Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2009.05a
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- Pages.7-8
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- 2009
Non-contact critical current measurement using hall probe
Hall probe를 이용한 비접촉 임계전류 측정
- Kim, Ho-Sup (Korea Electrotechnology Research Institute) ;
- Lee, Nam-Jin (KAIST) ;
- Ha, Dong-Woo (Korea Electrotechnology Research Institute) ;
- Baik, Seung-Kyu (Korea Electrotechnology Research Institute) ;
- Kim, Tae-Hyung (Korea Electrotechnology Research Institute) ;
- Ko, Rock-Kil (Korea Electrotechnology Research Institute) ;
- Ha, Hong-Soo (Korea Electrotechnology Research Institute) ;
- Oh, Sang-Soo (Korea Electrotechnology Research Institute)
- 김호섭 (한국전기연구원) ;
- 이남진 (한국과학기술원) ;
- 하동우 (한국전기연구원) ;
- 백승규 (한국전기연구원) ;
- 김태형 (한국전기연구원) ;
- 고락길 (한국전기연구원) ;
- 하홍수 (한국전기연구원) ;
- 오상수 (한국전기연구원)
- Published : 2009.05.15
Abstract
Non-contact critical current measurement apparatus was developed using hall probe which measures the magnetic field distribution across the width of superconducting tape. The hall probe consists of 7 independent hall sensors which lie in a line 600