• Proceedings of the IEEK Conference
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• 1998.10a
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• pp.613-616
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• 1998

In this paper, a model of a Eddy-current probe coil with a ferrite core in the presence of a half-space with a layer is developed. The half-space with a layer is accounted for by computing the appropriate Green's function by using Bessel transforms. Upon introducing equivalent Amperian currents within a core to explain effect to a impedance change in the coil due to a (ferrite) core, we derive a volume integral equation, The integral equation is transformed via the method of moments into a vector-matrix equation, which is then solved using a linear equation solver. Through the above processing, we computed impedance value in a Eddy-current probe coil due to a conductivity change of layer.

• Journal of Microbiology and Biotechnology
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• v.16 no.1
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• pp.141-144
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• 2006

An antibody layer was fabricated to detect Escherichia coli O157:H7. The micropattern of 16-mercaptohexadecanoic acid (16-MHDA) as alkylthiolate was formed on the gold surface by using the PDMS stamp with microcontact printing $({\mu}CP)$ techniques. In order to form antibody patterns on the template, protein G was chemically bound to the 16-MHDA patterns, and antibody was adsorbed on a self-assembled protein G layer. The formation of the 16-MHDA micropattern, self-assembled protein G layer and antibody pattern on Au substrate was confirmed by surface plasmon resonance (SPR) spectroscopy. Finally, the micropatterning method was applied to fabricate the antibody probe for detection of E. coli O157:H7, and monitoring of antigen by using this probe was successfully achieved.

• 정보저장시스템학회:학술대회논문집
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• 2005.10a
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• pp.185-189
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• 2005

We reported here nano-scale electrical phase-change recording in amorphous $Ge_2Sb_2Te_5$ media using an atomic force microscope (AFM) having conducting probes. In recording process, a pulse voltage is applied to the conductive probe that touches the media surface to change locally the electrical resistivity of a film. However, in contact operation, tip/media wear and contamination could major obstacles, which degraded SNR, reproducibility, and lifetime. In order to overcome tip/media wear and contamination in contact mode operation, we adopted the W incorporated diamond-like carbon (W-DLC) films as a protective layer. Optimized mutilayer media were prepared by a hybrid deposition system of PECVD and RF magnetron sputtering. When suitable electrical pulses were applied to media through the conducting probe, it was observed that data bits as small as 25 nm in diameter have been written and read with good reproducibility, which corresponds to a data density of $1 Tbit/inch^2$. We concluded that stable electrical phase-change recording was possible mainly due to W-DLC layer, which played a role not only capping layer but also resistive layer.

• Proceedings of the KSME Conference
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• 2007.05a
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• pp.1730-1733
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• 2007

As semiconductor and MEMS devices become smaller, testing process during their production should follow such a high density trend. A circuit inspection tool "probe card" makes contact with electrode pads of the device under test (DUT). Nowadays, electrode pads are irregularly arranged and have height difference. In order to absorb variations in the heights of electrode pads and to generate contact loads, contact probes must have some levels of mechanical spring properties. Contact probes must also yield a force to break the surface native oxide layer or contamination layer on the electrodes to make electric contact. In this research, new vertical micro contact probe with bellows shape is developed to overcome shortage of prior work. Especially, novel bellows shape is used to reduce stress concentration in this design and stopper is used to change the stiffness of micro contact probe. Variable stiffness can be one solution to overcome the height difference of electrode pads.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.05a
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• pp.7-8
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• 2009

Non-contact critical current measurement apparatus was developed using hall probe which measures the magnetic field distribution across the width of superconducting tape. The hall probe consists of 7 independent hall sensors which lie in a line 600 ${\mu}m$. The difference between maximum and minimum magnetic field in the magnetic filed distribution is a main parameter to determine the critical current. As preliminary research, we calculated the magnetic field intensity at the middle sensor, which is a minimum magnetic field and generated by the circular shielding current modeled by Bean model. We confirmed that there are some parameters that affect on the minimum magnetic field; the distance between superconducting layer and hall sensor, the width of superconducting tape, and the critical current distribution across the width of superconducting tape. Among these parameters, the distance between superconducting layer and hall sensor highly influences on the minimum magnetic field.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2012.11a
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• pp.71-71
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• 2012

