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http://dx.doi.org/10.3795/KSME-A.2015.39.9.831

Accelerated Life Testing and Validity Evaluation of Finger Strips Used for Electromagnetic Shielding Doors  

Lee, Joo Hong (Reliability Assessment Center, Korea Institute of Machinery & Materials)
Kim, Do Sik (Reliability Assessment Center, Korea Institute of Machinery & Materials)
Chang, Mu Seong (Reliability Assessment Center, Korea Institute of Machinery & Materials)
Cho, Hae Yong (Dept. of Mechanical Eng., Chungbuk Nat'l Univ.)
Publication Information
Transactions of the Korean Society of Mechanical Engineers A / v.39, no.9, 2015 , pp. 831-837 More about this Journal
Abstract
Many persons and electronic devices are exposed to electromagnetic (EM) waves generated from magnetic resonance imaging (MRI) equipment, EM pulses (EMPs), and many other kinds of EM wave devices. Finger strips are used to provide shielding from these EM waves. Because of the high thermal conductivity of finger strips, they are used in the design of specialized doors that are installed in shielded rooms. In this study, we perform an accelerated life test using the load acceleration stress, which affects the main failure mode of finger strips. We predict the life of the finger strip under normal usage conditions based on the results of the accelerated life test. We compare the results with those predicted from the life test under normal usage conditions to evaluate the validity of accelerated life testing.
Keywords
Finger Strip; Accelerated Life Test; $B_{10}$ Life; Accelerated Factor; Shielding Door;
Citations & Related Records
Times Cited By KSCI : 3  (Citation Analysis)
연도 인용수 순위
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