• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1991.10a
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• pp.48-51
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• 1991

Short channel Nonvolatile EEPROM memory devices were fabricated to CMOS 1M bit design rule, and reviews the characteristics and applications of SNOSFET. Application of SNOS field effect transistors have been proposed for both logic circuits and nonvolatile memory arrays, and operating characteristics with write and erase were investigated. As a results, memory window size of four terminal devices and two terminal devices was established low conductance stage and high conductance state, which was operated in “1” state and “0”state with write and erase respectively. And the operating characteristics of unit cell in matrix array were investigated with implementing the composition method of four and two terminal nonvolatile memory cells. It was shown that four terminal 2${\times}$2 matrix array was operated bipolar, and two termineal 2${\times}$2 matrix array was operated unipolar.

• ETRI Journal
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• v.28 no.4
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• pp.525-528
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• 2006

In this letter, we present a design of a single chip video decoder called advanced mobile video ASIC (A-MoVa) for mobile multimedia applications. This chip uses a mixed hardware/software architecture to improve both its performance and its flexibility. We designed the chip using a partition between the hardware and software blocks, and developed the architecture of an H.264 decoder based on the system-on-a-chip (SoC) platform. This chip contains 290,000 logic gates, 670,000 memory gates, and its size is $7.5\;mm{\times}7.5\;mm$ (using 0.25 micron 4-layers metal CMOS technology).

• Journal of the Korean Institute of Telematics and Electronics A
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• v.31A no.1
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• pp.93-102
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• 1994

This paper, presents SECRET(SEC REliability Tool), which predicts reliability problems related to the hot-carrier and electromigration effects on the submicron MOSFETs and interconnections. To simulate DC and AC lifetime for hot-carrier damaged devices, we have developed an accurate substrate current model with the geometric sensitivity, which has been verified over the wide ranges of transistor geometries. A guideline can be provided to design hot-carrier resistant circuits by the analysis of HOREL(HOT-carrier RFsistant Logic) effect, and circuit degradation with respect to physical parameter degradation such as the threshold voltage and the mobility can also be expected. In SECRET, DC and AC MTTF values of metal lines are calculated based on lossy transmission line analysis, and parasitic resistances, inductances and capacitances of metal lines are accurately considered when they operate in the condition of high speed. Also, circuit-level reliability simulation can be applied to the determination of metal line width and-that of optimal capacitor size in substrate bias generation circuit. Experimental results obtained from the several real circuits show that SECERT is very useful to estimate and analyze reliability problems.

• Proceedings of the Korean Geotechical Society Conference
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• 2010.03a
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• pp.852-855
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• 2010

Numerical simulations for large scale triaxial tests with large diameter rockfill materials are conducted using distinct element method. For generation of compacted assembly with specific grain size distribution and initial material porosity, the clump logic method and expansion of generated particles are adapted. With micro parameters which are chosen by calibration process, discrete particle modelling of triaxial test in case of other confining stress and cyclic loading condition were conducted. Also numerical simulations of fluid injection into particulate materials were conducted to observe cavity initiation and propagation using distinct element method. The fluid scheme solves the continuity and Navior-Stokes equations numerically, then derives pressure and velocity vectors for fixed grid by considering the existence of particles within the fluid cell.

• 제어로봇시스템학회:학술대회논문집
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• 1988.10a
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• pp.414-417
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• 1988

Recently PLC pursues faster scanning time, circuit confidence, reliability improvement, and smaller size. To obtain above all merit, custom IC(Gate Array) is developed. Custom IC includes 5 main blocks and 2 auxiliary blocks. The 5 main blocks process faster sequential instruction execution by only logic gate using hexa instruction code system. And the 2 auxiliary blocks generate baud rate clock (153.6 KHz, 76.8KHz) to communicate between PLC and computer or programmers.

• Proceedings of the IEEK Conference
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• 2002.06b
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• pp.353-356
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• 2002

Due to the increased complexity and size of digital system and the need of the H/W-S/W co-design, C/C++ based system design methodology gains more Interests than ever in EDA field. This paper suggests the methodology in which handshake module corresponding to each basic statement of C is provided of the form of STG(Signal Transition Graph) and then, C statements is synthesized into asynchronous circuit through syntax-oriented translation. The 4-phase handshaking protocol is used for the communications between modules, and the modules are synthesized by the Petrify which is asynchronous logic synthesis CAD tool.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.5
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• pp.188-202
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• 1996

In this paper, we propose a symmetrical pseudo faulty processing elements genration technique to improve the overall reliability of arrays with fixed hardware resources on the fault tolerant VLSI arrays based on single-track switches. We have analyzed the reliability of fault tolerant VLSI arrays and designed control logic for real-tiem reconfiguration. Applying this technique to reconfiguration of VLSI 2-D arrays, we have found that the proposed scheme achieves a higher reliability than the previus methods of similar condition. And we have found that the results of reliability analyzed by mathematic computation are very close to simulated ones. Furthermore, the time overhead for reconfiguration is independent of the array size because the control for reconfiguration is distributively executed by each processing elements. And the proposed scheme has an advantage which maintained properties of VLSI arrays by keeping the locality of interconnections as high as possible even after the reconfiguration.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.34C no.10
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• pp.1-7
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• 1997

This paper proposes a new real-time 2-D convolver filter architecture wihtout using any multiplier. To meet the massive amount of computations for real-time image processing, several commercial 2-D convolver chips have many multipliers occupying large VLSI area. Te proposed architecture using only one shift-and-accumulator can reduce the chip size by more than 70% of commercial 2-D convolver filter chips and can meet the real-time image processing srequirement, i.e., the standard of CCIR601. In addition, the proposed chip can be used for not only 2-D image processing but also 1-D signal processing and has bood scalability for higher speed applications. We have simulated the architecture by using VHDL models and have performed logic synthesis. We used the samsung SOG cell library (KG60K) and verified completely function and timing simulations. The implemented filter chip consists of only 3,893 gates, operates at 125 MHz and can meet the real-time image processing requirement, that is, 720*480 pixels per frame and 30 frames per second (10.4 mpixels/second).

• Journal of the Institute of Electronics Engineers of Korea CI
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• v.38 no.3
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• pp.55-60
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• 2001

In this paper a new algorithm is introduced to enhance the fingerprint image effectively using fuzzy logic. Our approach is not constrained to a particular image size and scale. It rather handle different conditions of noise and image scale. Ridges are thinned while the image is enhanced along the same orientation as the ridges. The problem of false minutia can be also resolved.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.4
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• pp.75-84
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• 1995

Fault simulators are used for accurate evaluation of fault coverages of digital circuits. But fault simulation becomes time and memory consuming job because computation time is proportional to wquare of size of circuits. Recently, several approximate algorithms for testability analysis have been published to cope with the problems. COP is very fast but cannot be used for sequential circuits, while STAFAN can ve used for sequential circuits but requires large amount of computation because it utilizes logic simulation results. In this paper EXTASEC(An Extension of Testability Analysis for Sequential Circuits) is proposed. It is an extension of COP in the sense that it is the same as COP for combinational circuits, but it can handle sequential circuits, Xicontrollability and backward line analysis are key concept for EXTASEC. Performance of EXTASEC is proven by comparing EXTASEC with a falut simulator, STAFAN, and COP for ISCAS circuits, and the result is demonstated.