• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.951-954
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• 2004

We report the recent reliability test results of SpatiaLight's liquid crystal on Silicon (LCOS) microdisplays. Two different types of reliability tests have been performed: 1) thermal and 2) thermal with high intensity UV light. Various important device parameters were regularly monitored including the contrast ratio, color uniformity, and switching time. The test data shows that there are no degradations that fail the pass criteria. Lifetime estimations are given from the test data.

• Journal of Applied Reliability
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• v.5 no.4
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• pp.413-425
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• 2005

As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article presents an accelerated degradation testing for vacuum fluorescent displays (VFDs). The accelerated degradation model is based on Arrhenius-lifetime relationship for cathode temperatures. We compare the results between accelerated degradation test and test at normal use condition. Accelerated degradation test for display devices is observed as an efficient method to warrantee product reliability to customers, as well as a tool to save time and costs.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.28 no.5
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• pp.338-343
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• 2015

Dye sensitized solar cells (DSSCs), which is one of the contending renewable energy sources, have the problem of low efficiency. To improve the efficiency, the fast electron transport and long electron lifetime are required. In this study, one-dimensional sodium hexatitanate, which is expected to have an advantageous structure for electron transports, was synthesized and the feasibility of the material on DSSC was tested. Its physical properties were characterized by the SEM, XRD, and BET method. The dye adsorption and solar cell properties were also characterized. In addition to the expectation of fast electron transport, sodium hexatitanate showed longer electron lifetime: This means sodium hexatitanate can improve the DSSC efficiency. However, it showed low current and voltage because of the low surface area leading to the low amount of dye adsorbed. Therefore, it should be mixed with titanium oxide with high surface area for the optimal performance.

• Research in Community and Public Health Nursing
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• v.21 no.4
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• pp.502-511
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• 2010

Purpose: The purpose of this study was to investigate the influencing factors of influenza vaccination in the elderly participating in lifetime transitional health examination. Methods: This study was a secondary analysis of data collected from lifetime transitional health examination (for 66-year-old people) conducted by the National Health Insurance Corporation (NHIC) from January 1 to December 31, 2008. Questionnaires were received from NHIC to obtain information regarding gender, chronic diseases, health-related behaviors, and ADL. A total of 255,333 participants who responded all the questions in the questionnaire were included in the analysis. Collected data were analyzed by descriptive statistics, ${\chi}^2$ test, and multiple logistic regression. Results: The influenza vaccine coverage rate in 66-year-old people was 66.1%. The influenza vaccine coverage rate was higher in female elders and those with hypertension, diabetes, heart disease or past smoking, and lower in those with stroke, current smoking, drinking, no-exercise or ADL-dependency. Conclusion: Strategies for improving the influenza vaccination coverage rate in the elderly are needed. The strategies should give priority to the elderly with current smoking, drinking, and no-exercise, and home visiting programs are needed for the elderly with stroke and ADL-dependency.

• Journal of Ecology and Environment
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• v.33 no.3
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• pp.253-260
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• 2010

It has been well established that leaf longevity is linked to the carbon economy of plants. We used this relationship to predict leaf lifetime carbon gains from leaf lifespan, and estimated the gross primary production (GPP) of a young deciduous forest of Japanese beech (Fagus crenata) located in central Japan. The light-saturated photosynthetic rates of the leaves were measured repeatedly during the growing season. We used the leaf lifespan to calculate the conversion coefficient from the light-saturated photosynthetic rate into the realized leaf lifetime carbon gain under field conditions. The leaf turnover rate was estimated using litter traps. GPP was estimated as the product of lifetime carbon gain per unit of leaf mass, and the annual leaf turnover rate. The GPP of the forest in 2007 was estimated to be $1.2{\times}10^3gCm^{-2}y^{-1}$, which was within the range of previously reported GPP values of beech forests in Japan, and was close to the GPP of a European beech forest, as estimated by eddy flux measurements.

• Communications for Statistical Applications and Methods
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• v.24 no.4
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• pp.325-337
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• 2017

In this paper, we proposed a new long-term lifetime distribution with four parameters inserted in a risk competitive scenario with decreasing, increasing and unimodal hazard rate functions, namely the Weibull-Poisson long-term distribution. This new distribution arises from a scenario of competitive latent risk, in which the lifetime associated to the particular risk is not observable, and where only the minimum lifetime value among all risks is noticed in a long-term context. However, it can also be used in any other situation as long as it fits the data well. The Weibull-Poisson long-term distribution is presented as a particular case for the new exponential-Poisson long-term distribution and Weibull long-term distribution. The properties of the proposed distribution were discussed, including its probability density, survival and hazard functions and explicit algebraic formulas for its order statistics. Assuming censored data, we considered the maximum likelihood approach for parameter estimation. For different parameter settings, sample sizes, and censoring percentages various simulation studies were performed to study the mean square error of the maximum likelihood estimative, and compare the performance of the model proposed with the particular cases. The selection criteria Akaike information criterion, Bayesian information criterion, and likelihood ratio test were used for the model selection. The relevance of the approach was illustrated on two real datasets of where the new model was compared with its particular cases observing its potential and competitiveness.

