• Proceedings of the KIEE Conference
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• 2001.07c
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• pp.1576-1578
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• 2001

In this paper, a short-term test method to diagnose and estimate the lifetime of AC PDP(Plasma Display Panel) has been proposed. As using this method, we investigated the lifetime of MgO layer in AC PDP. The lifetime was increased in proportion to an MgO thickness but it was allowed when the MgO thickness was raised until 5000$\AA$. Over 5000$\AA$, the lifetime was saturated with a thickness of MgO layer.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2010.06a
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• pp.236-236
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• 2010

P-type의 단결정, 다결정, UMG 기판을 이용하여 phosphorus툴 확산시킨 후 열처리한 external gettering 방식으로 실리콘 내부에 있는 불순물을 제거하였고, 기판의 lifetime 변화를 $\mu$-PCD를 이용하여 측정하였다. phosphorus를 $850^{\circ}C$에서 기판 내부로 20분 확산시킨 후 기판의 온도와 시간을 변화시키면서 gettering 공정을 시행하였다. 에미터층으로 인해 기판의 bulk lifetime이 부정확해 지는 것을 방지하기 위해서 NaOH를 이용하여 에미터층을 제거한 후 $\mu$-PCD를 이용하여 lifetime을 측정하였다. 또한 기판의 표면효과를 최소화하기 위해서 lifetime 측정전에 iodine을 이용하여 표면 passivation을 하였다.

• Wind and Structures
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• v.6 no.4
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• pp.307-324
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• 2003

The paper presents results of studies concerning wind-induced aeolian vibration and fatigue of a 110 kV covered conductor overhead line. Self-damping measurement techniques are discussed: power method is found to be the most reliable technique. A method for compensating tension variations during the self-damping test is presented. Generally used empirical self-damping power models are enhanced and the different models are compared with each other. The Energy Balance Analysis (EBR) is used to calculate the aeolian vibration amplitudes, which thereafter are converted to bending stress for the calculation of conductor lifetime estimate. The results of EBA are compared with field measurements, Results indicate that adequate lifetime estimates are produced by EBA as well as field measurements. Generally the EBA gives more conservative lifetime expectancy. This is believed to result from the additional damping existing in true suspension structures not taken into account by EBA. Finally, the correctness of the line design is verified using Cigre's safe design tension approach.

• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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• 2008.05a
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• pp.202-204
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• 2008

This paper gives a comparative analysis on lifetime of the fluorescent induction lamp. We have treasured and analysed optical characteristics of circular type fluorescent induction lamps, which has A and B types, to estimate lifetime. In the result of analysis on lifetime, $B_{10}$ lifetime of A and B type lamps are 466 hours and 1,595 hours, respectively.

• Management Science and Financial Engineering
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• v.17 no.2
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• pp.39-62
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• 2011

In wireless sensor network, since each sensor is equipped with a limited power, efficient use of the energy is important. One possible network management scheme is to cluster the sensors into several sets, so that the sensors in each of the sets can completely perform the monitoring task. Then the sensors in one set become active to perform the monitoring task and the rest of the sensors switch to a sleep state to save energy. Therefore, we rotate the roles of the active set among the sensors to maximize the network lifetime. In this paper, we suggest an optimal algorithm for the maximum lifetime coverage problem which maximizes the network lifetime. For comparison, we implemented both the heuristic proposed earlier and our algorithm, and executed computational experiments. Our algorithm outperformed the heuristic concerning the obtained network lifetimes, and it found the solutions in a reasonable amount of time.

• Journal of Power Electronics
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• v.16 no.2
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• pp.778-785
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• 2016

An excess carrier lifetime extraction method is derived for physics-based insulated gate bipolar transistor (IGBT) models with consideration of the latest development in IGBT modeling. On the basis of the 2D mixed-mode Sentaurus simulation, the clamp turn-off test is simulated to obtain the tail current. The proposed excess carrier lifetime extraction method is then performed using the simulated data. The comparison between the extracted results and actual lifetime directly obtained from the numerical device model precisely demonstrates the accuracy of the proposed method.

• Proceedings of the Korea Concrete Institute Conference
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• 1996.10a
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• pp.218-224
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• 1996

The purpose of this syudy is to set up a proper repair plan and to extend the remaining lifetime of them by measuring the remaining lifetime of reinforced concrete structures quantitatively. This method is based on the actual research on age deterioration, carbonation depth and covering depth of the reinforced concrete structures. Also, it measure the remaining lifetime through quantitatively defining the probability of steel corrosion by the damage of steel corrosion. By doing that, we proceed the proper repair plan after reviewing the possibility of lifetime extension.

• KIEE International Transactions on Electrophysics and Applications
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• v.3C no.1
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• pp.1-4
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• 2003

This paper presents an attempt to develop probabilistic multistress life models to evaluate the lifetime characteristics of epoxy-encapsulated magnet wire with heavy build polyurethane enamel. A set of accelerated life tests were conducted over a wide range of pulsating voltages, temperatures, and frequencies. Samples of fine gauge twisted pairs of the encapsulated magnet wire were tested us-ing a pulse endurance dielectric test system. An electrical-thermal lifetime function was combined with the Weibull distribution of lifetimes. The parameters of the combined Weibull-electrical-thermal model were estimated using maximum likelihood estimation. Likewise, a generalized electrical-thermal-frequency life model was also developed. The parameters of this new model were estimated using multiple linear regression technique. It was found in this paper that lifetime estimates of the two proposed probabilistic multistress life models are good enough. This suggests the suitability of using the general electrical-thermal-frequency model to estimate the lifetime of the encapsulated magnet wire over a wide range of voltages, temperatures and pulsating frequencies.

• Advances in nano research
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• v.1 no.3
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• pp.125-131
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• 2013

This study is aimed to calculate the radiative lifetime of Wannier-Mott excitons in nanoclusters of a narrow-bandgap semiconductor embedded in a wide-bandgap one. The nanocluster linear dimensions are assumed to be much larger than the radius of the exciton so that the latter is not destructed by the confinement potential as it takes place in small quantum dots. The calculations were carried out for an example of InAs nanoclusters put into the GaAs matrix. It is shown that the radiative lifetime of Wannier-Mott excitons in such clusters increases with the decrease of the cluster dimensions, this tendency being more pronounced at low temperatures. So, the creation of excitons in nanoclusters of a narrow-bandgap material embedded in a wide-bandgap one can be used to significantly prolong their radiative lifetime in comparison with that of excitons in a bulk semiconductor.

• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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• 2009.05a
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• pp.149-152
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• 2009

In this paper, We has been studied the lifetime degradation of LED lighting system compared to MH lighting. Especially the effect of temperature level on the lifetime degradation has been investigated. The results show that temperature plays a role in the lifetime degradation and slope of degradation line represent as temperature level differently. However, It is possible to estimate the lifetime of LED lighting system using equation induced the slope of degradation line.