• 제목/요약/키워드: Lifetime Test

검색결과 524건 처리시간 0.023초

건식변압기 코일의 열적 수명평가 (Thermal Lifetime Estimation of Coil Used for Dry-type Transformer)

  • 김민규;허대행;김익수;장진영;문병철;고재철
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2008년도 Techno-Fair 및 합동춘계학술대회 논문집 전기물성,응용부문
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    • pp.131-132
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    • 2008
  • This paper describes a method to estimate the thermal lifetime of coil used in the dry-type molded transformer which is widely used in the domestic distribution system. In order to reduce the testing time, temperature accelerated aging test is planned. Finally, the thermal lifetime estimation method is composed of a temperature aging test and a cyclic test of temperature, humidly and lightning impulse voltage withstand test.

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Compound Linear Test Plan for 3-level Constant Stress Tests

  • Kim, In-Ho
    • Journal of the Korean Data and Information Science Society
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    • 제17권3호
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    • pp.945-952
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    • 2006
  • Several accelerated life test plans use tests at only two levels of stress and thus, have practical limitations. They highly depend upon the assumption of a linear relationship between stress and time-to-failure and use only two extreme stresses that can cause irrelevant failure modes. Thus 3-level stress plans are preferable. When the lifetime distribution of test unit is exponential with mean lifetime $\theta_i$ at stress $x_i$, i=0, 1, 2, 3, we derive the optimum quadratic plan under the assumption that a quadratic relationship exists between stress and log(mean lifetime), and propose the compound linear plans, as an alternative to the optimum quadratic plan. The proposed compound linear plan is better than two other compromise plans for constant stress testing and nearly as good as the optimum quadratic plan, and has the advantage of simplicity.

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가속수명시험을 이용한 릴레이의 전기적 수명예측 (Electrical Lifetime Estimation of a Relay by Accelerated Life Test)

  • 김재중;장석원;손영갑
    • 대한기계학회논문집A
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    • 제32권5호
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    • pp.430-436
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    • 2008
  • This paper proposes a way to predict electrical lifetime of a relay using Accelerated Life Testings (ALTs). The relay of interest mounting on printed circuit boards is usually under an inrush current stress. The inrush current is generated and accelerated through controlling a lamp switching device in the ALT. We find that the dominant failure mechanism under high levels of inrush current would be contact welding in the contact surface of the relay and the contact welding process is accelerated according to increase in inrush current. The electrical lifetime model based on Inverse Power Law in term of inrush current is proposed, and parameters characterizing relay's lifetime distribution are statistically estimated using ALTA 6 PRO software.

OLED 소자의 수명 평가법에 관한 연구 (A study on the method of OLED device's lifetime test)

  • 최영태;조재립
    • 대한안전경영과학회지
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    • 제10권4호
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    • pp.145-152
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    • 2008
  • According to the Korea Agency for Technology and Standards under the Commerce Ministry, OLED device's lifetime is defined 50% drop of luminance. OLED device is self-emitting operating device, that means it becomes different color between pixels under using environment. That's reason of the different luminance drop ratio & chromaticity coordinates shift ratio with time. The problem is there is not recovered after luminance drop and color shift. We can recognize the difference of color as image sticking. First we studied when human recognize the difference of color and second we apply the method of OLED device's lifetime test that's able to check different color between pixels.

인장시험에 의한 자기재 현수애자의 수명평가에 관한 연구 (A Study on the Lifetime Evaluation of Porcelain Suspension Insulator Using Tensile Test)

  • 김찬영;송일근;김주용;이병성;한재홍;윤태상
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2000년도 하계학술대회 논문집 C
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    • pp.1596-1598
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    • 2000
  • This paper presents the results of lifetime evaluation for porcelain suspension insulator using tensile test. The specimens were collected from the branch offices of the KEPCO. The tensile tests were performed with the instron which had the speed of 1mm per minites. The factors of quality were calculated with the maximum tensile strength measured from each specimens. With the quality factors, a factor of lifetime was determined. The lifetime of porcelain suspension insulator as a factor of fabricated years was evaluated.