• Journal of Welding and Joining
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• v.17 no.3
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• pp.90-95
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• 1999

The increase in high speed, multi-function and high I/O pin semiconductor devices highly demands high pin count, very thin, and high density packages. BGA is one of the solutions, but the package has demerits in package reliability, surface mounting problems due to the PCB warpage and solder joint crack related with TCE mismatch between the materials. On this study to verify the thermal fatigue lifetime of the solder joint FEM and experiments were performed after surface mounting BGA with different solder composition and reliability conditions. FEM showed optimum composition of Ag3.2-Sn96.5 and under the composition minimum creep deformation of the solder joint was calculated, and the thermal fatigue lifetime was improved. In view of temperature cycle condition, the conditions of $-65^{\circ}C$to $150^{\circ}C$ showed minimum lifetime and t was 1/3 of $0^{\circ}C$ to $125^{\circ}C$ condition. Test board was prepared and solder joint crack was verified. Until 1000cycle on soder joint crack was observed.

• Proceedings of the Korean Society of Propulsion Engineers Conference
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• 2017.05a
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• pp.154-156
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• 2017

Constant variance of degradation data over time has been generally assumed to estimate storage lifetime using destructive, accelerated degradation data over time. However, performance data of ammunitions deteriorate over time, and the standard deviation would tend to increase over time. This paper shows storage lifetime comparison results for constant variance and time-variant variance assumptions of degradation data over time, and proposes that time-variant variance assumption should be considered to increase accuracy in lifetime estimation.

• International Journal of Safety
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• v.1 no.1
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• pp.36-42
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• 2002

This paper is aimed at predicting the life of rubber insulating gloves under normal operating stresses from relatively rapid test performed at higher stresses. Specimens of rubber insulating gloves are subject to multiple stress conditions, i.e. combined electrical and thermal stresses. Two modes of electrical stress, step voltage stress and constant voltage stress are used in specimen aging. There are two types of test for electrical stress in this experiment: the one is Breakdown Voltage (BDV) test under step voltage stress and thermal stress and the other is lifetime test under constant voltage stress and temperature stress. The ac breakdown voltage defined as the break-down point of insulation that leakage current excesses a limit value, l0mA in this experiment, is determined. Because the very high variability of aging data requires the application of statistical model, Weibull distribution is used to represent the failure times as the straight line on Weibull probability paper. Weibull parameters are deter-mined by three statistical methods i.e. maximum likelihood method, graphical method and least squares method, which employ SAS package, Weibull probability paper and FORTRAN, respectively. Two chosen models for predicting the life under simultaneous electrical and thermal stresses are inverse power model and exponential model. And the constants of life equation for multistress aging are calculated using numerical method, such as Gauss Jordan method etc.. The completion of life equation enables to estimate the life at normal stress based on the data collected from accelerated aging test. Also the comparison of the calculated lifetimes between the inverse power model and the exponential model is carried out. And the lifetimes calculated by three statistical methods with lower voltage than test voltage are compared. The results obtained from the suggested experimental method are presented and discussed.

• Journal of IKEEE
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• v.25 no.3
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• pp.578-583
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• 2021

This paper describes acceleration tests for reliability of semiconductors. It also describes AEC-Q100, international test standard for reliability of automotive semiconductors. Semiconductors can be used for dozens of years. So acceleration tests are essential to test potential problems over whole period of product where test time is minimized by applying intensive stresses. AEC-Q100 is a typical acceleration test in automotive semiconductors, and it is designed to find various failures in semiconductors and to analyze their causes of occurance. So it finds many problems in design and fabrication as well as it predicts lifetime and reliability of semiconductors. AEC-Q100 consists of 7 test groups such as accelerated environmental stress tests, accelerated lifetime simulation tests, package assembly integrity tests, die fabrication reliability tests, electrical verification tests, defect screening tests, and cavity package integrity tests. It has 4 grades from grade 0 to grade 3 based on operational temperature. AEC-Q101, Q102, Q103, Q104, and Q200 are applied to discrete semiconductors, optoelectronic semiconductors, sensors, multichip modules, and passive components, respectively.