연구)

  • 함중걸;신종욱
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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    • 2002.11a
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    • pp.181-185
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    • 2002
  • This paper gives an assessment criteria and reliability improvement for high frequency power supply of high efficacy electrodeless fluorescent lamp. The electrodeless fluorescent lamp system consist of electrodeless fluorescent lamp, high frequency power supply and lighting fixtures. The high frequency power supply has a shortest life at the system. Therefore It is need to assess the Failure Rate or Mean Time To Failure(MTTF) for the high frequency power supply of electrodeless fluorescent lamp system and improve the reliability at design. We suggest the assessment criteria and improve methods of the reliability on the design basis for the electodeless fluorescent system.

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RELIABILITY ANALYSIS OF THE MSC SYSTEM

  • Kim, Young-Soo;Lee, Do-Kyoung;Lee, Chang-Ho;Woo, Sun-Hee
    • Journal of Astronomy and Space Sciences
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    • v.20 no.3
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    • pp.217-226
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    • 2003
  • MSC (Multi-Spectral Camera) is the payload of KOMPSAT-2, which is being developed for earth imaging in optical and near-infrared region. The design of the MSC is completed and its reliability has been assessed from part level to the MSC system level. The reliability was analyzed in worst case and the analysis results showed that the value complies the required value of 0.9. In this paper, a calculation method of reliability for the MSC system is described, and assessment result is presented and discussed.

Circuit-Level Reliability Simulation and Its Applications (회로 레벨의 신뢰성 시뮬레이션 및 그 응용)

  • 천병식;최창훈;김경호
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.31A no.1
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    • pp.93-102
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    • 1994
  • This paper, presents SECRET(SEC REliability Tool), which predicts reliability problems related to the hot-carrier and electromigration effects on the submicron MOSFETs and interconnections. To simulate DC and AC lifetime for hot-carrier damaged devices, we have developed an accurate substrate current model with the geometric sensitivity, which has been verified over the wide ranges of transistor geometries. A guideline can be provided to design hot-carrier resistant circuits by the analysis of HOREL(HOT-carrier RFsistant Logic) effect, and circuit degradation with respect to physical parameter degradation such as the threshold voltage and the mobility can also be expected. In SECRET, DC and AC MTTF values of metal lines are calculated based on lossy transmission line analysis, and parasitic resistances, inductances and capacitances of metal lines are accurately considered when they operate in the condition of high speed. Also, circuit-level reliability simulation can be applied to the determination of metal line width and-that of optimal capacitor size in substrate bias generation circuit. Experimental results obtained from the several real circuits show that SECERT is very useful to estimate and analyze reliability problems.

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