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OLED 소자의 수명 평가법에 관한 연구 (A study on the method of OLED device's lifetime test)

  • 최영태;조재립
    • 대한안전경영과학회:학술대회논문집
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    • 대한안전경영과학회 2008년도 추계학술대회
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    • pp.131-143
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    • 2008
  • According to the Korea Agency for Technology and Standards under the Commerce Ministry, OLED device's lifetime is defined 50% drop of luminance. OLED device is self-emitting operating device, that means it becomes different color between pixels under using environment. That's reason of the different luminance drop ratio & chromaticity coordinates shift ratio with time. The problem is there is not recovered after luminace drop and color shift. We can recognize the difference of color as image sticking. First we studied when human recognize the difference of color and second we apply the method of OLED device's lifetime test that's able to check different color between pixels

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분위수 회귀를 이용한 가속수명시험 자료 분석 (Accelerated Lifetime Data Analysis Using Quantile Regression)

  • 노지연;김희정;나명환
    • 응용통계연구
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    • 제21권4호
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    • pp.631-638
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    • 2008
  • 가속수명시험은 실제 사용조건보다 열악한 수준으로 시험하여 빠른 기간 내에 제품의 고장자료를 얻고, 실제 사용조건에서의 수명관련 품질 특성치를 추정하는 방법이다. 본 논문에서는 가속수명 자료를 이용하여 분위수 회귀추정 방법을 통해 정상 조건에서의 수명을 추정하는 방법을 제안한다. 대표적인 가속 스트레스인 온도와 전압을 갖는 실제 자료에 분위수 회귀 모형을 적용하여 수명을 추정하였다.

저장수명 연구를 통한 백색 연막수류탄(KM8)의 공정관리 효율화 (Efficient Process Control Through Research on Storage Lifetime of a White Smoke Hand Grenade, KM8)

  • 장일호;홍석환;백승준;손영갑
    • 한국군사과학기술학회지
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    • 제14권5호
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    • pp.888-896
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    • 2011
  • A white smoke hand grenade, KM8 is used to make smoke screen in order to provide visual field interceptions or signals. The grenade fails when its time to emit smoke is longer than the specified emission time so that the smoke concentration becomes lighter. This paper considered failure in smoke emission time, and evaluated its storage lifetime. The main objective of this paper is to modify the present specification limits of smoke emission time for the efficient process control in manufacturing, through analyzing effect of its specification change on the storage lifetime, based on the lifetime evaluation results. Accelerated degradation test was performed and then failure in smoke emission time was reproduced from the test. And estimated storage lifetimes from the accelerated test results was compared to evaluated lifetimes of grenades using the ASRP data. Past process testing results of the grenade in manufacturing were analyzed in this paper. Then, each storage lifetime for the specifications, ${\pm}3$ and ${\pm}5$ in seconds, extended from the current specification in manufacturing were estimated using the past testing results, and compared to one another.

HILS 기법을 적용한 신축관 이음 수명예측에 관한 연구 (A Study for Lifetime Predition of Expansion Joint Using HILS)

  • 오정수;조승현
    • 한국산학기술학회논문지
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    • 제19권4호
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    • pp.138-142
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    • 2018
  • 본 연구에서는 플랜트 기자재 중 수충격에 매우 취약한 신축관 이음을 대상으로 수충격 발생 시 신축관 이음의 신축량의 변화를 현장에서 취득한 후 HIL 시뮬레이터의 작동데이터로 적용한 HILS 기법을 적용한 진동내구 시험을 수행하였다. 또한 진동내구 시험 시 내구수명의 주요 스트레스 인자로 신축관 내부압력을 가정하였다. 진동내구 시험은 신축관 내부 설정압 따라 진행되었으며 수명데이터를 이용, 수명데이터를 잘 따르는 곡선을 접합하여 수명예측 모델식을 유도하였고 특정 내부 설정압에서의 시험 및 수명결과를 통하여 이를 검증하였다. 한편, 시험 중 발생 된 신축관의 고장모드는 모두 벨로우즈 부 표면에 발생된 크랙과 크랙을 통한 누수 등이 있었다. 본 연구에서 유도한 수명에측 모델식은 설정압력을 스트레스 인자로 따르는 전형적인 역승모형이며 특정환경에서만 적용될 수 있는 한계를 지니고 있다. 이에 본 연구는 진동내구 수명의 가속요인인 압력 외 온도상태 등을 다양한 수명변수가 적용 가능한 복합수명예측 모델식을 개발할 예정이다.

와이블 수명분포와 대수정규 수리시간분포 하에서 가용도의 추정과 실증시험계획 (Estimation and Demonstration Test Plan for Availability with Weibull Lifetime and Lognormal Repair Time)

  • 서순근
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제14권1호
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    • pp.1-9
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    • 2014
  • One important measure of performance for a repairable system is steady-state availability. In this paper, a method to estimate and establish confidence interval for the steady-state availability under Weibull lifetime and lognormal repair time distributions is proposed. Also, bias and mean squared error of a point estimator for an availability are investigated. In addition, a procedure to derive the sample size and critical value for availability demonstration test is presented and illustrated with a numerical example.