1 |
Lawless, J. F., Statistical Models and Methods for Lifetime Data, J. Wiley and Sons, New York, 1982
|
2 |
Feilat, E. A., Grzybowski, S., Knight, P., Multiple Stress Aging of Magnet Wire by High Frequency Voltage Pulses and High Temperatures, Conference Records of the 2000 IEEE International Symposium on Electrical Insulation (ISEI2000), Anaheim, CA, April 2-5, 2000, pp. 157-160
|
3 |
Cygan, P., Laghari, J. R., Models for Insulation Aging under Electrical and Thermal Multistress, IEEE Trans. on Electrical Insulation, Vol EI-25, No.5, October 1990, pp. 923-934
|
4 |
Fothergill, J. C., Estimating the Cumulative Probability of Failure Data Points to be Plotted on Weibull and other Probability Papers, IEEE Trans. on Electrical Insulation, Vol EI-25, No.3, June 1990, pp. 489-492
|
5 |
Stone, G. C., The Application of Weibull Statistics to Insulation Aging Tests, IEEE Trans. on Electrical Insulation, Vol EI- 14, No.5, 1979, pp. 233-239
|
6 |
Beeckman, R. J., Harber, J. J., Wentz, S. J., Studies on Magnet Wire Degradation with Inverter Driven Motors, Proc. of Electrical Electronics Insulation Conference, Rosemont, Illinois, September 1997, pp. 387-383
|
7 |
Montanari, G. C., Cacciari, M., A Probabilistic Insulation Life Model for Combined Thermal-Electrical Stresses, IEEE Trans. on Electrical Insulation, Vol El-20, No.3, June 1985, pp. 519-522
|
8 |
Grzybowski, S., Dobroszewski, R., Grzegorski, E., Accelerated Endurance Tests of Polyethylene Insulated Cables, 3rd International Conference on Dielectric Materials, Measurements and Applications, September 10-13, 1979, Birmingham, UK, pp. 120-123
|