• 한국막학회:학술대회논문집
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• 한국막학회 1998년도 심포지움시리즈 Jan-98 역삼투용 분리막 기술 및 응용
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• pp.119-131
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• 1998

Membrane Housings -Safety Operation -Cost : Initial, Leng-term -Other Considerations

• 전자공학회지
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• 제32권8호
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• pp.62-68
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• 2005

• 센서학회지
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• 제8권5호
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• pp.354-358
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• 1999

• E2M - 전기 전자와 첨단 소재
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• 제14권2호
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• pp.42-49
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• 2001

• 한국정밀공학회지
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• 제27권4호
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• pp.27-32
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• 2010

This paper presents an investigation into the pinhead forming process with the objective of finding the optimal forming conditions. In order to this, the orbital forming analysis of a heading MIG was carried out using the explicit finite element method. Relationships between temperature by forming of load and stresses, rake angle by forming final shape and stress distribution were investigated through analysises in order to find an efficient solution. As a result, the higher temperature and orbital rake angle were the better forming conditions.

• 한국정밀공학회지
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• 제29권5호
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• pp.494-499
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• 2012

Reliable results can't be derived without the notion of measurement uncertainty. The reason is that the measured value includes a lot of uncertain factors. Finding the factor that affect the measurement of parameter is important for estimation of measurement uncertainty. In this paper, the evaluation of uncertainty analysis about positioning accuracy measurements of high precision feed mechanism is presented to evaluate the important factors of uncertainty.

• 대한수학회보
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• 제31권1호
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• pp.55-60
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• 1994

It is well known that if P(x,D) is an elliptic differential operator, with real analytic coefficients, and P(x,D)u = 0 in an open, connected subset .ohm..mem.R$^{n}$ , then u is real analytic in .ohm. Hence, if there exists x$_{0}$ .mem..ohm. such that u vanishes of .inf. order at x$_{0}$ , u must be identically 0. If a differential operator P(x, D) has the above property, we say that p(x,D) has the strong unique continuation property (s.u.c.p.). If, on the other hand, P(x,D)u = 0 in .ohm., and u = 0 in .ohm.', an open subset of .ohm., implies that u = 0 in .ohm. we say that P(x,D)u = 0 in .ohm., and suppu .contnd. K .contnd. .ohm implies that u = 0 in .ohm. we sat that P(x,D) has the weak unique continuation property (m.u.c.p.).

• 한국통신학회논문지
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• 제22권11호
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• pp.2512-2520
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• 1997

The classes of Reverse Jacket matrix [RJ]$_{N}$ and the corresponding Restclass Reverse Jacket matrix ([RRJ]$_{N}$) are defined;the main property of [RJ]$_{N}$ is that the inverse matrices of them can be obtained very easily and have a special structure. [RJ]$_{N}$ is derived from the weighted hadamard Transform corresponding to hadamard matrix [H]$_{N}$ and a basic symmertric matrix D. the classes of [RJ]$_{2}$ can be used as a generalize Quincunx subsampling matrix and serveral polygonal subsampling matrices. In this paper, we will present in particular the systematical block-wise extending-method for {RJ]$_{N}$. We have deduced a new orthorgonal matrix $M_{1}$.mem.[RRJ]$_{N}$ from a nonorthogonal matrix $M_{O}$.mem.[RJ]$_{N}$. These matrices can be used to develop efficient algorithms in IMT2000 signal processing, multidimensional subsampling, spectrum analyzers, and signal screamblers, as well as in speech and image signal processing.gnal processing.g.

• Journal of Computing Science and Engineering
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• 제5권4호
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• pp.288-293
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• 2011

To resolve ambiguities in speech act classification, various machine learning models have been proposed over the past 10 years. In this paper, we review these machine learning models and present the results of experimental comparison of three representative models, namely the decision tree, the support vector machine (SVM), and the maximum entropy model (MEM). In experiments with a goal-oriented dialogue corpus in the schedule management domain, we found that the MEM has lighter hardware requirements, whereas the SVM has better performance characteristics.

• 비파괴검사학회지
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• 제7권2호
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• pp.27-34
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• 1988

Recently, it is gradually raised necessity that thickness of thin film is measured accurately and managed in industrial circles and medical world. In this study, regarding to the thickness of film which is in opaque object and is beyond distance resolution capacity, thickness measurement was done by MEM-cepstrum analysis of received ultrasonic wave. In measurement results, film thickness which is beyond distance resolution capacity was measured accurately. And within thickness range that don't exist interference, thickness measurement by MEM-ceptrum analysis was impossible.