• 제목/요약/키워드: Life testing

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전자파 차폐 도어용 핑거 스트립의 가속수명시험 및 유효성 평가 (Accelerated Life Testing and Validity Evaluation of Finger Strips Used for Electromagnetic Shielding Doors)

  • 이주홍;김도식;장무성;조해용
    • 대한기계학회논문집A
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    • 제39권9호
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    • pp.831-837
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    • 2015
  • 사람과 전자기기들은 우리 주변의 환경 속, 특히 병원의 자기 공명 영상(Magnetic resonance imaging, MRI) 장비 또는 군용으로 사용되는 전자기 펄스(Electromagnetic pulse, EMP) 장비, 그리고 수많은 전자파를 만들어 내는 장치들에 노출되는 경우가 잦아졌다. 이러한 전자파는 사람과 전자기기에 유해하고, 이를 차폐하기 위해 사용되는 것 중에 하나가 핑거 스트립이다. 핑거 스트립은 열전도성이 좋기 때문에 전자파를 흡수하여 열로 변환한다. 이 특징을 효과적으로 이용하여 전자파 차폐가 필요한 실내의 특수 문짝에 핑거 스트립을 설치해서, 전자파로부터 사람과 전자기기들을 보호한다. 본 연구에서는 핑거 스트립의 주 고장모드에 영향을 주는 가속인자로 하중을 선택하여 가속수명시험을 실시한다. 가속수명시험의 결과로부터 핑거 스트립의 실사용조건 수명을 예측하며, 동일한 조건에서 실시한 수명 시험 결과와 비교하여 가속수명시험의 유효성을 평가하고자 하였다.

시험 중단 시점에 관한 소프트웨어 신뢰도 모델 (Software Reliability Model for the Stopping Rule)

  • 문숙경
    • 품질경영학회지
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    • 제22권2호
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    • pp.33-40
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    • 1994
  • Most software reliability models and other methods attempt to estimate some measures based on its fault history. There are several phases of the software life cycle including testing phase. We can propose it's stopping rule to decide when to stop the testing and pass it on to the next phase by considering the detailed structure of software and calculating the failure rate when each fault was detected. Downs (1985) proposed a method which was developed for estimating the failure rate applicable only to two-level profiles. In this paper, I extended to profiles involving more levels.

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On Testing Monotonicity of Mean Residual Life from Randomly Censored Data

  • Lim, Jae-Hak;Koh, Jai-Sang
    • ETRI Journal
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    • 제18권3호
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    • pp.207-213
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    • 1996
  • This paper proposes a new nonparametric test for testing the null hypothesis that the MRL is constant against the alternative hypothesis that the MRL is decreasing (increasing) for ramdomly censored data. The proposed test statistic is a L-statistic, and we use L-statistic theory to establish its asymptotic normality of the test statistic. We discuss the efficiency loss due to censoring and also calculate the asymptotic relative efficiencies of our test statistic with respect to the Chen, Hollander and Langberg's test for several alternatives.

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수정 아레니우스 모형에서 가족수명시험에 대한 조건부 신뢰구간 (Conditional Confidence Intervals for Accelerated Life Testing in Modified Arrhenius Model)

  • 박병구
    • 품질경영학회지
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    • 제25권3호
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    • pp.1-10
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    • 1997
  • In the context of accelerated life tests, procedures are given for estimating the parameters in the modified Arrhenius model and for estimating mean life at a given future stress level. The conditional confidence intervals are obtained by conditioning on ancillary statistics and pivotal quantity. Using the data of Tobias and Trindada(1986), we illustrate conditional confidence interval for parameters under use condition in the modified Arrhenius model.

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Accelerated Life Testings for System based on a Bivariate Exponential Model

  • Park, Byung-Gu;Yoon, Sang-Chul
    • Communications for Statistical Applications and Methods
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    • 제6권2호
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    • pp.423-432
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    • 1999
  • Accelerated life testing of product is commonly used to reduced test time and costs. In this papers is considered when the product is a two component system with lifetimes following the bivariate exponential distribution of Sarkar(1987) using inverse power rule model. Also we derived the maximum likelihood estimators of parameters for asymptotic normality. We compare the mean square error of the proposed estimator for the life distribution under use conditions stree through Monte Carlo simulation.

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The Estimation of Mean Residual Life Function under Left Truncation and Right Censoring Model

  • Moon, Gyoung-Ae;Shin, Im-Hee;Chae, Hyeon-Suk
    • Journal of the Korean Data and Information Science Society
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    • 제6권2호
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    • pp.65-76
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    • 1995
  • The importance of left truncated and right censoring cases has considered for better information in medical follow-up and engineering life testing studies. We propose some estimation procedure for the mean residual life function with consistency and asymptotic normality on the left truncated and right censoring model. And then, the comparision with Kaplan-Meier estimator ignoring the left truncated effect and the small sample properities are investigated by asymptotic biases and M.S.E.'s thresh Monte Carlo study.

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Exponentiality Test of the Three Step-Stress Accelerated Life Testing Model based on Kullback-Leibler Information

  • Park, Byung-Gu;Yoon, Sang-Chul;Lee, Jeong-Eun
    • Journal of the Korean Data and Information Science Society
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    • 제14권4호
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    • pp.951-963
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    • 2003
  • In this paper, we propose goodness of fit test statistics based on the estimated Kullback-Leibler information functions using the data from three step stress accelerated life test. This acceleration model is assumed to be a tampered random variable model. The power of the proposed test under various alternatives is compared with Kolmogorov-Smirnov statistic, Cramer-von Mises statistic and Anderson-Darling statistic.

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A Nonparametric Small Sample Estimator of Mean Residual Life

  • Farrokh Choobineh;Park, Dong-Ho
    • Journal of the Korean Statistical Society
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    • 제19권1호
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    • pp.80-87
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    • 1990
  • In reliability and life testing the mean residual life (MRL) of an item plays a significant role. While there has been a great deal of discussion on the theoretical aspects of the MRL, good estimators of MRL have been difficult to obtain. In this paper we propose a new estimator of the MRL of items at a given age, which is especially good for a small sample. The new estimator compares favorably with the empirical MRL estimator for small samples.

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조명기기 LED모듈의 신뢰성 평가 - 가속시험설계를 중심으로 - (The Study based on Reliability Assessments of LED Modules for Lighting - Design of ALTs(Accelerated Life Tests) -)

  • 박창규;조상묵;김진선
    • 한국조명전기설비학회:학술대회논문집
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    • 한국조명전기설비학회 2009년도 춘계학술대회 논문집
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    • pp.21-23
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    • 2009
  • The paper is to evaluate for reliability of LED Modules for Lighting by ALTs(Accelerated Life Tests). The recently, some of KS were established by law of LED Modules for Lighting(KS C 7651, KS C 7652 and KS C 7653), but reliability assessment methods of LED Modules for Lighting were not established. Therefore, the paper aided companies to test methods for accelerated life testing by themselves.

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LED Channel Module의 가속 수명 시험 설계 (The Accelerated Life Tests Design of LED Channel Module)

  • 김진선;조상묵;박창규
    • 한국조명전기설비학회:학술대회논문집
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    • 한국조명전기설비학회 2009년도 춘계학술대회 논문집
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    • pp.208-210
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    • 2009
  • The paper is to evaluate for reliability of LED Channel Modules by ALTs(Accelerated Life Tests). The recently, some of KS were established by law of LED Lamps for Lighting(KS C 7651, KS C 7652 and KS C 7653), but reliability assessment methods of LED Channel Modules were not established. Therefore, the paper aided companies to test methods for accelerated life testing by themselves.

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