Memory 반도체 Test공정에서 사용되는 Probe Card의 Probing Area가 넓어지면서 종래에 사용되던 Cantilever제품의 사용이 불가능하게 되고, MEMS공정을 사용한 새로운 형태의 Advanced제품이 시장에 출현을 하였다. MEMS형의 제품은 다수의 Micro Spring을 MLC(Multi Layer Ceramic)위에 MEMS 공정을 사용하여 생성하는 방식으로서 MLC는 좁은 지역에 다수의 Pin을 생성 할 수 있는 공간을 만들어 주며, 또 다른 이유는 전기적 특성인 임피던스를 맞추고 다수의 Pin의 압력에 의하여 생기는 하중을 Ceramic기판으로 지탱하기 위한 목적도 있다. 이에 MLC와 같은 전기적 특성을 임피던스를 맞춘 RF-CPCB를 사용하여 작은 면적에 다수의 Pin접합이 가능한 방법을 마련한 후, 이 RF-PCB를 부착하여 Pin의 하중을 받는 Wafer와 유사한 열팽창을 갖는 Substrate를 사용하여 MLC를 대체하여 다양한 온도 조건에서 사용이 가능하며, 복잡하고 공정비가 많이 드는 MEMS 공정에 의한 일괄 Micro Spring 생성 공정을 전주 도금 또는 2D방식의 도금 Pin으로 대체하였으며, Probe Card의 중요한 물리적 특성인 Pin들의 정렬도를 마련하기 위해 Photo Process를 사용한 Wafer로 만든 Wafer Pin Array Frame을 사용하여 2D 제작 Pin을 일괄 또는 부분 접합이 가능한 방법으로 Probe Array Head를 제작하여 이들을 부착하여 Probe Array Head를 이전의 MEMS공정 방법에 비해 쉽고 빠르게 만들어 probe Card를 제작 할 수 있게 되었다.

• Transactions of the Korean Society of Mechanical Engineers B
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• v.28 no.10
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• pp.1210-1218
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• 2004

Experimental study was performed to investigate the flow behavior in boundary layer on the blade suction surface of a multi-stage axial flow compressor, which was focused on the third stage of the 4-stage Low Speed Research Compressor. Flow measurements in the boundary layer were obtained using a boundary layer hot wire probe, which was traversed normal to the blade suction surface at small increments by the probe traverse specially designed. Detailed boundary layer flow measurements covering most of the stator suction surface were taken and are described using time mean and ensemble averaged velocity profiles. Amplitude of the velocity fluctuation and turbulence intensity in the boundary layer flow are also discussed. At midspan, narrow but strong wake zone due to passing wake disturbances is generated in the boundary layer near the blade leading edge for the rotor blade passing period. Corner separation is observed at the tip region near the trailing edge, which causes to increase steeply the boundary layer thickness.

• Journal of Electrical Engineering and Technology
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• v.6 no.1
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• pp.119-122
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• 2011

A new high speed AFM probe has been proposed and fabricated. The probe is integrated with PZT actuated cantilever realized in bulk silicon wafer using heavily boron doped silicon as an etch stop layer. The cantilever thickness can be accurately controlled by the boron diffusion process. Thick SCS cantilever and integrated PZT actuator make it possible to be operated at high speed for fast imaging. The resonant frequency of the fabricated probe is 92.9 kHz and the maximum deflection is 5.3 ${\mu}m$ at 3 V. The fabricated probe successfully measured the surface of standard sample in an AFM system at the scan speed of 600${\mu}m$/sec.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.11 no.6
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• pp.859-867
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• 2000

In order to analyze the effect of a cover layer or radome for an antenna, the moment method is applied to the analysis of the circular microstrip patch antenna with dielectric superstrate fed by coaxial probe. The probe feed is modeled as a attachment mode method which can solve more exact analysis. In case of a ideal probe feed modeling, the probe self-impedance as well as the rapidly-varying patch current at the vicinity of the feed point was neglected. But a rigorous probe feed model which overcomes these deficiencies are developed, and used in the analysis of isolated circular patches. Measurements were performed to validate the numerical results. These are good agreement with each other.

• Korean Journal of Agricultural Science
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• v.42 no.3
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• pp.183-189
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• 2015

Plant root penetration through soil profile is restricted by compacted layer such as plow pan under conventional tillage. For detecting the compact layer, we made a graduated T-shape probe and measured compared between the depths with rapid change in feeling hardness of hand penetration using T-shape probe and with a rapid increase of penetrometer cone index. On upland crops, including red pepper, corn, soybean and cucumber, plow pan depth ranged from 10 cm to 25 cm depth. The effective rooting depth (ER) had significant correlation with the plow pan depth (PP) except soils with the shallow ground water and/or poorly drained soil. The regression equation was ER = 0.9*PP ($R^2=0.54^{**}$, N = 14) with the applicative PP range of 10-25 cm.